The objective of this paper is to study the issue of uniformity on asymmetrical designs with two and three mixed levels in terms of Lee discrepancy. Based on the known formulation, we present a new lower bound of Lee ...The objective of this paper is to study the issue of uniformity on asymmetrical designs with two and three mixed levels in terms of Lee discrepancy. Based on the known formulation, we present a new lower bound of Lee discrepancy of fractional factorial designs with two and three mixed levels. Our new lower bound is sharper and more valid than other existing lower bounds in literature, which is a useful complement to the lower bound theory of discrepancies.展开更多
Doubling is a simple but powerful method of constructing two-level tractional factorial designs with high resolution. This article studies uniformity in terms of Lee discrepancy of double designs. We give some linkage...Doubling is a simple but powerful method of constructing two-level tractional factorial designs with high resolution. This article studies uniformity in terms of Lee discrepancy of double designs. We give some linkages between the uniformity of double design and the aberration case of the original one under different criteria. Furthermore, some analytic linkages between the generalized wordlength pattern of double design and that of the original one are firstly provided here, which extend the existing findings. The lower bound of Lee discrepancy for double designs is also given.展开更多
Lee discrepancy has been employed to measure the uniformity of fractional factorials.In this paper,we further study the statistical justification of Lee discrepancy on asymmetrical factorials.We will give an expressio...Lee discrepancy has been employed to measure the uniformity of fractional factorials.In this paper,we further study the statistical justification of Lee discrepancy on asymmetrical factorials.We will give an expression of the Lee discrepancy of asymmetrical factorials with two-and three-levels in terms of quadric form,present a connection between Lee discrepancy,orthogonality and minimum moment aberration,and obtain a lower bound of Lee discrepancy of asymmetrical factorials with two-and three-levels.展开更多
The objective of this paper is to discuss the issue of the projection uniformity of asymmetric fractional factorials.On the basis of Lee discrepancy,the authors define the projection Lee discrepancy to measure the uni...The objective of this paper is to discuss the issue of the projection uniformity of asymmetric fractional factorials.On the basis of Lee discrepancy,the authors define the projection Lee discrepancy to measure the uniformity for low-dimensional projection designs.Moreover,the concepts of uniformity pattern and minimum projection uniformity criterion are proposed,which can be used to assess and compare two and three mixed levels factorials.Statistical justification of uniformity pattern is also investigated.展开更多
基金supported by the National Natural Science Foundation of China(11301546).supported by the National Natural Science Foundation of China(11271147,11471136)
文摘The objective of this paper is to study the issue of uniformity on asymmetrical designs with two and three mixed levels in terms of Lee discrepancy. Based on the known formulation, we present a new lower bound of Lee discrepancy of fractional factorial designs with two and three mixed levels. Our new lower bound is sharper and more valid than other existing lower bounds in literature, which is a useful complement to the lower bound theory of discrepancies.
基金supported by NSFC(11271147,11301546,and 11401596)supported by NSFC(11271147 and 11471136)the Financially supported by self-determined research funds of CCNU from the colleges basic research and operation of MOE(CCNU16A02012)
文摘Doubling is a simple but powerful method of constructing two-level tractional factorial designs with high resolution. This article studies uniformity in terms of Lee discrepancy of double designs. We give some linkages between the uniformity of double design and the aberration case of the original one under different criteria. Furthermore, some analytic linkages between the generalized wordlength pattern of double design and that of the original one are firstly provided here, which extend the existing findings. The lower bound of Lee discrepancy for double designs is also given.
基金supported by Research Fund for the Doctoral Program of Higher Education of China (RFDP) (Grant No. 20090144110002)
文摘Lee discrepancy has been employed to measure the uniformity of fractional factorials.In this paper,we further study the statistical justification of Lee discrepancy on asymmetrical factorials.We will give an expression of the Lee discrepancy of asymmetrical factorials with two-and three-levels in terms of quadric form,present a connection between Lee discrepancy,orthogonality and minimum moment aberration,and obtain a lower bound of Lee discrepancy of asymmetrical factorials with two-and three-levels.
基金supported by the National Natural Science Foundations of China under Grant Nos.11271147 and 11401596
文摘The objective of this paper is to discuss the issue of the projection uniformity of asymmetric fractional factorials.On the basis of Lee discrepancy,the authors define the projection Lee discrepancy to measure the uniformity for low-dimensional projection designs.Moreover,the concepts of uniformity pattern and minimum projection uniformity criterion are proposed,which can be used to assess and compare two and three mixed levels factorials.Statistical justification of uniformity pattern is also investigated.
