采用组合靶,利用射频磁控溅射在260℃的(111)Si片上面制备了不同Ni、La含量比的La Ni O薄膜。测试分析结果表明,在La含量较高时,薄膜为无定型结构,并且具有较大的电阻率。当Ni和La含量比>1∶1.44后,薄膜具有(100)择优取向的赝立方... 采用组合靶,利用射频磁控溅射在260℃的(111)Si片上面制备了不同Ni、La含量比的La Ni O薄膜。测试分析结果表明,在La含量较高时,薄膜为无定型结构,并且具有较大的电阻率。当Ni和La含量比>1∶1.44后,薄膜具有(100)择优取向的赝立方钙钛矿结构,同时具有金属导电特性。随着La过量的减少,晶面间距和面电阻都减小的很快,在Ni和La比例达到1∶1时,电阻率达到了最小值6.4Ω·μm,晶面间距也达到最小值0.389nm。随着Ni过量的增加,晶面间距和面电阻又逐步增大。在Ni过量较多时导致了NiO相和LNO(110)取向的出现。在晶面间距相同时,相对于La,Ni含量的过剩对薄膜导电性能具有较大的影响。文中对实验现象从LaNiO3薄膜的导电机理出发给出了比较合理的解释。展开更多
Ceramic LaNiO3 samples were prepared by solid state reaction method at different sintering temperatures. It was found that the resultant was not ABO3 perovskite single phase but dual phase La2NiO4 and NiO, and the per...Ceramic LaNiO3 samples were prepared by solid state reaction method at different sintering temperatures. It was found that the resultant was not ABO3 perovskite single phase but dual phase La2NiO4 and NiO, and the percentage of the two phases varied with sintering temperature. Ceramics sintered at 1400 ℃ were well crystallized and the phase ratio of La2NiO4 was the maximum. The surface morphology observed by scanning electron microscopy (SEM) indicated that the grains of the ceramics sintered at 1400 ℃ were uniform and compact, which were in agreement with the properties of high density and low electrical resistivity of the samples. X-ray diffraction (XRD) patterns of ceramics before and after arc erosion indicated their high structural stability, which resulted in the good arc erosion resistance properties for silver-based electrical contact materials. The contact materials prepared with the ceramic sintered at 1400 ℃ exhibited better mass transition and arc erosion resisting properties.展开更多
系统研究了空气氛中900℃下La Ca Ni O准三元氧化物体系的相关系,给出了该温度截面上整个体系的相区分布。该体系中存在La2-xCaxNiO4(0≤x≤0.37)固溶区,固溶区内所有的样品均为四方晶胞,晶胞体积和相应的晶胞参数都随样品中Ca含量的增...系统研究了空气氛中900℃下La Ca Ni O准三元氧化物体系的相关系,给出了该温度截面上整个体系的相区分布。该体系中存在La2-xCaxNiO4(0≤x≤0.37)固溶区,固溶区内所有的样品均为四方晶胞,晶胞体积和相应的晶胞参数都随样品中Ca含量的增加而连续减小。在该温度截面上没有其他新物相生成,对以往文献报道的"La2CaOx"结构和组成进行了表征,证明该化合物并非是La Ca O二元体系中的化合物,而很可能是相应的碱式碳酸盐。展开更多
文摘 采用组合靶,利用射频磁控溅射在260℃的(111)Si片上面制备了不同Ni、La含量比的La Ni O薄膜。测试分析结果表明,在La含量较高时,薄膜为无定型结构,并且具有较大的电阻率。当Ni和La含量比>1∶1.44后,薄膜具有(100)择优取向的赝立方钙钛矿结构,同时具有金属导电特性。随着La过量的减少,晶面间距和面电阻都减小的很快,在Ni和La比例达到1∶1时,电阻率达到了最小值6.4Ω·μm,晶面间距也达到最小值0.389nm。随着Ni过量的增加,晶面间距和面电阻又逐步增大。在Ni过量较多时导致了NiO相和LNO(110)取向的出现。在晶面间距相同时,相对于La,Ni含量的过剩对薄膜导电性能具有较大的影响。文中对实验现象从LaNiO3薄膜的导电机理出发给出了比较合理的解释。
基金supported by the National Basic Research Program of China (2007CB607504)HI-TECH Research and Development Program of China (2001AA327150)
文摘Ceramic LaNiO3 samples were prepared by solid state reaction method at different sintering temperatures. It was found that the resultant was not ABO3 perovskite single phase but dual phase La2NiO4 and NiO, and the percentage of the two phases varied with sintering temperature. Ceramics sintered at 1400 ℃ were well crystallized and the phase ratio of La2NiO4 was the maximum. The surface morphology observed by scanning electron microscopy (SEM) indicated that the grains of the ceramics sintered at 1400 ℃ were uniform and compact, which were in agreement with the properties of high density and low electrical resistivity of the samples. X-ray diffraction (XRD) patterns of ceramics before and after arc erosion indicated their high structural stability, which resulted in the good arc erosion resistance properties for silver-based electrical contact materials. The contact materials prepared with the ceramic sintered at 1400 ℃ exhibited better mass transition and arc erosion resisting properties.
文摘系统研究了空气氛中900℃下La Ca Ni O准三元氧化物体系的相关系,给出了该温度截面上整个体系的相区分布。该体系中存在La2-xCaxNiO4(0≤x≤0.37)固溶区,固溶区内所有的样品均为四方晶胞,晶胞体积和相应的晶胞参数都随样品中Ca含量的增加而连续减小。在该温度截面上没有其他新物相生成,对以往文献报道的"La2CaOx"结构和组成进行了表征,证明该化合物并非是La Ca O二元体系中的化合物,而很可能是相应的碱式碳酸盐。