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High-temperature characteristics of SiC module and 100 kW SiC AC–DC converter at a junction temperature of 180 ℃
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作者 Juanjuan Lu Zhe Zhou +3 位作者 Jianhong Hao Yi Hao Hao Zhang Ruixiang Hao 《Global Energy Interconnection》 2019年第6期522-531,共10页
High-temperature,high-power converters have gained importance in industrial applications given their ability to operate in adverse environments,such as in petroleum exploration,multi-electric aircrafts,and electric ve... High-temperature,high-power converters have gained importance in industrial applications given their ability to operate in adverse environments,such as in petroleum exploration,multi-electric aircrafts,and electric vehicles.SiC metaloxide-semiconductor field-effect transistor(MOSFET),a new,wide bandgap,high-temperature device,is the key component of these converters.In this study,the static and dynamic characteristics of the SiC MOSFET,half-bridge module,are investigated at the junction temperature of 180℃.A simplified experimental method is then proposed pertaining to the power operation of the SiC module at 180℃.This method is based on the use of a thermal resistance test platform and is proven convenient for the study of heat dissipation characteristics.The high-temperature characteristics of the module are verified based on the conducted experiments.Accordingly,a 100 kW high-temperature converter is built,and the test results show that the SiC converter can operate at a junction temperature of 180℃in a stable manner in compliance with the requirements of high-temperature,high-power applications. 展开更多
关键词 SiC mosfet module Static and dynamic characteristics Power operation experimental method Heat dissipation characteristics SiC AC-DC converter
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Low on-resistance high-voltage lateral double-diffused metal oxide semiconductor with a buried improved super-junction layer 被引量:1
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作者 伍伟 张波 +2 位作者 罗小蓉 方健 李肇基 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第3期625-629,共5页
A novel low specific on-resistance (Ron,sp) lateral double-diffused metal oxide semiconductor (LDMOS) with a buried improved super-junction (BISJ) layer is proposed. A super-junction layer is buried in the drift... A novel low specific on-resistance (Ron,sp) lateral double-diffused metal oxide semiconductor (LDMOS) with a buried improved super-junction (BISJ) layer is proposed. A super-junction layer is buried in the drift region and the P pillar is split into two parts with different doping concentrations. Firstly, the buried super-junction layer causes the multiple-direction assisted depletion effect. The drift region doping concentration of the BISJ LDMOS is therefore much higher than that of the conventional LDMOS. Secondly, the buried super-junction layer provides a bulk low on-resistance path. Both of them reduce Ron,sp greatly. Thirdly, the electric field modulation effect of the new electric field peak introduced by the step doped P pillar improves the breakdown voltage (BV). The BISJ LDMOS exhibits a BV of 300 V and Ron,sp of 8.08 mΩ·cm2 which increases BV by 35% and reduces Ron,sp by 60% compared with those of a conventional LDMOS with a drift length of 15 μm, respectively. 展开更多
关键词 multiple-direction assisted depletion effect breakdown voltage (BV) electric field modulation lateral double-diffusion mosfet (LDMOS)
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