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Material Growth and Device Fabrication of GaAs Based 1.3μm GaInNAs Quantum Well Laser Diodes 被引量:1
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作者 牛智川 韩勤 +11 位作者 倪海桥 杨晓红 徐应强 杜云 张石勇 彭红玲 赵欢 吴东海 李树英 贺振宏 任正伟 吴荣汉 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2005年第9期1860-1864,共5页
Material growth and device fabrication of the first 1.3μm quantum well (QW) edge emitting laser diodes in China are reported. Through the optimization of the molecular beam epitaxy (MBE) growth conditions and the... Material growth and device fabrication of the first 1.3μm quantum well (QW) edge emitting laser diodes in China are reported. Through the optimization of the molecular beam epitaxy (MBE) growth conditions and the tuning of the indium and nitrogen composition of the GalnNAs QWs, the emission wavelengths of the QWs can be tuned to 1.3μm. Ridge geometry waveguide laser diodes are fabricated. The lasing wavelength is 1.3μm under continuous current injection at room temperature with threshold current of 1kA/cm^2 for the laser diode structures with the cleaved facet mirrors. The output light power over 30mW is obtained. 展开更多
关键词 gaas based materials GalnNAs quantum wells molecular beam epitaxy laser diodes
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Study of GaAs/GaAlAs Multilayer Structural Materials by Electrolyte Electroreflectance
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作者 Wang, Zhoucheng Peng, Ruiwu Qian, Youhua 《Rare Metals》 SCIE EI CAS CSCD 1990年第2期131-134,共4页
Electrolyte electroreflectance (EER) has been widely employed to investigate the electronic energy band structure and related physical properties of semiconductors. The electrolyte electroreflectance (EER) method comb... Electrolyte electroreflectance (EER) has been widely employed to investigate the electronic energy band structure and related physical properties of semiconductors. The electrolyte electroreflectance (EER) method combined with electrochemical anodic dissolution was used to study GaAs/GaAlAs multilayer structural materials. According to variation of the EER spectra during anodic dissolution the characteristics of GaAs/GaAlAs multilayer structural materials such as properties of the interface, p-n junction positions and Al content profiles were obtained. 展开更多
关键词 gaas AI EER Study of gaas/GaAlAs Multilayer Structural materials by Electrolyte Electroreflectance
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