Incorporating S-shaped testing-effort functions into NHPP software reliability model with imperfect debugging

Testing-effort（TE） and imperfect debugging（ID） in the reliability modeling process may further improve the fitting and prediction results of software reliability growth models（SRGMs）. For describing the S-shaped varying trend of TE increasing rate more accurately, first, two S-shaped testing-effort functions（TEFs）, i.e.,delayed S-shaped TEF（DS-TEF） and inflected S-shaped TEF（IS-TEF）, are proposed. Then these two TEFs are incorporated into various types（exponential-type, delayed S-shaped and inflected S-shaped） of non-homogeneous Poisson process（NHPP）SRGMs with two forms of ID respectively for obtaining a series of new NHPP SRGMs which consider S-shaped TEFs as well as ID. Finally these new SRGMs and several comparison NHPP SRGMs are applied into four real failure data-sets respectively for investigating the fitting and prediction power of these new SRGMs.The experimental results show that：（i） the proposed IS-TEF is more suitable and flexible for describing the consumption of TE than the previous TEFs;（ii） incorporating TEFs into the inflected S-shaped NHPP SRGM may be more effective and appropriate compared with the exponential-type and the delayed S-shaped NHPP SRGMs;（iii） the inflected S-shaped NHPP SRGM considering both IS-TEF and ID yields the most accurate fitting and prediction results than the other comparison NHPP SRGMs.

Comparison of Hazard-Rates Considering Fault Severity Levels and Imperfect Debugging for OSS

Software reliability model is the tool to measure the software reliability quantitatively. Hazard-Rate model is one of the most popular ones. The purpose of our research is to propose the hazard-rate model considering fault level for Open Source Software (OSS). Moreover, we aim to adapt our proposed model to the hazard-rate considering the imperfect debugging environment. We have analyzed the trend of fault severity level by using fault data in Bug Tracking System (BTS) and proposed our model based on the result of analysis. Also, we have shown the numerical example for evaluating the performance of our proposed model. Furthermore, we have extended our proposed model to the hazard-rate considering the imperfect debugging environment and showed numerical example for evaluating the possibility of application. As the result, we found out that performance of our proposed model is better than typical hazard-rate models. Also, we verified the possibility of application of proposed model to hazard-rate model considering imperfect debugging.

Software Reliability Growth Model for Imperfect Debugging Process Considering Testing-Effort and Testing Coverage

Because of the inevitable debugging lag,imperfect debugging process is used to replace perfect debugging process in the analysis of software reliability growth model.Considering neither testing-effort nor testing coverage can describe software reliability for imperfect debugging completely,by hybridizing testing-effort with testing coverage under imperfect debugging,this paper proposes a new model named GMW-LO-ID.Under the assumption that the number of faults is proportional to the current number of detected faults,this model combines generalized modified Weibull(GMW)testing-effort function with logistic(LO)testing coverage function,and inherits GMW's amazing flexibility and LO's high fitting precision.Furthermore,the fitting accuracy and predictive power are verified by two series of experiments and we can draw a conclusion that our model fits the actual failure data better and predicts the software future behavior better than other ten traditional models,which only consider one or two points of testing-effort,testing coverage and imperfect debugging.