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Challenges and recent advances in HfO_(2)-based ferroelectric films for non-volatile memory applications
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作者 Ming-Hao Shao Rui-Ting Zhao +15 位作者 Houfang Liu Wen-Jia Xu Yi-Da Guo Da-Peng Huang Yu-Zhe Yang Xin-Ru Li Wancheng Shao Peng-Hui Shen Junwei Liu Kuanmao Wang Jinguo Zheng Zhao-Yi Yan Jian-Lan Yan Tian Lu Yi Yang Tian-Ling Ren 《Chip》 EI 2024年第3期50-72,共23页
The emergence of data-centric applications such as artificial intelligence(AI),machine learning,and the Internet of Things(IoT),has promoted surges in demand for storage memories with high operating speed and nonvolat... The emergence of data-centric applications such as artificial intelligence(AI),machine learning,and the Internet of Things(IoT),has promoted surges in demand for storage memories with high operating speed and nonvolatile characteristics.HfO_(2)-based ferroelectric memory technologies,which emerge as a promising alternative,have attracted considerable attention due to their high performance,energy efficiency,and full compatibility with the standard complementary metal-oxide-semiconductors(CMOS)process.These nonvolatile storage elements,such as ferroelectric random access memory(FeRAM),ferroelectric field-effect transistors(FeFETs),and ferroelectric tunnel junctions(FTJs),possess different data access mechanisms,individual merits,and specific application boundaries in next-generation memories or even beyond von Neumann architecture.This paper provides an overview of ferroelectric HfO2 memory technologies,addresses the current challenges,and offers insights into future research directions and prospects. 展开更多
关键词 Ferroelectric memory Ferroelectric random-access memory ferroelectricfield effect transistor Ferroelectric tunneling junction Hafnium oxide
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