From a limit model in electric field obtained by letting the frequency vanish in the time-harmonic Maxwell equations, we consider a limit perturbation model in the tangential boundary trace of the curl of the electric...From a limit model in electric field obtained by letting the frequency vanish in the time-harmonic Maxwell equations, we consider a limit perturbation model in the tangential boundary trace of the curl of the electric field for localizing numerically certain small electromagnetic inhomogeneities, in a three-dimensional bounded domain. We introduce here two localization procedures resulting from the combination of this limit perturbation model with each of the following inversion processes： the Current Projection method and an Inverse Fourier method. Each localization procedure uses, as data, a finite number of boundary measurements, and is employed in the single inhomogeneity case; only the one based on an Inverse Fourier method is required in the multiple inhomogeneities case. Our localization approach is numerically suitable for the context of inhomogeneities that are not purely electric. We compare the numerical results obtained from the two localization procedures in the single inhomogeneity configuration, and describe, in various settings of multiple inhomogeneities, the results provided by the procedure based on an Inverse Fourier method.展开更多
We are concerned, in a static regime, with a three-dimensional bounded domain of certain an imaging approach of the locations in electromagnetic imperfections. This approach is related to Electrical Impedance Tomograp...We are concerned, in a static regime, with a three-dimensional bounded domain of certain an imaging approach of the locations in electromagnetic imperfections. This approach is related to Electrical Impedance Tomography and makes use of a new perturbation formula in the electric fields. We present two localization procedures, from a Current Pro- jection method that deals with the single imperfection context and an inverse Fourier process that is devoted to multiple imperfections configurations. These procedures extend those that were described in our previous work, since operating for a broader class of settings. Namely, the localization is additionally performed for certain purely electric imperfections, as established from numerical simulations.展开更多
基金supported by ACI NIM(171)from the French Ministry of Education and Scientific Research
文摘From a limit model in electric field obtained by letting the frequency vanish in the time-harmonic Maxwell equations, we consider a limit perturbation model in the tangential boundary trace of the curl of the electric field for localizing numerically certain small electromagnetic inhomogeneities, in a three-dimensional bounded domain. We introduce here two localization procedures resulting from the combination of this limit perturbation model with each of the following inversion processes： the Current Projection method and an Inverse Fourier method. Each localization procedure uses, as data, a finite number of boundary measurements, and is employed in the single inhomogeneity case; only the one based on an Inverse Fourier method is required in the multiple inhomogeneities case. Our localization approach is numerically suitable for the context of inhomogeneities that are not purely electric. We compare the numerical results obtained from the two localization procedures in the single inhomogeneity configuration, and describe, in various settings of multiple inhomogeneities, the results provided by the procedure based on an Inverse Fourier method.
文摘We are concerned, in a static regime, with a three-dimensional bounded domain of certain an imaging approach of the locations in electromagnetic imperfections. This approach is related to Electrical Impedance Tomography and makes use of a new perturbation formula in the electric fields. We present two localization procedures, from a Current Pro- jection method that deals with the single imperfection context and an inverse Fourier process that is devoted to multiple imperfections configurations. These procedures extend those that were described in our previous work, since operating for a broader class of settings. Namely, the localization is additionally performed for certain purely electric imperfections, as established from numerical simulations.
