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An Improved Differential Fault Analysis on Block Cipher KLEIN-64
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作者 Min Long Man Kong +1 位作者 Sai Long Xiang Zhang 《Computers, Materials & Continua》 SCIE EI 2020年第11期1425-1436,共12页
KLEIN-64 is a lightweight block cipher designed for resource-constrained environment,and it has advantages in software performance and hardware implementation.Recent investigation shows that KLEIN-64 is vulnerable to ... KLEIN-64 is a lightweight block cipher designed for resource-constrained environment,and it has advantages in software performance and hardware implementation.Recent investigation shows that KLEIN-64 is vulnerable to differential fault attack(DFA).In this paper,an improved DFA is performed to KLEIN-64.It is found that the differential propagation path and the distribution of the S-box can be fully utilized to distinguish the correct and wrong keys when a half-byte fault is injected in the 10th round.By analyzing the difference matrix before the last round of S-box,the location of fault injection can be limited to a small range.Thus,this improved analysis can greatly improve the attack efficiency.For the best case,the scale of brute-force attack is only 256.While for the worst case,the scale of brute-force attack is far less than 232 with another half byte fault injection,and the probability for this case is 1/64.Furthermore,the measures for KLEIN-64 in resisting the improved DFA are proposed. 展开更多
关键词 Block cipher KLEIN-64 differential fault analysis half-byte fault injection
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NEW APPROACH TO EMULATE SEU FAULTS ON SRAM BASED FPGAS
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作者 Reza Omidi Gosheblagh Karim Mohammadi 《Journal of Electronics(China)》 2014年第1期68-77,共10页
Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Si... Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Single-Event Upsets(SEUs).To insure reliable operation of FPGA based systems in a harsh radiation environment,various SEU mitigation techniques have been provided.In this paper we propose a system based on dynamic partial reconfiguration capability of the modern devices to evaluate the SEU fault effect in FPGA.The proposed approach combines the fault injection controller with the host FPGA,and therefore the hardware complexity is minimized.All of the SEU injection and evaluation requirements are performed by a soft-core which realized inside the host FPGA.Experimental results on some standard benchmark circuits reveal that the proposed system is able to speed up the fault injection campaign 50 times in compared to conventional method. 展开更多
关键词 Field Programmable Gate Arrays(FPGAs) Single-Event Upset(SEU) fault injection Soft-core Space radiation effects
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Diesel Engine Fault Diagnosis with Vibration Signal
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作者 Tharanga, Shuyong Liu Shuai Zhang Yuan Wang 《Journal of Applied Mathematics and Physics》 2020年第9期2031-2042,共12页
<div style="text-align:justify;"> When the vibration of diesel engine structure is measured, the signal is composed of a very complex superposition of the contributions of different vibratory sources m... <div style="text-align:justify;"> When the vibration of diesel engine structure is measured, the signal is composed of a very complex superposition of the contributions of different vibratory sources modified by their respective transmission paths. These sources originate from several internal phenomenon in the engine such as combustion pressure variation, unbalanced reciprocating and rotating parts. In a diesel engine, movement parts work in a specific order. Once the starting point is determined, occurrence of work order in different cycle phases can be determined. This could successfully use to identifying of impulses in complex vibration signal of a diesel engine. From the variation of features of those impulses, it is possible to determine the working condition of the engine. This can use to fault diagnosis of diesel engine, specially faults related to combustion process. </div> 展开更多
关键词 Vibration Monitoring Valve Clearance Valve Timing Diagram injection fault
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A Secure Hardware Implementation for Elliptic Curve Digital Signature Algorithm
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作者 Mouna Bedoui Belgacem Bouallegue +4 位作者 Abdelmoty M.Ahmed Belgacem Hamdi Mohsen Machhout Mahmoud M.Khattab 《Computer Systems Science & Engineering》 SCIE EI 2023年第3期2177-2193,共17页
Since the end of the 1990s,cryptosystems implemented on smart cards have had to deal with two main categories of attacks:side-channel attacks and fault injection attacks.Countermeasures have been developed and validat... Since the end of the 1990s,cryptosystems implemented on smart cards have had to deal with two main categories of attacks:side-channel attacks and fault injection attacks.Countermeasures have been developed and validated against these two types of attacks,taking into account a well-defined attacker model.This work focuses on small vulnerabilities and countermeasures related to the Elliptic Curve Digital Signature Algorithm(ECDSA)algorithm.The work done in this paper focuses on protecting the ECDSA algorithm against fault-injection attacks.More precisely,we are interested in the countermeasures of scalar multiplication in the body of the elliptic curves to protect against attacks concerning only a few bits of secret may be sufficient to recover the private key.ECDSA can be implemented in different ways,in software or via dedicated hardware or a mix of both.Many different architectures are therefore possible to implement an ECDSA-based system.For this reason,this work focuses mainly on the hardware implementation of the digital signature ECDSA.In addition,the proposed ECDSA architecture with and without fault detection for the scalar multiplication have been implemented on Xilinxfield programmable gate arrays(FPGA)platform(Virtex-5).Our implementation results have been compared and discussed.Our area,frequency,area overhead and frequency degradation have been compared and it is shown that the proposed architecture of ECDSA with fault detection for the scalar multiplication allows a trade-off between the hardware overhead and the security of the ECDSA. 展开更多
关键词 Elliptic curve cryptography(ECC) Montgomery ladder fault detection method fault injection attack digital signature ECDSA FPGA
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Method of militarysoftware securityand vulnerability testing based on process mutation
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作者 金丽亚 王荣辉 肖庆 《Journal of Measurement Science and Instrumentation》 CAS 2013年第3期228-230,共3页
To solve the problems caused by military software security issues,this paper firstly introduces a new software fault injection technique,namely main static fault injection method:program mutation.And then source code ... To solve the problems caused by military software security issues,this paper firstly introduces a new software fault injection technique,namely main static fault injection method:program mutation.And then source code for testing this algorithm is put forward.On this basis buffer overflow testing based on program mutation is conducted.Finally several military software source codes for buffer overflow testing are tested using deficiency tracking system(DTS)tool,Experimental results show the effectiveness of the proposed algorithm. 展开更多
关键词 military software testing fault injection buffer overflow source code scanning
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Review of Model-Based Testing Approaches in Production Automation and Adjacent Domains—Current Challenges and Research Gaps
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作者 Susanne Rosch Sebastian Ulewicz +1 位作者 Julien Provost Birgit Vogel-Heuser 《Journal of Software Engineering and Applications》 2015年第9期499-519,共21页
As production automation systems have been and are becoming more and more complex, the task of quality assurance is increasingly challenging. Model-based testing is a research field addressing this challenge and many ... As production automation systems have been and are becoming more and more complex, the task of quality assurance is increasingly challenging. Model-based testing is a research field addressing this challenge and many approaches have been suggested for different applications. The goal of this paper is to review these approaches regarding their suitability for the domain of production automation in order to identify current trends and research gaps. The different approaches are classified and clustered according to their main focus which is either testing and test case generation from some form of model automatons, test case generation from models used within the development process of production automation systems, test case generation from fault models or test case selection and regression testing. 展开更多
关键词 Model-Based Testing Automated Production Systems Conformance Testing Regression Testing fault injection Survey
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Finds in Testing Experiments for Model Evaluation 被引量:2
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作者 吴际 贾晓霞 +2 位作者 刘昶 杨海燕 刘超 《Tsinghua Science and Technology》 SCIE EI CAS 2005年第3期298-303,共6页
To evaluate the fault location and the failure prediction models, simulation-based and code- based experiments were conducted to collect the required failure data. The PIE model was applied to simu- late failures in t... To evaluate the fault location and the failure prediction models, simulation-based and code- based experiments were conducted to collect the required failure data. The PIE model was applied to simu- late failures in the simulation-based experiment. Based on syntax and semantic level fault injections, a hy- brid fault injection model is presented. To analyze the injected faults, the difficulty to inject (DTI) and diffi- culty to detect (DTD) are introduced and are measured from the programs used in the code-based experi- ment. Three interesting results were obtained from the experiments: 1) Failures simulated by the PIE model without consideration of the program and testing features are unreliably predicted; 2) There is no obvious correlation between the DTI and DTD parameters; 3) The DTD for syntax level faults changes in a different pattern to that for semantic level faults when the DTI increases. The results show that the parameters have a strong effect on the failures simulated, and the measurement of DTD is not strict. 展开更多
关键词 software testing fault injection failure simulation software engineering
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An SEU-hardened latch with a triple-interlocked structure 被引量:1
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作者 李渊清 姚素英 +1 位作者 徐江涛 高静 《Journal of Semiconductors》 EI CAS CSCD 2012年第8期89-96,共8页
A single event upset (SEU) tolerant latch with a triple-interlocked structure is presented. Its self-recovery mechanism is implemented by using three pairs of guard-gates and inverters to construct feedback lines in... A single event upset (SEU) tolerant latch with a triple-interlocked structure is presented. Its self-recovery mechanism is implemented by using three pairs of guard-gates and inverters to construct feedback lines inside the structure. This latch effectively suppresses the effects of charge deposition at any single internal node caused by particle strikes. Three recently reported SEU-hardened latches are chosen and compared with this latch in terms of reliability. The potential problems that these three latches could still get flipped due to single event effects or single event effects plus crosstalk coupling are pointed out, which can be mitigated by this proposed latch. The SEU tolerance of each latch design is evaluated through circuit-level SEU injection simulation. Furthermore, discussions on the crosstalk robustness and some other characteristics of these latches are also presented. 展开更多
关键词 single event upset single event transient LATCH triple-interlocked fault injection CROSSTALK
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A software solution to estimate the SEU-induced soft error rate for systems implemented on SRAM-based FPGAs
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作者 王忠明 姚志斌 +1 位作者 郭红霞 吕敏 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2011年第5期117-123,共7页
SRAM-based FPGAs are very susceptible to radiation-induced Single-Event Upsets (SEUs) in space applications. The failure mechanism in FPGA's configuration memory differs from those in traditional memory device. As ... SRAM-based FPGAs are very susceptible to radiation-induced Single-Event Upsets (SEUs) in space applications. The failure mechanism in FPGA's configuration memory differs from those in traditional memory device. As a result, there is a growing demand for methodologies which could quantitatively evaluate the impact of this effect. Fault injection appears to meet such requirement. In this paper, we propose a new methodology to analyze the soft errors in SRAM-based FPGAs. This method is based on in depth understanding of the device architecture and failure mechanisms induced by configuration upsets. The developed programs read in the placed and routed netlist, search for critical logic nodes and paths that may destroy the circuit topological structure, and then query a database storing the decoded relationship of the configurable resources and corresponding control bit to get the sensitive bits. Accelerator irradiation test and fault injection experiments were carried out to validate this approach. 展开更多
关键词 radiation effect single-event effect SRAM-based FPGAs fault injection
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