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LaNiO_3纳米陶瓷薄膜氧敏特性的研究 被引量:7
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作者 侯峰 阴育新 徐廷献 《天津大学学报(自然科学与工程技术版)》 EI CAS CSCD 2000年第6期693-696,共4页
以 L a(NO3) 3· 6 H2 O和 Ni(NO3) 2 · 6 H2 O为原料 ,采用柠檬酸为螯合剂 ,利用溶胶 -凝胶法合成了钙钛矿型稀土复合氧化物 L a Ni O3纳米陶瓷薄膜 。
关键词 lanio3薄膜 SOL-GEL法 氧敏特性 纳米陶瓷薄膜
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Ferroelectric properties of Bi_4Zr_(0.5)Ti_(2.5)O_(12) thin films prepared on LaNiO_3 bottom electrode by sol-gel method
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作者 GUO DongYun1, LI MeiYa1, LIU Jun1, PEI Ling1, YU BenFang1, ZHAO XingZhong1, YANG Bin2, WANG YunBo2 & YU Jun2 1 Department of Physics, Wuhan University, Wuhan 430072, China 2 Department of Electronic Science and Technology, Huazhong University of Science and Technology, Wuhan 430074, China 《Science China(Technological Sciences)》 SCIE EI CAS 2007年第4期472-477,共6页
The Bi4Zr0.5Ti2.5O12 (BZT) thin films were fabricated on the LaNiO3 bottom electrode using sol-gel method. The structure and morphology of the films were character-ized using X-ray diffraction, AFM and SEM. The result... The Bi4Zr0.5Ti2.5O12 (BZT) thin films were fabricated on the LaNiO3 bottom electrode using sol-gel method. The structure and morphology of the films were character-ized using X-ray diffraction, AFM and SEM. The results show that the films have a perovskite phase and dense microstructure. The 2Pr and 2Vc of the Pt/BZT/LaNiO3 capacitor are 28.2 μC/cm2 and 14.7 V respectively at an applied voltage of 25 V. After the switching of 1×1010 cycles, the Pr value decreases to 87% of its pre-fatigue val-ues. The dielectric constant (ε) and the dissipation factor (tanδ) of the BZT thin films are about 204 and 0.029 at 1 kHz, respectively. The films show good insulating behavior according to the test of leakage current. The clockwise C-V hysteresis curve observed shows that the Pt/BZT/LaNiO3 structure has a memory effect be-cause of the BZT film’s ferroelectric polarization. 展开更多
关键词 Bi_4Zr_(0.5)Ti_(2.5)O_(12) thin film sol-gel method lanio_3 bottom electrode ferroelectric properties
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