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Radiation Damage Analysis of Individual Subcells for GaInP/GaAs/Ge Solar Cells Using Photoluminescence Measurements 被引量:2
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作者 Yong Zheng Tian-Cheng Yi +2 位作者 Jun-Ling Wang Peng-Fei Xiao Rong Wang 《Chinese Physics Letters》 SCIE CAS CSCD 2017年第2期63-66,共4页
The radiation damage of three individual subcells for GalnP/GaAs//Ge triple-junction solar cells irradiated with electrons and protons is investigated using photoluminescence (PL) measurements. The PL spectra of eac... The radiation damage of three individual subcells for GalnP/GaAs//Ge triple-junction solar cells irradiated with electrons and protons is investigated using photoluminescence (PL) measurements. The PL spectra of each subcell are obtained using different excitation lasers. The PL intensity has a fast degradation after irradiation, and decreases as the displacement damage dose increases. Furthermore, the normalized PL intensity varying with the displacement damage dose is analyzed in detail, and then the lifetime damage coefficients of the recombination centers for GaInP top-cell, GaAs mid-cell and Ge bottom-cell of the triple-junction solar cells are determined from the PL radiative efficiency. 展开更多
关键词 Radiation Damage Analysis of Individual Subcells for GaInP/GaAs/Ge Solar cells Using Photoluminescence Measurements Ge
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Effects of 50keV and 100keV Proton Irradiation on GaInP/GaAs/Ge Triple-Junction Solar Cells 被引量:1
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作者 王荣 冯钊 +1 位作者 刘运宏 鲁明 《Plasma Science and Technology》 SCIE EI CAS CSCD 2012年第7期647-649,共3页
GaInP/GaAs/Ge triple-junction solar cells were irradiated with 50 keV and 100 keV protons at fluences of 5 × 10^10 cm^-2, 1 × 10^11 cm^-2,1 × 10^12 cm^-2, and 1 × 10^13 cm^-2. Their performance deg... GaInP/GaAs/Ge triple-junction solar cells were irradiated with 50 keV and 100 keV protons at fluences of 5 × 10^10 cm^-2, 1 × 10^11 cm^-2,1 × 10^12 cm^-2, and 1 × 10^13 cm^-2. Their performance degradation is analyzed using current-voltage characteristics and spectral response measurements, and then the changes in Isc, Voc, Pmax and the spectral response of the cells are observed as functions of proton irradiation fluence and energy. The results show that the spectral response of the top cell degrades more significantly than that of the middle cell, and 100 keV proton-induced degradation rates of Isc, Voc and Pmax are larger compared with 50 keV proton irradiation. 展开更多
关键词 GaInP/GaAs/Ge solar cell proton irradiation spectral response
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GaInP/GaInAs/GaInNAs/Ge Four-Junction Solar Cell Grown by Metal Organic Chemical Vapor Deposition with High Efficiency
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作者 张杨 王青 +5 位作者 张小宾 刘振奇 陈丙振 黄珊珊 彭娜 王智勇 《Chinese Physics Letters》 SCIE CAS CSCD 2016年第10期167-171,共5页
We directly grow a lattice matched GalnP/GalnAs/GalnNAs/Ge (1.88 eVil .42 eVil .05 eV/0.67eV) four-junction (4J) solar cell on a Ge substrate by the metal organic chemical vapor deposition technology. To solve the... We directly grow a lattice matched GalnP/GalnAs/GalnNAs/Ge (1.88 eVil .42 eVil .05 eV/0.67eV) four-junction (4J) solar cell on a Ge substrate by the metal organic chemical vapor deposition technology. To solve the current limit of the GalnNAs sub cell, we design three kinds of anti-reflection coatings and adjust the base region thickness of the GalnNAs sub cell. Developed by a series of experiments, the external quantum efficiency of the GalnNAs sub cell exceeds 80%, and its current density reaches 11.24 mA/cm2. Therefore the current limit of the 4J solar cell is significantly improved. Moreover, we discuss the difference of test results between 4J and GalnP/GalnAs/Ge solar cells under the 1 sun AMO spectrum. 展开更多
关键词 by on it of GaInP/GaInAs/GaInNAs/Ge Four-Junction Solar cell Grown by Metal Organic Chemical Vapor Deposition with High Efficiency is THAN Ge GaAs with cell that
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Photoluminescence Analysis of Electron Damage for Minority Carrier Diffusion Length in GaInP/GaAs/Ge Triple-Junction Solar Cells
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作者 Rui Wu Jun-Ling Wang +1 位作者 Gang Yan Rong Wang 《Chinese Physics Letters》 SCIE CAS CSCD 2018年第4期70-73,共4页
Photoluminescence(PL) measurements are carried out to investigate the degradation of GaInP top cell and GaAs middle cell for GaInP/GaAs/Ge triple-junction solar cells irradiated with 1.0, 1.8 and 11.5 MeV electrons ... Photoluminescence(PL) measurements are carried out to investigate the degradation of GaInP top cell and GaAs middle cell for GaInP/GaAs/Ge triple-junction solar cells irradiated with 1.0, 1.8 and 11.5 MeV electrons with fluences ranging up to 3 × 10^15, 1 × 10^15 and 3 × 10^14 cm^-2, respectively. The degradation rates of PL intensity increase with the electron fluence and energy. Furthermore, the damage coefficient of minority carrier diffusion length is estimated by the PL radiative efficiency. The damage coefficient increases with the electron energy. The relation of damage coefficient to electron energy is discussed with the non-ionizing energy loss(NIEL), which shows a quadratic dependence between damage coefficient and NIEL. 展开更多
关键词 In Photoluminescence Analysis of Electron Damage for Minority Carrier Diffusion Length in GaInP/GaAs/Ge Triple-Junction Solar cells Ge
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