The wetting property of （Sn-9Zn）-2Cu （wt pct） on Ni substrate and the evolution of interracial microstructure in （Sn-9Zn）-2Cu/Ni joints during soldering as well as isothermal aging were studied. The wetting abil...The wetting property of （Sn-9Zn）-2Cu （wt pct） on Ni substrate and the evolution of interracial microstructure in （Sn-9Zn）-2Cu/Ni joints during soldering as well as isothermal aging were studied. The wetting ability of eutectic Sn-gZn solder on Ni substrate was markedly improved by adding 2 wt pct Cu into this solder alloy. Plate-like Cu5Zn8 intermetallic compounds （IMCs） were detected in （Sn-9Zn）-2Cu solder matrix. A continuous NisZn21 IMC layer was formed at （Sn-9Zn）-2Cu/Ni interface after soldering. This IMC layer kept its type and integrality even after aging at 170℃ for up to 1000 h. At the early aging stage （before 500 h）, the IMC layer grew fast and its thickness followed a linear relationship with the square root of aging time. Thereafter, however, the thickness increased very slowly with longer aging time. When the joints were aged for 1000 h, a new IMC phase, （Cu,Ni）5Zn8, was found in the matrix near the interface. The formation of （Cu,Ni）5Zns phase can be attributed to the diffusion of Ni atoms into the solder matrix from the substrate.展开更多
The formation and growth behavior of intermetallic compound(IMC) layers after introducing an electroless Ni-W-P metallization into the Sn-3.0Ag-0.5Cu(SAC305) solder joint during soldering and aging were investigated. ...The formation and growth behavior of intermetallic compound(IMC) layers after introducing an electroless Ni-W-P metallization into the Sn-3.0Ag-0.5Cu(SAC305) solder joint during soldering and aging were investigated. The soldering was performed at 250 ℃ for 10 min, followed by air cooling and aging treatment at 150 ℃ up to 15 days. The results show that the scallop-like Cu_6Sn_5 IMC layer and planar-like Cu_3Sn formed between solder and Cu substrate during soldering and aging. The Ni_3P and(Ni,Cu)_3Sn_4 compounds were formed between electroless Ni-W-P layer and solder, and Cu substrate was not damaged and kept a smooth interface. When the isothermal aging treatment was applied, the total thickness of IMCs which formed at the SAC305/Cu and SAC305/Ni-W-P/Cu interface increased with increasing aging time. Kirkendall voids emerged at the Cu_3Sn and the Ni_3P layers, but the voids emerged at the Ni_3P layer in the form of crack. The amount of Kirkendall voids increased and the crack elongated with increasing aging time. The Cu_6Sn_5 and(Ni,Cu)_3Sn_4grains grew by merging adjacent grains. In the process of growth, the growing interfacial compounds filled the free space, and new columnar dendrite grain of(Ni,Cu)_3Sn_4 constantly generated during aging treatment. After 15 days aging, the Ni-W-P barrier layer was still remained, which indicated that the Ni-W-P layer can be a good barrier layer between the solder alloys and Cu substrate.展开更多
The metallurgical quality control of magnesium(Mg)and Mg alloys in melting process is required to ensure a satisfied mechanical and corrosion performance,while the typical used steel crucible introduces impurities and...The metallurgical quality control of magnesium(Mg)and Mg alloys in melting process is required to ensure a satisfied mechanical and corrosion performance,while the typical used steel crucible introduces impurities and interfacial interaction during melting process.Therefore,a systematic study about impurities diffusion and interfacial interaction between molten Mg and steel is necessary.In the present study,the interfacial reaction between molten AZ91D Mg alloy and mild steel during melting process was investigated with the melting temperatures of 700℃,750℃ and 800℃.The results show that Al(Fe,Mn)intermetallic layer is the intermetallic primarily formed at the interfaces of AZ91D melt and mild steel.Meanwhile,Al_(8)(Mn,Fe)5is indexed between Al(Fe,Mn)and AZ91D.AlFe_(3)C appears between the mild steel and Al(Fe,Mn)at 700℃ and 750℃,but absent at 800℃ due to the increased solubility of carbon in Mg matrix.It is found that the growth of the intermetallic layer is controlled by diffusion mechanism,and Al and Mn are the dominant diffusing species in the whole interfacial reaction process.By measuring the thickness of different layers,the growth constant was calculated.It increases from 1.89(±0.03)×10^(-12)m^(2)·s^(-1)at 700℃ to 3.05(±0.05)×10^(-12)m^(2)·s^(-1)at 750℃,and 5.18(±0.05)×10^(-12)m^(2)·s^(-1)at 800℃.Meanwhile,the content of Fe is linearly increased in AZ91D with the increase of holding time at 700℃ and 750℃,while it shows a significantly increment after holding for 8 h at 800℃,indicating holding temperature is more crucial to determine the Fe content of AZ91D than holding time.展开更多
The microstructure together with the formation and growth ofreaction phases in the interfacial diffusion zone of the explosive cladding TA2/A3 has been investigated by means of OM, SEM, AES and XRD techniques. When th...The microstructure together with the formation and growth ofreaction phases in the interfacial diffusion zone of the explosive cladding TA2/A3 has been investigated by means of OM, SEM, AES and XRD techniques. When the specimen annealed at temperature under the βTi→αTi transformation, i. e. below 1173 K, only TiC forms along TA2 side of interface and hinders the interdiffusion of Fe and Ti atoms, thus Fe2Ti or FeTi is unable to occur. While heated up to the transformation temperature of βTi, e. g, over 1223 K, the parabolic growth of intermetallic compounds of Fe2Ti and FeTi with layer structure may form intergranularly and the formation of βTi or βTi+αTi structure at the Fe enriched side of TA2 and the martensitic transformation products at the Fedepleted side are observed owing to the diffusion of Fe. Furthermore, the growth of βTi transformation layer is revealed to follow the parabolic rule.展开更多
The microstructural formation and properties of Sn-2.5Bi-xln-lZn-0.3Ag （in wt%） alloys and the evolution of soldered interfaces on a Cu substrate were investigated. Apart from the relatively low melting point （abou...The microstructural formation and properties of Sn-2.5Bi-xln-lZn-0.3Ag （in wt%） alloys and the evolution of soldered interfaces on a Cu substrate were investigated. Apart from the relatively low melting point （about 195C）, which is close to that of conventional eutectic Sn-Pb solder, the investigated solder presents superior wettability, solderability, and ductility. The refined equiaxial grains enhance the me- chanical properties, and the embedded bulk intermetallic compounds （IMCs） （Cu6Sn5 and CusZns） and granular Bi particles improve the joint reliability. The addition of In reduces the solubility of Zn in the 13-Sn matrix and strongly influences the separation and growth behaviors of the IMCs. The soldered interface of Sn-2.5Bi-xln-lZn-0.3Ag/Cu consists of Cu-Zn and Cu-Sn IMC layers.展开更多
A novel Sn-2.5Ag-2.0Ni alloy was used for soldering SiCp/Al composites substrate deposited with electroless Ni(5%P) (mass fraction)and Ni(10%P)(mass fraction)layers.It is observed that variation of P contents in the e...A novel Sn-2.5Ag-2.0Ni alloy was used for soldering SiCp/Al composites substrate deposited with electroless Ni(5%P) (mass fraction)and Ni(10%P)(mass fraction)layers.It is observed that variation of P contents in the electroless Ni(P)layer results in different types of microstructures of SnAgNi/Ni(P)solder joint.The morphology of Ni3Sn4 intermetallic compounds(IMCs)formed between the solder and Ni(10%P)layer is observed to be needle-like and this shape provides high speed diffusion channels for Ni to diffuse into solder that culminates in high growth rate of Ni3Sn4.The diffusion of Ni into solder furthermore results in the formation of Kirkendall voids at the interface of Ni(P)layer and SiCp/Al composites substrate.It is observed that solder reliability is degraded by the formation of Ni2SnP,P rich Ni layer and Kirkendall voids.The compact Ni3Sn4 IMC layer in Ni(5%P)solder joint prevents Ni element from diffusing into solder,resulting in a low growth rate of Ni3Sn4 layer.Meanwhile,the formation of Ni2SnP that significantly affects the reliability of solder joints is suppressed by the low P content Ni(5%P)layer.Thus,shear strength of Ni(5%P) solder joint is concluded to be higher than that of Ni(10%P)solder joint.Growth of Ni3Sn4 IMC layer and formation of crack are accounted to be the major sources of the failure of Ni(5%P)solder joint.展开更多
The effects of different Bi contents on the properties of Sn solders were studied. The interfacial reaction and growth behavior of intermetallic compounds（IMCs） layer（η-Cu6 Sn5 + e-Cu3 Sn） for various soldering t...The effects of different Bi contents on the properties of Sn solders were studied. The interfacial reaction and growth behavior of intermetallic compounds（IMCs） layer（η-Cu6 Sn5 + e-Cu3 Sn） for various soldering time and the influence of Bi addition on the thermal behavior of Sn-x Bi solder alloys were investigated. The Cu6 Sn5 IMC could be observed as long as the molten solder contacted with the Cu substrate. However, with the longer welding time such as 60 and 300 s, the Cu3 Sn IMC was formed at the interface between Cu6 Sn5 and Cu substrate. With the increase of soldering time, the thickness of total IMCs increased, meanwhile, the grain size of Cu6 Sn5 also increased. An appropriate amount of Bi element was beneficial for the growth of total IMCs,but excessive Bi（≥ 5 wt%） inhibited the growth of Cu6 Sn5 and Cu3 Sn IMC in Sn-x Bi/Cu microelectronic interconnects. Furthermore, with the Bi contents increasing（Sn-10 Bi solder in this present investigation）, some Bi particles accumulated at the interface between Cu6 Sn5 layer and the solder.展开更多
The formation and the growth of Cu-Sn intermetallic compound (IMC) layer at the interface between Sn-3.0Ag-0.5Cu-xCe solder and Cu substrate during soldering and aging were studied. The results show that Cu6Sn5 IMC is...The formation and the growth of Cu-Sn intermetallic compound (IMC) layer at the interface between Sn-3.0Ag-0.5Cu-xCe solder and Cu substrate during soldering and aging were studied. The results show that Cu6Sn5 IMC is observed at the interface between solder and Cu substrate in all conditions. After aging for 120 h,the Cu3Sn IMC is then obtained. With increasing aging time,the scalloped Cu6Sn5 structure changes to a plate structure. The Cu3Sn film always forms with a relatively planar interface. By adding a small amount of the rare earth element Ce (only 0.1%,mass fraction) into the Sn-3.0Ag-0.5Cu solder alloy,the growth rate of the Cu-Sn IMC at the interface of solder alloy system is decreased. When the time exponent is approximately 0.5,the growth of the IMC layer is mainly controlled by a diffusion over the studied time range.展开更多
The effects of Ca, Al, and Ag on the anti-oxidation of Sn-9Zn-X solders and the interface reactions between the solders and Cu substrate were investigated by Auger electron spectroscopy （ AES ） and scanning electron...The effects of Ca, Al, and Ag on the anti-oxidation of Sn-9Zn-X solders and the interface reactions between the solders and Cu substrate were investigated by Auger electron spectroscopy （ AES ） and scanning electron microscope （SEM） analysis, respectively. The mechanism of improving the wettability of Sn-9Zn lead-free solder by adding Ca, Al, and Ag was also revealed. The AES analysis indicated that Al and Ga might enrich on the molten solder surface which resulted in improving the anti-oxidation of Sn-9Zn-O. O05Al and Sn-9Zn-O. 3Ga alloys. The addition of Ga reduced the apparent activation energy and promoted the interface reaction. With the addition of 0. 3 wt. % Ag, some scallop-like intermetallic compounds （IMCs） formed at the interface, according to the energy dispersive spectroscopy （EDS） analysis, these scallop-like IMCs might be the mixture of Ag-Zn and Cu-Sn compounds.展开更多
The growth characteristic of intermetallics during the reaction of solid (Cu,Ag,Au,Fe,Co,Ni,etc) with liquid (Sn,Sb,Bi,Zn) within a very short time of 1～ 2 s at different temperatures has been studied by metallograph...The growth characteristic of intermetallics during the reaction of solid (Cu,Ag,Au,Fe,Co,Ni,etc) with liquid (Sn,Sb,Bi,Zn) within a very short time of 1～ 2 s at different temperatures has been studied by metallographic method for explaining the process in the fillet during soldering. It is indicated that the incongruent compourds often grow up as bamboo shoot form. But congruent compounds grow up basically just by spreading out as a layer along the solid border. Base on these facts,the influence of intermetallics in the fillet during soldering has been discussed.展开更多
电子封装技术中,微互连焊点在一定温度梯度下将发生金属原子的热迁移现象,显著影响界面金属间化合物的生长和基体金属的溶解行为.采用Cu/Sn/Cu焊点在250?C和280?C下进行等温时效和热台回流,对比研究了热迁移对液-固界面Cu6Sn5生长动力...电子封装技术中,微互连焊点在一定温度梯度下将发生金属原子的热迁移现象,显著影响界面金属间化合物的生长和基体金属的溶解行为.采用Cu/Sn/Cu焊点在250?C和280?C下进行等温时效和热台回流,对比研究了热迁移对液-固界面Cu6Sn5生长动力学的影响.等温时效条件下,界面Cu6Sn5生长服从抛物线规律,由体扩散控制.温度梯度作用下,焊点冷、热端界面Cu6Sn5表现出非对称性生长,冷端界面Cu6Sn5生长受到促进并服从直线规律,由反应控制,而热端界面Cu6Sn5生长受到抑制并服从抛物线规律,由晶界扩散控制.热端Cu基体溶解到液态Sn中的Cu原子在温度梯度作用下不断向冷端热迁移,为冷端界面Cu6Sn5的快速生长提供Cu原子通量.计算获得250?C和280?C下Cu原子在液态Sn中的摩尔传递热Q分别为14.11和14.44 k J/mol,热迁移驱动力F L分别为1.62×1019和1.70×1019N.展开更多
基金supported by the National Key Project of ScientificTechnical Supporting Programs during the 11th Five-year Plan (No. 2006BAE03B02-2)NSFC Key Program (No. U0734006)
文摘The wetting property of （Sn-9Zn）-2Cu （wt pct） on Ni substrate and the evolution of interracial microstructure in （Sn-9Zn）-2Cu/Ni joints during soldering as well as isothermal aging were studied. The wetting ability of eutectic Sn-gZn solder on Ni substrate was markedly improved by adding 2 wt pct Cu into this solder alloy. Plate-like Cu5Zn8 intermetallic compounds （IMCs） were detected in （Sn-9Zn）-2Cu solder matrix. A continuous NisZn21 IMC layer was formed at （Sn-9Zn）-2Cu/Ni interface after soldering. This IMC layer kept its type and integrality even after aging at 170℃ for up to 1000 h. At the early aging stage （before 500 h）, the IMC layer grew fast and its thickness followed a linear relationship with the square root of aging time. Thereafter, however, the thickness increased very slowly with longer aging time. When the joints were aged for 1000 h, a new IMC phase, （Cu,Ni）5Zn8, was found in the matrix near the interface. The formation of （Cu,Ni）5Zns phase can be attributed to the diffusion of Ni atoms into the solder matrix from the substrate.
基金Funded by National Natural Science Foundation of China(Nos.51465039,51665038)Natural Science Foundation of Jiangxi Province(Nos.20151BAB206041,20161BAB206122)the State Key Laboratory of Solidification Processing in NWPU(No.SKLSP201508)
文摘The formation and growth behavior of intermetallic compound(IMC) layers after introducing an electroless Ni-W-P metallization into the Sn-3.0Ag-0.5Cu(SAC305) solder joint during soldering and aging were investigated. The soldering was performed at 250 ℃ for 10 min, followed by air cooling and aging treatment at 150 ℃ up to 15 days. The results show that the scallop-like Cu_6Sn_5 IMC layer and planar-like Cu_3Sn formed between solder and Cu substrate during soldering and aging. The Ni_3P and(Ni,Cu)_3Sn_4 compounds were formed between electroless Ni-W-P layer and solder, and Cu substrate was not damaged and kept a smooth interface. When the isothermal aging treatment was applied, the total thickness of IMCs which formed at the SAC305/Cu and SAC305/Ni-W-P/Cu interface increased with increasing aging time. Kirkendall voids emerged at the Cu_3Sn and the Ni_3P layers, but the voids emerged at the Ni_3P layer in the form of crack. The amount of Kirkendall voids increased and the crack elongated with increasing aging time. The Cu_6Sn_5 and(Ni,Cu)_3Sn_4grains grew by merging adjacent grains. In the process of growth, the growing interfacial compounds filled the free space, and new columnar dendrite grain of(Ni,Cu)_3Sn_4 constantly generated during aging treatment. After 15 days aging, the Ni-W-P barrier layer was still remained, which indicated that the Ni-W-P layer can be a good barrier layer between the solder alloys and Cu substrate.
基金supported by the Natural Science Foundation of Chongqing,China(Grant Nos.cstc2020jcyj-msxm X0544,CSTB2022NSCQ-MSX0352,CSTB2022NSCQ-MSX0891,cstc2020jcyj-msxm X0184)Scientific and Technological Research Program of Chongqing Municipal Education Commission(Grant No.KJQN202001416)National Natural Science Foundation of China(Grant Nos.11847077,52001028)。
文摘The metallurgical quality control of magnesium(Mg)and Mg alloys in melting process is required to ensure a satisfied mechanical and corrosion performance,while the typical used steel crucible introduces impurities and interfacial interaction during melting process.Therefore,a systematic study about impurities diffusion and interfacial interaction between molten Mg and steel is necessary.In the present study,the interfacial reaction between molten AZ91D Mg alloy and mild steel during melting process was investigated with the melting temperatures of 700℃,750℃ and 800℃.The results show that Al(Fe,Mn)intermetallic layer is the intermetallic primarily formed at the interfaces of AZ91D melt and mild steel.Meanwhile,Al_(8)(Mn,Fe)5is indexed between Al(Fe,Mn)and AZ91D.AlFe_(3)C appears between the mild steel and Al(Fe,Mn)at 700℃ and 750℃,but absent at 800℃ due to the increased solubility of carbon in Mg matrix.It is found that the growth of the intermetallic layer is controlled by diffusion mechanism,and Al and Mn are the dominant diffusing species in the whole interfacial reaction process.By measuring the thickness of different layers,the growth constant was calculated.It increases from 1.89(±0.03)×10^(-12)m^(2)·s^(-1)at 700℃ to 3.05(±0.05)×10^(-12)m^(2)·s^(-1)at 750℃,and 5.18(±0.05)×10^(-12)m^(2)·s^(-1)at 800℃.Meanwhile,the content of Fe is linearly increased in AZ91D with the increase of holding time at 700℃ and 750℃,while it shows a significantly increment after holding for 8 h at 800℃,indicating holding temperature is more crucial to determine the Fe content of AZ91D than holding time.
基金the+6 种基金Non-ferrousMetal Industry Corperation of China
文摘The microstructure together with the formation and growth ofreaction phases in the interfacial diffusion zone of the explosive cladding TA2/A3 has been investigated by means of OM, SEM, AES and XRD techniques. When the specimen annealed at temperature under the βTi→αTi transformation, i. e. below 1173 K, only TiC forms along TA2 side of interface and hinders the interdiffusion of Fe and Ti atoms, thus Fe2Ti or FeTi is unable to occur. While heated up to the transformation temperature of βTi, e. g, over 1223 K, the parabolic growth of intermetallic compounds of Fe2Ti and FeTi with layer structure may form intergranularly and the formation of βTi or βTi+αTi structure at the Fe enriched side of TA2 and the martensitic transformation products at the Fedepleted side are observed owing to the diffusion of Fe. Furthermore, the growth of βTi transformation layer is revealed to follow the parabolic rule.
基金the National Natural Science Foundation of China(No.51077099)Shang hai Baosteel Group Co.(No.50834011)
文摘The microstructural formation and properties of Sn-2.5Bi-xln-lZn-0.3Ag （in wt%） alloys and the evolution of soldered interfaces on a Cu substrate were investigated. Apart from the relatively low melting point （about 195C）, which is close to that of conventional eutectic Sn-Pb solder, the investigated solder presents superior wettability, solderability, and ductility. The refined equiaxial grains enhance the me- chanical properties, and the embedded bulk intermetallic compounds （IMCs） （Cu6Sn5 and CusZns） and granular Bi particles improve the joint reliability. The addition of In reduces the solubility of Zn in the 13-Sn matrix and strongly influences the separation and growth behaviors of the IMCs. The soldered interface of Sn-2.5Bi-xln-lZn-0.3Ag/Cu consists of Cu-Zn and Cu-Sn IMC layers.
基金Projects(50274014, 50774005) supported by the National Natural Science Foundation of ChinaProject(2006CB605207) supported by the National Basic Research Program of China+1 种基金Project(2006AA03Z557) supported by the National High-tech Research and Development of ChinaProject(I2P407) supported by MOE Program for Changjiang Scholars
文摘A novel Sn-2.5Ag-2.0Ni alloy was used for soldering SiCp/Al composites substrate deposited with electroless Ni(5%P) (mass fraction)and Ni(10%P)(mass fraction)layers.It is observed that variation of P contents in the electroless Ni(P)layer results in different types of microstructures of SnAgNi/Ni(P)solder joint.The morphology of Ni3Sn4 intermetallic compounds(IMCs)formed between the solder and Ni(10%P)layer is observed to be needle-like and this shape provides high speed diffusion channels for Ni to diffuse into solder that culminates in high growth rate of Ni3Sn4.The diffusion of Ni into solder furthermore results in the formation of Kirkendall voids at the interface of Ni(P)layer and SiCp/Al composites substrate.It is observed that solder reliability is degraded by the formation of Ni2SnP,P rich Ni layer and Kirkendall voids.The compact Ni3Sn4 IMC layer in Ni(5%P)solder joint prevents Ni element from diffusing into solder,resulting in a low growth rate of Ni3Sn4 layer.Meanwhile,the formation of Ni2SnP that significantly affects the reliability of solder joints is suppressed by the low P content Ni(5%P)layer.Thus,shear strength of Ni(5%P) solder joint is concluded to be higher than that of Ni(10%P)solder joint.Growth of Ni3Sn4 IMC layer and formation of crack are accounted to be the major sources of the failure of Ni(5%P)solder joint.
基金Funded by the National Natural Science Foundation of China(No.51465039)Natural Science Foundation of Jiangxi Province(No.20151BAB206041,20161BAB206122)Fund of the State Key Laboratory of Solidification Processing in NWPU(No.SKLSP201508)
文摘The effects of different Bi contents on the properties of Sn solders were studied. The interfacial reaction and growth behavior of intermetallic compounds（IMCs） layer（η-Cu6 Sn5 + e-Cu3 Sn） for various soldering time and the influence of Bi addition on the thermal behavior of Sn-x Bi solder alloys were investigated. The Cu6 Sn5 IMC could be observed as long as the molten solder contacted with the Cu substrate. However, with the longer welding time such as 60 and 300 s, the Cu3 Sn IMC was formed at the interface between Cu6 Sn5 and Cu substrate. With the increase of soldering time, the thickness of total IMCs increased, meanwhile, the grain size of Cu6 Sn5 also increased. An appropriate amount of Bi element was beneficial for the growth of total IMCs,but excessive Bi（≥ 5 wt%） inhibited the growth of Cu6 Sn5 and Cu3 Sn IMC in Sn-x Bi/Cu microelectronic interconnects. Furthermore, with the Bi contents increasing（Sn-10 Bi solder in this present investigation）, some Bi particles accumulated at the interface between Cu6 Sn5 layer and the solder.
基金Project(06GK2002) supported by the Major Project of Hunan Provincial Science and Technology Development Strategy
文摘The formation and the growth of Cu-Sn intermetallic compound (IMC) layer at the interface between Sn-3.0Ag-0.5Cu-xCe solder and Cu substrate during soldering and aging were studied. The results show that Cu6Sn5 IMC is observed at the interface between solder and Cu substrate in all conditions. After aging for 120 h,the Cu3Sn IMC is then obtained. With increasing aging time,the scalloped Cu6Sn5 structure changes to a plate structure. The Cu3Sn film always forms with a relatively planar interface. By adding a small amount of the rare earth element Ce (only 0.1%,mass fraction) into the Sn-3.0Ag-0.5Cu solder alloy,the growth rate of the Cu-Sn IMC at the interface of solder alloy system is decreased. When the time exponent is approximately 0.5,the growth of the IMC layer is mainly controlled by a diffusion over the studied time range.
文摘The effects of Ca, Al, and Ag on the anti-oxidation of Sn-9Zn-X solders and the interface reactions between the solders and Cu substrate were investigated by Auger electron spectroscopy （ AES ） and scanning electron microscope （SEM） analysis, respectively. The mechanism of improving the wettability of Sn-9Zn lead-free solder by adding Ca, Al, and Ag was also revealed. The AES analysis indicated that Al and Ga might enrich on the molten solder surface which resulted in improving the anti-oxidation of Sn-9Zn-O. O05Al and Sn-9Zn-O. 3Ga alloys. The addition of Ga reduced the apparent activation energy and promoted the interface reaction. With the addition of 0. 3 wt. % Ag, some scallop-like intermetallic compounds （IMCs） formed at the interface, according to the energy dispersive spectroscopy （EDS） analysis, these scallop-like IMCs might be the mixture of Ag-Zn and Cu-Sn compounds.
基金supported by the National Natural Science Foundation of China(Nos.U1738101,51974022)Fundamental Research Funds for the Central Universities,China(No.FRF-MP-20-17)。
文摘The growth characteristic of intermetallics during the reaction of solid (Cu,Ag,Au,Fe,Co,Ni,etc) with liquid (Sn,Sb,Bi,Zn) within a very short time of 1～ 2 s at different temperatures has been studied by metallographic method for explaining the process in the fillet during soldering. It is indicated that the incongruent compourds often grow up as bamboo shoot form. But congruent compounds grow up basically just by spreading out as a layer along the solid border. Base on these facts,the influence of intermetallics in the fillet during soldering has been discussed.
文摘电子封装技术中,微互连焊点在一定温度梯度下将发生金属原子的热迁移现象,显著影响界面金属间化合物的生长和基体金属的溶解行为.采用Cu/Sn/Cu焊点在250?C和280?C下进行等温时效和热台回流,对比研究了热迁移对液-固界面Cu6Sn5生长动力学的影响.等温时效条件下,界面Cu6Sn5生长服从抛物线规律,由体扩散控制.温度梯度作用下,焊点冷、热端界面Cu6Sn5表现出非对称性生长,冷端界面Cu6Sn5生长受到促进并服从直线规律,由反应控制,而热端界面Cu6Sn5生长受到抑制并服从抛物线规律,由晶界扩散控制.热端Cu基体溶解到液态Sn中的Cu原子在温度梯度作用下不断向冷端热迁移,为冷端界面Cu6Sn5的快速生长提供Cu原子通量.计算获得250?C和280?C下Cu原子在液态Sn中的摩尔传递热Q分别为14.11和14.44 k J/mol,热迁移驱动力F L分别为1.62×1019和1.70×1019N.
