Atoms constructing an interconnecting metal line in a semiconductor device are transported by electron flow in high density. This phenomenon is called electromigration, which may cause the line failure. In order to ch...Atoms constructing an interconnecting metal line in a semiconductor device are transported by electron flow in high density. This phenomenon is called electromigration, which may cause the line failure. In order to characterize the electromigration failure, a comparison study is carded out with some typical phenomena treated by fracture mechanics for thin and large structures. An example of thin structures, which have been treated by fracture mechanics, is silica opti- cal fibers for communication systems. The damage growth in a metal line by electromigration is characterized in compar- ison with the crack growth in a silica optical fiber subjected to static fatigue. Also a brief comparison is made between the electromigration failure and some fracture phenomena in large structures.展开更多
The present work reports a Hybrid Modular Floating Structure(HMFS)system with typical malfunction conditions.The effects of both fractured mooring lines and failed connectors on main hydrodynamic responses(mooring lin...The present work reports a Hybrid Modular Floating Structure(HMFS)system with typical malfunction conditions.The effects of both fractured mooring lines and failed connectors on main hydrodynamic responses(mooring line tensions,module motions,connector loads and wave power production)of the HMFS system under typical sea con-ditions are comparatively investigated.The results indicate that the mooring tension distribution,certain module motions(surge,sway and yaw)and connector loads(Mz)are significantly influenced by mooring line fractures.The adjacent mooring line of the fractured line on the upstream side suffers the largest tension among the remaining mooring lines,and the case with two fractured mooring lines in the same group on the upstream side is the most dangerous among all cases of two-line failures in view of mooring line tensions,module motions and connector loads.There-fore,one emergency strategy with appropriate relaxation of a proper mooring line has been proposed and proved effective to reduce the risk of more progressive mooring line fractures.In addition,connector failures substantially affect certain module motions(heave and pitch),certain connector loads(Fz and My)and wave power production.The present work can be helpful and instructive for studies on malfunction conditions of modular floating structure(MFS)systems.展开更多
Longitudinal shear problems of collinear rigid line inclusions (sometimes calledhard crack or inverse crack problems) in anisotropic materials are dealt with. By usingthe conplex variable method, we present the formul...Longitudinal shear problems of collinear rigid line inclusions (sometimes calledhard crack or inverse crack problems) in anisotropic materials are dealt with. By usingthe conplex variable method, we present the formulation of the general problem and the closed form solutions to some problems of practical importance, The atressdistribution in the immediate vicinity of the rigid line end is examined. The corresponding formulation and solutions for isotropic materials can be arrived at fromthe special cases of those in the present paper, some of which are in agreement with the existing results￣[1].展开更多
文摘Atoms constructing an interconnecting metal line in a semiconductor device are transported by electron flow in high density. This phenomenon is called electromigration, which may cause the line failure. In order to characterize the electromigration failure, a comparison study is carded out with some typical phenomena treated by fracture mechanics for thin and large structures. An example of thin structures, which have been treated by fracture mechanics, is silica opti- cal fibers for communication systems. The damage growth in a metal line by electromigration is characterized in compar- ison with the crack growth in a silica optical fiber subjected to static fatigue. Also a brief comparison is made between the electromigration failure and some fracture phenomena in large structures.
基金supported by Shenzhen Science and Technology Program(Grant No.KQTD20210811090112003)the National Natural Science Foundation of China(Grant No.52161041).
文摘The present work reports a Hybrid Modular Floating Structure(HMFS)system with typical malfunction conditions.The effects of both fractured mooring lines and failed connectors on main hydrodynamic responses(mooring line tensions,module motions,connector loads and wave power production)of the HMFS system under typical sea con-ditions are comparatively investigated.The results indicate that the mooring tension distribution,certain module motions(surge,sway and yaw)and connector loads(Mz)are significantly influenced by mooring line fractures.The adjacent mooring line of the fractured line on the upstream side suffers the largest tension among the remaining mooring lines,and the case with two fractured mooring lines in the same group on the upstream side is the most dangerous among all cases of two-line failures in view of mooring line tensions,module motions and connector loads.There-fore,one emergency strategy with appropriate relaxation of a proper mooring line has been proposed and proved effective to reduce the risk of more progressive mooring line fractures.In addition,connector failures substantially affect certain module motions(heave and pitch),certain connector loads(Fz and My)and wave power production.The present work can be helpful and instructive for studies on malfunction conditions of modular floating structure(MFS)systems.
文摘Longitudinal shear problems of collinear rigid line inclusions (sometimes calledhard crack or inverse crack problems) in anisotropic materials are dealt with. By usingthe conplex variable method, we present the formulation of the general problem and the closed form solutions to some problems of practical importance, The atressdistribution in the immediate vicinity of the rigid line end is examined. The corresponding formulation and solutions for isotropic materials can be arrived at fromthe special cases of those in the present paper, some of which are in agreement with the existing results￣[1].
