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A Fractional Drift Diffusion Model for Organic Semiconductor Devices
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作者 Yi Yang Robert A.Nawrocki +1 位作者 Richard M.Voyles Haiyan H.Zhang 《Computers, Materials & Continua》 SCIE EI 2021年第10期237-266,共30页
Because charge carriers of many organic semiconductors(OSCs)exhibit fractional drift diffusion(Fr-DD)transport properties,the need to develop a Fr-DD model solver becomes more apparent.However,the current research on ... Because charge carriers of many organic semiconductors(OSCs)exhibit fractional drift diffusion(Fr-DD)transport properties,the need to develop a Fr-DD model solver becomes more apparent.However,the current research on solving the governing equations of the Fr-DD model is practically nonexistent.In this paper,an iterative solver with high precision is developed to solve both the transient and steady-state Fr-DD model for organic semiconductor devices.The Fr-DD model is composed of two fractionalorder carriers(i.e.,electrons and holes)continuity equations coupled with Poisson’s equation.By treating the current density as constants within each pair of consecutive grid nodes,a linear Caputo’s fractional-order ordinary differential equation(FrODE)can be produced,and its analytic solution gives an approximation to the carrier concentration.The convergence of the solver is guaranteed by implementing a successive over-relaxation(SOR)mechanism on each loop of Gummel’s iteration.Based on our derivations,it can be shown that the Scharfetter–Gummel discretization method is essentially a special case of our scheme.In addition,the consistency and convergence of the two core algorithms are proved,with three numerical examples designed to demonstrate the accuracy and computational performance of this solver.Finally,we validate the Fr-DD model for a steady-state organic field effect transistor(OFET)by fitting the simulated transconductance and output curves to the experimental data. 展开更多
关键词 Fractional drift diffusion model gummel’s iteration Caputo’s fractional-order ordinary differential equation organic field effect transistor
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Combined Electromagnetic and Drift Diffusion Models for Microwave Semiconductor Device
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作者 Samir Labiod Saida Latreche +1 位作者 Mourad Bella Christian Gontrand 《Journal of Electromagnetic Analysis and Applications》 2011年第10期423-429,共7页
In this work, we present a numerical model to solve the drift diffusion equations coupled with electromagnetic model, where all simulations codes are implemented using MATLAB code software. As first, we present a one-... In this work, we present a numerical model to solve the drift diffusion equations coupled with electromagnetic model, where all simulations codes are implemented using MATLAB code software. As first, we present a one-dimensional (1-D) PIN diode structure simulation achieved by solving the drift diffusion model (DDM). Backward Euler algorithm is used for the discretization of the proposed model. The aim is to accomplish time-domain integration. Also, finite different method (FDM) is considered to achieve space-Domain mesh. We introduced an iterative scheme to solve the obtained matrix systems, which combines the Gummel’s iteration with an efficient direct numerical UMFPACK method. The obtained solutions of the proposed algorithm provide the time and space distribution of the unknown functions like electrostatic potential and carrier’s concentration for the PIN diode. As second case, the finite-difference time-domain (FDTD) technique is adopted to analyze the entire 3-D structure of the stripline circuit including the lumped element PIN diode. The microwave circuit is located in an unbounded medium, requiring absorbing boundaries to avoid nonphysical reflections. Active device results were presented and show a good agreement with other reference. Electromagnetic results are qualitatively in agreement with other results obtained using SILVACO-TCAD. 展开更多
关键词 DRIFT-DIFFUsION Model gummel’s METHOD BACKWARD EULER MAXWELL’s Equation 3-D FDTD METHOD
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