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Microprecipitates in Semi-Insulating GaAs Single Crystals
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作者 Mo Peigen Zhu Jian Wu Ju Shanghai Institute of Metallurgy,Academia Sinica 《Rare Metals》 SCIE EI CAS CSCD 1989年第1期23-27,共5页
The microprecipitates in the as-grown undoped and In-doped semi-insulating GaAs single crystals have been ex- amined by JEM 200 CX transmission electron microscope.The microprecipitates consist of GaAs polycrystalline... The microprecipitates in the as-grown undoped and In-doped semi-insulating GaAs single crystals have been ex- amined by JEM 200 CX transmission electron microscope.The microprecipitates consist of GaAs polycrystalline grains of 5~100nm in size have been evidenced in dislocated crystals.Energy dispersive X-ray analysis shows that the mieropreeipitates are predominately arsenic-rich GaAs.The As/Ga atomic ratio of the microprecipitates in In-doped crystal is higher than that of undoped crystal.It is suggested that the formation of the microprecipitates may be induced by the local fluctuation of compositional undercooling during crystal growth. 展开更多
关键词 In gaas Microprecipitates in Semi-Insulating gaas Single crystals
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Low temperature photoluminescence study of Ga As defect states
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作者 Jia-Yao Huang Lin Shang +6 位作者 Shu-Fang Ma Bin Han Guo-Dong Wei Qing-Ming Liu Xiao-Dong Hao Heng-Sheng Shan Bing-She Xu 《Chinese Physics B》 SCIE EI CAS CSCD 2020年第1期192-196,共5页
Low temperature(77 K)photoluminescence measurements have been performed on different GaAs substrates to evaluate the GaAs crystal quality.Several defect-related luminescence peaks have been observed,including 1.452 eV... Low temperature(77 K)photoluminescence measurements have been performed on different GaAs substrates to evaluate the GaAs crystal quality.Several defect-related luminescence peaks have been observed,including 1.452 eV,1.476 eV,1.326 eV peaks deriving from 78 meV GaAs antisite defects,and 1.372 eV,1.289 eV peaks resulting from As vacancy related defects.Changes in photoluminescence emission intensity and emission energy as a function of temperature and excitation power lead to the identification of the defect states.The luminescence mechanisms of the defect states were studied by photoluminescence spectroscopy and the growth quality of GaAs crystal was evaluated. 展开更多
关键词 low temperature photoluminescence gaas antisite defects luminescence mechanisms of defect states gaas crystal quality
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Purcell effect of GaAs quantum dots by photonic crystal microcavities 被引量:2
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作者 Kazuaki Sakoda Takashi Kuroda +7 位作者 NaokiI keda Takaaki Mano Yoshimasa Sugimoto Tetsuyuki Ochiai Keiji Kuroda Shunsuke Ohkouchi Nobuyuki Koguchi Kiyoshi Asakawa 《Chinese Optics Letters》 SCIE EI CAS CSCD 2009年第10期879-881,共3页
We fabricate photonic crystal slab microcavities embedded with GaAs quantum dots by electron beam lithography and droplet epitaxy. The Purcell effect of exciton emission of the quantum dots is confirmed by the micro p... We fabricate photonic crystal slab microcavities embedded with GaAs quantum dots by electron beam lithography and droplet epitaxy. The Purcell effect of exciton emission of the quantum dots is confirmed by the micro photoluminescence measurement. The resonance wavelengths, widths, and polarization are consistent with numerical simulation results. 展开更多
关键词 gaas Purcell effect of gaas quantum dots by photonic crystal microcavities QDS
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Properties of GaAs single crystals grown by molecular beam epitaxy at low temperatures
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作者 陈诺夫 何宏家 +1 位作者 王玉田 林兰英 《Science China Mathematics》 SCIE 1997年第2期214-218,共5页
Properties of GaAs single crystals grown at low temperatures by molecular beam epitaxy (LTMBE GaAs) have been studied. The results show that excessive arsenic atoms of about 1020 cm?3 exist in LTMBE GaAs in the form o... Properties of GaAs single crystals grown at low temperatures by molecular beam epitaxy (LTMBE GaAs) have been studied. The results show that excessive arsenic atoms of about 1020 cm?3 exist in LTMBE GaAs in the form of arsenic interstitial couples, and cause the dilation in lattice parameter of LTMBE GaAs. The arsenic interstitial couples will be decomposed, and the excessive arsenic atoms will precipitate during the annealing above 300°C. Arsenic precipitates accumulate in the junctions of epilayers with the increase in the temperature of annealing. The depletion regions caused by arsenic precipitates overlap each other in LTMBE GaAs, taking on the character of high resistivity, and the effects of backgating or sidegating are effectively restrained. 展开更多
关键词 low temperature molecular beam epitaxy gaas single crystal lattice parameter arsenic intertitial couples arsenic precipitates effects of backgating or sidegating
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