A simple method is applied to calculating the optical path difference （OPD） of a plane parallel uniaxial plate with an arbitrary optical axis direction. Then, the theoretical expressions of the OPD and lateral displ...A simple method is applied to calculating the optical path difference （OPD） of a plane parallel uniaxial plate with an arbitrary optical axis direction. Then, the theoretical expressions of the OPD and lateral displacement （LD） of Savart polariscope under non-ideal conditions are obtained exactly. The variations of OPD and LD are simulated, and some important conclusions are obtained when the optical axis directions have an identical tolerance of ／pm 1^{{／circ}}. An application example is given that the tolerances of optical axis directions are gained according to the spectral resolution tolerances of the stationary polarization interference imaging spectrometer （SPIIS）. Several approximate formulae are obtained for explaining some conclusions above. The work provides a theoretical guidance for the optic design, crystal processing, installation and debugging, data analysis and spectral reconstruction of the SPIIS.展开更多
基金supported by the State Key Program of National Natural Science Foundation of China (Grant No. 40537031)the National Natural Science Foundation of China (Grant No. 40875013)+1 种基金the National Defense Basic Scientific Research Project, China (Grant No. A1420080187)the National High Technology Research and Development Program of China (Grant No. 2006AA12Z152)
文摘A simple method is applied to calculating the optical path difference （OPD） of a plane parallel uniaxial plate with an arbitrary optical axis direction. Then, the theoretical expressions of the OPD and lateral displacement （LD） of Savart polariscope under non-ideal conditions are obtained exactly. The variations of OPD and LD are simulated, and some important conclusions are obtained when the optical axis directions have an identical tolerance of ／pm 1^{{／circ}}. An application example is given that the tolerances of optical axis directions are gained according to the spectral resolution tolerances of the stationary polarization interference imaging spectrometer （SPIIS）. Several approximate formulae are obtained for explaining some conclusions above. The work provides a theoretical guidance for the optic design, crystal processing, installation and debugging, data analysis and spectral reconstruction of the SPIIS.
