In response to the growing complexity and performance of integrated circuit(IC),there is an urgent need to enhance the testing and stability of IC test equipment.A method was proposed to predict equipment stability us...In response to the growing complexity and performance of integrated circuit(IC),there is an urgent need to enhance the testing and stability of IC test equipment.A method was proposed to predict equipment stability using the upper side boundary value of normal distribution.Initially,the K-means clustering algorithm classifies and analyzes sample data.The accuracy of this boundary value is compared under two common confidence levels to select the optimal threshold.A range is then defined to categorize unqualified test data.Through experimental verification,the method achieves the purpose of measuring the stability of qualitative IC equipment through a deterministic threshold value and judging the stability of the equipment by comparing the number of unqualified data with the threshold value,which realizes the goal of long-term operation monitoring and stability analysis of IC test equipment.展开更多
Because of high development costs of IC (Integrated Circuit) test programs,recycling ekisting test programs from one kind of ATE (Automatic Test Equip-ment) to another or generating directly from CAD simulation module...Because of high development costs of IC (Integrated Circuit) test programs,recycling ekisting test programs from one kind of ATE (Automatic Test Equip-ment) to another or generating directly from CAD simulation modules to ATEis more and more vauable. In this papert a new approach to migrating test pro-grams is presented. A virtual ATE model based on object-oriellted paradigm isdeveloped; it runs Test C++ (an intermediate test control language) programsand TeIF (Test Intermediate Format - an intermediate pattern), migrates testprograms among three kinds of ATE (Ando DIC8032, Schlumberger S15 andGenRad 1732) and gellerates test patterns from two kinds of CAD (Daisy andPanda) automatically.展开更多
基金the National Natural Science Foundation of China(61306046,61640421)the Yicheng Elite Project(202371)+3 种基金the Open Project of National Local Joint Engineering Laboratory of RF Integration and Micro-assembly Technology(KFJJ20230101)the National Key Laboratory of Integrated Chips and Systems Project(SLICS-K202316)the Anhui University Research Project(2023AH050481)the Research on Testing Methods and Accuracy of High Frequency Signal Chips(2023AH050500)。
文摘In response to the growing complexity and performance of integrated circuit(IC),there is an urgent need to enhance the testing and stability of IC test equipment.A method was proposed to predict equipment stability using the upper side boundary value of normal distribution.Initially,the K-means clustering algorithm classifies and analyzes sample data.The accuracy of this boundary value is compared under two common confidence levels to select the optimal threshold.A range is then defined to categorize unqualified test data.Through experimental verification,the method achieves the purpose of measuring the stability of qualitative IC equipment through a deterministic threshold value and judging the stability of the equipment by comparing the number of unqualified data with the threshold value,which realizes the goal of long-term operation monitoring and stability analysis of IC test equipment.
文摘Because of high development costs of IC (Integrated Circuit) test programs,recycling ekisting test programs from one kind of ATE (Automatic Test Equip-ment) to another or generating directly from CAD simulation modules to ATEis more and more vauable. In this papert a new approach to migrating test pro-grams is presented. A virtual ATE model based on object-oriellted paradigm isdeveloped; it runs Test C++ (an intermediate test control language) programsand TeIF (Test Intermediate Format - an intermediate pattern), migrates testprograms among three kinds of ATE (Ando DIC8032, Schlumberger S15 andGenRad 1732) and gellerates test patterns from two kinds of CAD (Daisy andPanda) automatically.
