A simple method to objectively and simultaneously measure eye's longitudinal and transverse chromatic aberrations was proposed.A dual-wavelength wavefront measurement system using two Hartmann-Shack wavefront sens...A simple method to objectively and simultaneously measure eye's longitudinal and transverse chromatic aberrations was proposed.A dual-wavelength wavefront measurement system using two Hartmann-Shack wavefront sensors was developed.The wavefronts of the red(639.1 nm)and near-infrared(786.0 nm)lights were measured simultaneously for different positions in the model eye.The chromatic wavefronts were converted into Zernike polynomials.The Zernike tilt cofficient(irst term)was used to calculate the transverse chromatic aberration along the ax-direction,while the Zernike defocus coefficient(fourth term)was used to calculate the longi-tudinal chromatic aberration.The measurement and simulation data were consistent.展开更多
Based on Hartmann-Shack sensor technique, an online thin film stress measuring system was introduced to measure the film stresses of TiO2 and SiO2, and comparison was made between the film stresses prepared respective...Based on Hartmann-Shack sensor technique, an online thin film stress measuring system was introduced to measure the film stresses of TiO2 and SiO2, and comparison was made between the film stresses prepared respectively by the conventional process and the ion-beam assisted deposition. The effect of ion-beam assisted deposition on the film stresses of TiO2 and SiO2 was investigated in details, and the stress control methodologies using on-line adjustment and film doping were put forward. The results show that the film stress value of TiO2 prepared by ion-beam assisted deposition is 40 MPa lower than that prepared by conventional process, and the stress of TiO2 film changes gradually from tensile stress into compressive stress with increasing ion energy; while the film stress of SiO2 is a tensile stress under ion-beam assisted deposition because of the ion-beam sputtering effect, and the film refractive index decreases with increasing ion energy. A dynamic film stress control can be achieved through in-situ adjustment of the processing parameters based on the online film stress measuring technique, and the intrinsic stress of film can be effectively changed through film doping.展开更多
基金National Science Foundation of China(NSFC)(61378064)the National High Technology Research and Development Program of China(2015AA020510).
文摘A simple method to objectively and simultaneously measure eye's longitudinal and transverse chromatic aberrations was proposed.A dual-wavelength wavefront measurement system using two Hartmann-Shack wavefront sensors was developed.The wavefronts of the red(639.1 nm)and near-infrared(786.0 nm)lights were measured simultaneously for different positions in the model eye.The chromatic wavefronts were converted into Zernike polynomials.The Zernike tilt cofficient(irst term)was used to calculate the transverse chromatic aberration along the ax-direction,while the Zernike defocus coefficient(fourth term)was used to calculate the longi-tudinal chromatic aberration.The measurement and simulation data were consistent.
文摘Based on Hartmann-Shack sensor technique, an online thin film stress measuring system was introduced to measure the film stresses of TiO2 and SiO2, and comparison was made between the film stresses prepared respectively by the conventional process and the ion-beam assisted deposition. The effect of ion-beam assisted deposition on the film stresses of TiO2 and SiO2 was investigated in details, and the stress control methodologies using on-line adjustment and film doping were put forward. The results show that the film stress value of TiO2 prepared by ion-beam assisted deposition is 40 MPa lower than that prepared by conventional process, and the stress of TiO2 film changes gradually from tensile stress into compressive stress with increasing ion energy; while the film stress of SiO2 is a tensile stress under ion-beam assisted deposition because of the ion-beam sputtering effect, and the film refractive index decreases with increasing ion energy. A dynamic film stress control can be achieved through in-situ adjustment of the processing parameters based on the online film stress measuring technique, and the intrinsic stress of film can be effectively changed through film doping.
