在TFT-LCD(Thin film transistor-liquid crystal display)行业中,进行摩擦工艺制程时,玻璃基板与机台接触、分离;摩擦辊与玻璃基板摩擦、摩擦机台顶针上升过程,都容易产生静电击穿。针对一款在摩擦工艺过程中产生静电的GOA(Gate driver...在TFT-LCD(Thin film transistor-liquid crystal display)行业中,进行摩擦工艺制程时,玻璃基板与机台接触、分离;摩擦辊与玻璃基板摩擦、摩擦机台顶针上升过程,都容易产生静电击穿。针对一款在摩擦工艺过程中产生静电的GOA(Gate driver on Array)产品,结合摩擦工艺参数、生产环境,进行了一系列静电相关验证。验证发现:摩擦工艺中摩擦布寿命、环境湿度对静电发生影响很大。摩擦布寿命越靠后,静电越容易发生;湿度越大,静电越不容易发生。摩擦机台顶针上升速度、摩擦布类型也对静电发生有一定影响,顶针缓慢上升,静电不容易发生;摩擦棉布较尼龙布静电效果相对较好。而针对摩擦工艺发生的静电失效不良,光配向替代是一种根本的解决方法,导入光配向工艺后,摩擦相关静电失效不良由量产6.8%下降为0%。展开更多
随着GOA(Gate On Array)技术的不断发展,在小尺寸TFT-LCD窄边框显示屏上的应用也越来越频繁,但是由于GOA电路的复杂性和TFT器件自身的稳定性,以及外界温度、湿度的影响,显示屏还存在显示不稳定的问题。本文针对小尺寸TFT-LCD GOA显示屏...随着GOA(Gate On Array)技术的不断发展,在小尺寸TFT-LCD窄边框显示屏上的应用也越来越频繁,但是由于GOA电路的复杂性和TFT器件自身的稳定性,以及外界温度、湿度的影响,显示屏还存在显示不稳定的问题。本文针对小尺寸TFT-LCD GOA显示屏在高温高湿环境下产生的异常显示横纹,进行了深入分析与改善研究。通过对GOA区域ITO过孔电阻测试、显微镜检查以及修复实验验证,找出了不良产生的直接原因为ITO发生腐蚀,过孔电阻增大,导致GOA驱动信号无法上下导通。接着进一步研究ITO腐蚀发生的条件、ITO腐蚀情况、驱动信号对应关系以及腐蚀成分,证明了ITO发生腐蚀原因为产品长期工作(200h左右)在高温高湿环境下,由于水汽的不断渗入,使GOA区域ITO发生了电化学腐蚀效应。最后根据电化学腐蚀原理,通过采用隔水性强的封框胶、增加ITO膜厚以及降低ITO电位差等措施对工艺进行了改善,结果表明改善后的显示屏超过1 000h,未发生ITO腐蚀。展开更多
本文综述了双侧GOA(Gate On Array)驱动TFT-LCD的结构以及电路控制方式,对亚像素的电路结构做了说明,并详细阐述了双侧GOA驱动TFT-LCD的Data Open(DO)、Gate Open(GO)、Data Gate Shot(DGS)、Data Common Shot(DCS)、Gate Common Shot(G...本文综述了双侧GOA(Gate On Array)驱动TFT-LCD的结构以及电路控制方式,对亚像素的电路结构做了说明,并详细阐述了双侧GOA驱动TFT-LCD的Data Open(DO)、Gate Open(GO)、Data Gate Shot(DGS)、Data Common Shot(DCS)、Gate Common Shot(GCS)的现象和形成机理。展开更多
王彦1978年出生,分别于2001年、2005年获同济大学建筑学学士学位和瑞士苏黎世联邦工业大学（ETHZ）建筑学硕士学位。他曾在瑞士Martin？Gautschi？建筑设计事务所、瑞士Herzog de Meuron建筑设计事务所和瑞士Keller建筑技术有限公司工作...王彦1978年出生,分别于2001年、2005年获同济大学建筑学学士学位和瑞士苏黎世联邦工业大学（ETHZ）建筑学硕士学位。他曾在瑞士Martin？Gautschi？建筑设计事务所、瑞士Herzog de Meuron建筑设计事务所和瑞士Keller建筑技术有限公司工作。2007年王彦主持上海绿环建筑设计事务所,2014年带领事务所团队加入GOA大象设计,成为合伙人之一。展开更多
The Precambrian greywacke of Ribandar-Chimbel belonging to the Sanvordem Formation of the Goa Group, India, has been studied for petrography and analyzed for major trace elements. The greywacke is characterized by ang...The Precambrian greywacke of Ribandar-Chimbel belonging to the Sanvordem Formation of the Goa Group, India, has been studied for petrography and analyzed for major trace elements. The greywacke is characterized by angular to sub-round grains of quartz, feldspar, biotite, chlorite and clay minerals. The abundance of clay in the matrix seems to have influenced the Al2O3 content and the K20/Al2O3 ratio. The variation diagrams indicate a decreasing trend of TiO2, Al2O3, Fe2O3 and MgO; whereas Na2O and CaO exhibit a scatter which could be a result of the variable presence of feldspar within the sediments. The immobile elements, vanadium （25 to 144 ppm）, nickel （up to 107 ppm） and chromium （up to 184 ppm）, reflect abundance of clay minerals. The greywacke shows strongly fractionated REE patterns with LaN/YbN = 8 to 26 and with higher total REE abundances （up to 245 ppm）. The low REE enrichment and depletion in heavier REE with prominent negative Eu anomaly （Eu/Eu^＊= 0.54 to 0.79） suggest a derivation of the greywacke from an old upper continental crust composed chiefly of felsic components. Petrological evidence and geochemical data suggest that the deposition of the greywacke largely took place in a deep to shallow basin that progressively chang- ed from that of a continental island arc to an active continental setting.展开更多
GOA型TFT LCD产品Shorting Bar testing工序烧伤现象严重,针对把根源归结为Shorting Bar Testing工序测试参数电压过高的假设,设计一个Source电压远高于理论测试电压的测试波形,分别以高压值参数和理论值参数对样品进行测试,结果发现两...GOA型TFT LCD产品Shorting Bar testing工序烧伤现象严重,针对把根源归结为Shorting Bar Testing工序测试参数电压过高的假设,设计一个Source电压远高于理论测试电压的测试波形,分别以高压值参数和理论值参数对样品进行测试,结果发现两种情况下烧伤概率一样;针对把根源归结为Shorting Bar testing工序驱动程序启动瞬间冲击烧伤的假设,在测试驱动板上每个测试信号输入口加一个限流器,用加限流器和没加限流器的测试治具分别对样品进行测试,结果发现两者烧伤概率一样;针对把根源归结为静电击伤的假设,在Shorting Bar testing工序增加防静电措施,分别在改进前后的测试环境对样品进行测试,发现改进后未出现烧伤现象。可见出烧伤现象的根源在于静电,而非其他原因。展开更多
We present in this paper a numerical study of the validity limit of the geometrical optics approximation compared with a differential method which is established according to rigorous formalisms based on the electroma...We present in this paper a numerical study of the validity limit of the geometrical optics approximation compared with a differential method which is established according to rigorous formalisms based on the electromagnetic theory. The precedent studies show that this method is adapted to the study of diffraction by periodic rough surfaces. We determine by two methods the emissivity of gold and tungsten for surfaces with a rectangular or sinusoidal profile, for a wavelength equal to 0.55 microns. The monochromatic directional emissivity of these surfaces clearly depends on the angle of incidence, the surface profile, height, period and the nature of the material. We perform our calculations by a method of coupled wave analysis (CWA) and a geometric optics method (GOA). The latter method is theoretically valid only when the dimensions of the cavities are very large compared to the wavelength, while the CWA is theoretically correct whatever these dimensions. The main purpose of this work is to investigate the validity limit of GOA compared with CWA. The obtained results for a fixed height of the grating, allowed us to delimit the validity domain of the optic geometrical approximation for the treated cases. Finally, the agreement between the emissivity calculated by the differential method and that given on the basis of the homogenization theory is satisfactory when the period is much smaller than the wavelength.展开更多
文摘在TFT-LCD(Thin film transistor-liquid crystal display)行业中,进行摩擦工艺制程时,玻璃基板与机台接触、分离;摩擦辊与玻璃基板摩擦、摩擦机台顶针上升过程,都容易产生静电击穿。针对一款在摩擦工艺过程中产生静电的GOA(Gate driver on Array)产品,结合摩擦工艺参数、生产环境,进行了一系列静电相关验证。验证发现:摩擦工艺中摩擦布寿命、环境湿度对静电发生影响很大。摩擦布寿命越靠后,静电越容易发生;湿度越大,静电越不容易发生。摩擦机台顶针上升速度、摩擦布类型也对静电发生有一定影响,顶针缓慢上升,静电不容易发生;摩擦棉布较尼龙布静电效果相对较好。而针对摩擦工艺发生的静电失效不良,光配向替代是一种根本的解决方法,导入光配向工艺后,摩擦相关静电失效不良由量产6.8%下降为0%。
文摘随着GOA(Gate On Array)技术的不断发展,在小尺寸TFT-LCD窄边框显示屏上的应用也越来越频繁,但是由于GOA电路的复杂性和TFT器件自身的稳定性,以及外界温度、湿度的影响,显示屏还存在显示不稳定的问题。本文针对小尺寸TFT-LCD GOA显示屏在高温高湿环境下产生的异常显示横纹,进行了深入分析与改善研究。通过对GOA区域ITO过孔电阻测试、显微镜检查以及修复实验验证,找出了不良产生的直接原因为ITO发生腐蚀,过孔电阻增大,导致GOA驱动信号无法上下导通。接着进一步研究ITO腐蚀发生的条件、ITO腐蚀情况、驱动信号对应关系以及腐蚀成分,证明了ITO发生腐蚀原因为产品长期工作(200h左右)在高温高湿环境下,由于水汽的不断渗入,使GOA区域ITO发生了电化学腐蚀效应。最后根据电化学腐蚀原理,通过采用隔水性强的封框胶、增加ITO膜厚以及降低ITO电位差等措施对工艺进行了改善,结果表明改善后的显示屏超过1 000h,未发生ITO腐蚀。
文摘本文综述了双侧GOA(Gate On Array)驱动TFT-LCD的结构以及电路控制方式,对亚像素的电路结构做了说明,并详细阐述了双侧GOA驱动TFT-LCD的Data Open(DO)、Gate Open(GO)、Data Gate Shot(DGS)、Data Common Shot(DCS)、Gate Common Shot(GCS)的现象和形成机理。
文摘王彦1978年出生,分别于2001年、2005年获同济大学建筑学学士学位和瑞士苏黎世联邦工业大学（ETHZ）建筑学硕士学位。他曾在瑞士Martin？Gautschi？建筑设计事务所、瑞士Herzog de Meuron建筑设计事务所和瑞士Keller建筑技术有限公司工作。2007年王彦主持上海绿环建筑设计事务所,2014年带领事务所团队加入GOA大象设计,成为合伙人之一。
文摘The Precambrian greywacke of Ribandar-Chimbel belonging to the Sanvordem Formation of the Goa Group, India, has been studied for petrography and analyzed for major trace elements. The greywacke is characterized by angular to sub-round grains of quartz, feldspar, biotite, chlorite and clay minerals. The abundance of clay in the matrix seems to have influenced the Al2O3 content and the K20/Al2O3 ratio. The variation diagrams indicate a decreasing trend of TiO2, Al2O3, Fe2O3 and MgO; whereas Na2O and CaO exhibit a scatter which could be a result of the variable presence of feldspar within the sediments. The immobile elements, vanadium （25 to 144 ppm）, nickel （up to 107 ppm） and chromium （up to 184 ppm）, reflect abundance of clay minerals. The greywacke shows strongly fractionated REE patterns with LaN/YbN = 8 to 26 and with higher total REE abundances （up to 245 ppm）. The low REE enrichment and depletion in heavier REE with prominent negative Eu anomaly （Eu/Eu^＊= 0.54 to 0.79） suggest a derivation of the greywacke from an old upper continental crust composed chiefly of felsic components. Petrological evidence and geochemical data suggest that the deposition of the greywacke largely took place in a deep to shallow basin that progressively chang- ed from that of a continental island arc to an active continental setting.
文摘GOA型TFT LCD产品Shorting Bar testing工序烧伤现象严重,针对把根源归结为Shorting Bar Testing工序测试参数电压过高的假设,设计一个Source电压远高于理论测试电压的测试波形,分别以高压值参数和理论值参数对样品进行测试,结果发现两种情况下烧伤概率一样;针对把根源归结为Shorting Bar testing工序驱动程序启动瞬间冲击烧伤的假设,在测试驱动板上每个测试信号输入口加一个限流器,用加限流器和没加限流器的测试治具分别对样品进行测试,结果发现两者烧伤概率一样;针对把根源归结为静电击伤的假设,在Shorting Bar testing工序增加防静电措施,分别在改进前后的测试环境对样品进行测试,发现改进后未出现烧伤现象。可见出烧伤现象的根源在于静电,而非其他原因。
文摘We present in this paper a numerical study of the validity limit of the geometrical optics approximation compared with a differential method which is established according to rigorous formalisms based on the electromagnetic theory. The precedent studies show that this method is adapted to the study of diffraction by periodic rough surfaces. We determine by two methods the emissivity of gold and tungsten for surfaces with a rectangular or sinusoidal profile, for a wavelength equal to 0.55 microns. The monochromatic directional emissivity of these surfaces clearly depends on the angle of incidence, the surface profile, height, period and the nature of the material. We perform our calculations by a method of coupled wave analysis (CWA) and a geometric optics method (GOA). The latter method is theoretically valid only when the dimensions of the cavities are very large compared to the wavelength, while the CWA is theoretically correct whatever these dimensions. The main purpose of this work is to investigate the validity limit of GOA compared with CWA. The obtained results for a fixed height of the grating, allowed us to delimit the validity domain of the optic geometrical approximation for the treated cases. Finally, the agreement between the emissivity calculated by the differential method and that given on the basis of the homogenization theory is satisfactory when the period is much smaller than the wavelength.
