A test pattern generator （TPG） which can highly reduce the peak power consumption during built-in self-test （BIST） application is proposed. The proposed TPG, called LPpe-TPG, consists of a linear feedback shift re...A test pattern generator （TPG） which can highly reduce the peak power consumption during built-in self-test （BIST） application is proposed. The proposed TPG, called LPpe-TPG, consists of a linear feedback shift register （LFSR） and some control circuits. A procedure is presented firstly to make compare vectors between pseudorandom test patterns by adding some circuits to the original LFSR and secondly to insert some vectors between two successive pseudorandom test patterns according to the ordinal selection of every two bits of the compare vector. Then the changes between any successive test patterns of the test set generated by the LPpe-TPG are not more than twice. This leads to a decrease of the weighted switching activity （WSA） of the circuit under test （CUT） and therefore a reduction of the power consumption. Experimental results based on some ISCAS＇ 85 benchmark circuits show that the peak power consumption has been reduced by 25.25% to 64.46%. Also, the effectiveness of our approach to reduce the total and average power consumption is kept, without losing stuck-at fault coverage.展开更多
Noise and mismatch are important error sources in pipeline ADCs,so careful calculation and system simulation are carried out using Matlab software. To reduce power consumption while not lose performance, the amplifier...Noise and mismatch are important error sources in pipeline ADCs,so careful calculation and system simulation are carried out using Matlab software. To reduce power consumption while not lose performance, the amplifiers with the same structure are biased with one bias circuit, and a cascode compensation is adopted. A 10bit 50MS/s pipeline ADC, which can be used in CMOS image sensor systems with large pixel array,is designed and tested by using 0.35tzm 4M-2P CMOS process. According to test results, power consumption is only 42mW and SINAD is 45.69dB when sampling frequency is 50MHz. A balance between performance and power consumption is achieved.展开更多
文摘A test pattern generator （TPG） which can highly reduce the peak power consumption during built-in self-test （BIST） application is proposed. The proposed TPG, called LPpe-TPG, consists of a linear feedback shift register （LFSR） and some control circuits. A procedure is presented firstly to make compare vectors between pseudorandom test patterns by adding some circuits to the original LFSR and secondly to insert some vectors between two successive pseudorandom test patterns according to the ordinal selection of every two bits of the compare vector. Then the changes between any successive test patterns of the test set generated by the LPpe-TPG are not more than twice. This leads to a decrease of the weighted switching activity （WSA） of the circuit under test （CUT） and therefore a reduction of the power consumption. Experimental results based on some ISCAS＇ 85 benchmark circuits show that the peak power consumption has been reduced by 25.25% to 64.46%. Also, the effectiveness of our approach to reduce the total and average power consumption is kept, without losing stuck-at fault coverage.
文摘Noise and mismatch are important error sources in pipeline ADCs,so careful calculation and system simulation are carried out using Matlab software. To reduce power consumption while not lose performance, the amplifiers with the same structure are biased with one bias circuit, and a cascode compensation is adopted. A 10bit 50MS/s pipeline ADC, which can be used in CMOS image sensor systems with large pixel array,is designed and tested by using 0.35tzm 4M-2P CMOS process. According to test results, power consumption is only 42mW and SINAD is 45.69dB when sampling frequency is 50MHz. A balance between performance and power consumption is achieved.
