Effects of Cu underlayer on the structure of Fe50Mn50 films were studied. Samples with a structure of Fe50Mn50（200 nm）/ Cu(tCu) were prepared by magnetron sputtering on thermally oxidized silicon substrates at room ...Effects of Cu underlayer on the structure of Fe50Mn50 films were studied. Samples with a structure of Fe50Mn50（200 nm）/ Cu(tCu) were prepared by magnetron sputtering on thermally oxidized silicon substrates at room temperature. The thickness of Cu underlayer varied from 0 to 60 nm in the intervals of 10 nm. High-vacuum annealing treatments, at different temperatures of 200, 300 and 400 ℃ for 1 h, respectively, on the Fe50Mn50（200 nm）/ Cu（20 nm） thin films were performed. The surface morphologies and textures of the samples were measured by field emission scan electronic microscope （FE-SEM） and X-ray diffraction（XRD）. Energy dispersive X-ray spectroscopy （EDX） and Auger electron spectroscopy（AES） were used to analyze the compositional distribution. It is found that Cu underlayer has an obvious induce effect on （111） orientation of Fe50Mn50 thin films. The induce effects of Cu on （111） orientation of Fe50Mn50 changed with the increase of Cu layer thickness and the best effect was obtained at the Cu layer thickness of 20 nm. High-vacuum annealing treatments cause the migration of Mn atoms towards surface of the film and interface between Cu layer and substrate. With the increasing annealing temperature, migration of Mn atoms is more obvious, which leads to a Fe-riched Fe-Mn alloy film.展开更多
The detailed microstructures of Ni80Fe20/Fe50Mn50 superlattices have been characterized using both x-ray diffraction techniques and transmission electron microscopy.The obrivous layered structure,typical column struct...The detailed microstructures of Ni80Fe20/Fe50Mn50 superlattices have been characterized using both x-ray diffraction techniques and transmission electron microscopy.The obrivous layered structure,typical column structure and twins which exist in Ni80Fe20/Fe50Mn50 superlattices were observed through performing transmission microscopy.By combining the technique of lowangle x-ray reflectivity(specular and off-specular scans)with the anomalous scattering effect and high-angle x-ray diffraction(using conventional x-ray),wequantitatively analysed the microstructural variation as a function of annealing temperature.It is found that the lateral correlation length,the(111)peak intensity of the superlattices and the average multilayer coherence length all increase with a rise in annealing temperature annealing can decrease the rootmean-square roughness at the interfaces of Ni80Fe20/Fe50Mn50 superlattices.the obtained microstructural knowledge will be helpful in understanding the magnetic properties of the ni80Fe20/Fe50Mn50 exchange bias system.展开更多
基金Project(19974005) supported by the National Natural Science Foundation of China
文摘Effects of Cu underlayer on the structure of Fe50Mn50 films were studied. Samples with a structure of Fe50Mn50（200 nm）/ Cu(tCu) were prepared by magnetron sputtering on thermally oxidized silicon substrates at room temperature. The thickness of Cu underlayer varied from 0 to 60 nm in the intervals of 10 nm. High-vacuum annealing treatments, at different temperatures of 200, 300 and 400 ℃ for 1 h, respectively, on the Fe50Mn50（200 nm）/ Cu（20 nm） thin films were performed. The surface morphologies and textures of the samples were measured by field emission scan electronic microscope （FE-SEM） and X-ray diffraction（XRD）. Energy dispersive X-ray spectroscopy （EDX） and Auger electron spectroscopy（AES） were used to analyze the compositional distribution. It is found that Cu underlayer has an obvious induce effect on （111） orientation of Fe50Mn50 thin films. The induce effects of Cu on （111） orientation of Fe50Mn50 changed with the increase of Cu layer thickness and the best effect was obtained at the Cu layer thickness of 20 nm. High-vacuum annealing treatments cause the migration of Mn atoms towards surface of the film and interface between Cu layer and substrate. With the increasing annealing temperature, migration of Mn atoms is more obvious, which leads to a Fe-riched Fe-Mn alloy film.
文摘The detailed microstructures of Ni80Fe20/Fe50Mn50 superlattices have been characterized using both x-ray diffraction techniques and transmission electron microscopy.The obrivous layered structure,typical column structure and twins which exist in Ni80Fe20/Fe50Mn50 superlattices were observed through performing transmission microscopy.By combining the technique of lowangle x-ray reflectivity(specular and off-specular scans)with the anomalous scattering effect and high-angle x-ray diffraction(using conventional x-ray),wequantitatively analysed the microstructural variation as a function of annealing temperature.It is found that the lateral correlation length,the(111)peak intensity of the superlattices and the average multilayer coherence length all increase with a rise in annealing temperature annealing can decrease the rootmean-square roughness at the interfaces of Ni80Fe20/Fe50Mn50 superlattices.the obtained microstructural knowledge will be helpful in understanding the magnetic properties of the ni80Fe20/Fe50Mn50 exchange bias system.
