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Low temperature Sn-rich Au–Sn wafer-level bonding
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作者 方志强 毛旭 +1 位作者 杨晋玲 杨富华 《Journal of Semiconductors》 EI CAS CSCD 2013年第10期161-164,共4页
Sn-rich Au-Sn solder bonding has been systematically investigated for low cost and low temperature wafer-level packaging of high-end MEMS devices. The AuSn2 phase with the highest Vickers-hardness among the four stabl... Sn-rich Au-Sn solder bonding has been systematically investigated for low cost and low temperature wafer-level packaging of high-end MEMS devices. The AuSn2 phase with the highest Vickers-hardness among the four stable intermetallic compounds of the Au-Sn system makes a major contribution to the high bonding shear strength. The maximum shear strength of 64 MPa and a leak rate lower than 4.9×10^-7 atm.cc/s have been obtained for Au46Sn54 solder bonded at 310 ℃. This wafer-level low cost bonding technique with high bonding strength can be applied to MEMS devices requiring low temperature packaging. 展开更多
关键词 mems packaging Au-Sn solder Sn-rich bonding strength
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