The 1-Mb and 4-Mb commercial toggle magnetoresistive random-access memories（MRAMs） with 0.13 μm and 0.18-μm complementary metal–oxide–semiconductor（CMOS） process respectively and different magnetic tunneling j...The 1-Mb and 4-Mb commercial toggle magnetoresistive random-access memories（MRAMs） with 0.13 μm and 0.18-μm complementary metal–oxide–semiconductor（CMOS） process respectively and different magnetic tunneling junctions（MTJs） are irradiated with a Cobalt-60 gamma source. The electrical functions of devices during the irradiation and the room temperature annealing behavior are measured. Electrical failures are observed until the dose accumulates to 120-krad（Si） in 4-Mb MRAM while the 1-Mb MRAM keeps normal. Thus, the 0.13-μm process circuit exhibits better radiation tolerance than the 0.18-μm process circuit. However, a small quantity of read bit-errors randomly occurs only in 1-Mb MRAM during the irradiation while their electrical function is normal. It indicates that the store states of MTJ may be influenced by gamma radiation, although the electrical transport and magnetic properties are inherently immune to the radiation. We propose that the magnetic Compton scattering in the interaction of gamma ray with magnetic free layer may be the origin of the read bit-errors. Our results are useful for MRAM toward space application.展开更多
本文针对3D堆叠磁随机存储器(Magnetic Random Access Memory,MRAM)的热学分析问题,在有限元法和热阻网络法的基础上,提出了一种局部等效法,可高精度并且快速地分析3D堆叠MRAM的热学分布.与有限元法相比,该方法使用直观方便,克服了有限...本文针对3D堆叠磁随机存储器(Magnetic Random Access Memory,MRAM)的热学分析问题,在有限元法和热阻网络法的基础上,提出了一种局部等效法,可高精度并且快速地分析3D堆叠MRAM的热学分布.与有限元法相比,该方法使用直观方便,克服了有限元法建模与求解复杂耗时的问题;与热阻网络法相比,局部等效法具有保持较高精度的特点,解决了热阻网络法针对带夹层和硅通孔(Through Silicon Via,TSV)的复杂封装问题时存在较大误差的问题.对比结果表明,使用本文提出的方法得出的各叠层的上表面温度误差均小于0.05℃,精度与有限元法一致,并且更便捷高效.同时对应的建模结构简单,避免了热阻网络法将含铜柱的夹层和含铜柱的硅层分开考虑的不准确性.本文的研究可为未来多层3D堆叠MRAM热学特性相关的设计与分析提供指导.展开更多
采用直接功率注入法(direct power injection,DPI)对一款新型磁随机存储器(magneto resistive random access memory,MRAM)芯片进行了抗干扰测试。在存储数字“0”和“1”的情况下,对MRAM的电源引脚、数据引脚、控制引脚进行了干扰注入...采用直接功率注入法(direct power injection,DPI)对一款新型磁随机存储器(magneto resistive random access memory,MRAM)芯片进行了抗干扰测试。在存储数字“0”和“1”的情况下,对MRAM的电源引脚、数据引脚、控制引脚进行了干扰注入,对比了各引脚的失效功率。测试结果表明:MRAM在存储数字“0”时的敏感度比数字“1”时的敏感度低;与干扰从地引脚注入相比,干扰从电源引脚注入时芯片的敏感度更高;读取电路电磁敏感度和输出引脚与电源引脚具有较大相关性。这一研究结果可为提升新型存储器MRAM的芯片抗扰度及电路优化提供理论参考。展开更多
由于传统的磁盘甚至已广泛应用的Flash固态盘已无法很好地满足当前对存储器在集成度、读写速度、可靠性方面的需求,故须积极寻找新一代存储介质尝试与当前存储器混合使用甚至替代之.而磁阻随机存储器(magnetic random access memory,MR...由于传统的磁盘甚至已广泛应用的Flash固态盘已无法很好地满足当前对存储器在集成度、读写速度、可靠性方面的需求,故须积极寻找新一代存储介质尝试与当前存储器混合使用甚至替代之.而磁阻随机存储器(magnetic random access memory,MRAM)作为一种非易失性存储器,拥有静态随机存储器(satic random access memory,SRAM)的高速读取写入能力,以及动态随机存储器(dynamic random access memory,DRAM)的高集成度,同时比DRAM更低的能耗,并具有无限的读写次数,这些优秀的特性使得MRAM拥有很好的潜力成为下一代主流存储介质.为了对MRAM的读写性能、功耗等有深入的理解,设计并实现了一个MRAM测试平台,完成对MRAM读写性能测试和特性数据采集.该测试平台主要由MRAM控制器设计、MRAM特性数据采集、读写性能测试3个方面组成,由MRAM控制器对MRAM芯片进行读写完成读写性能测试,采集MRAM在读、写、空闲等状态下的特性数据.实验表明,MRAM具有良好的读写性能和低功耗,有条件成为下一代主流存储介质.展开更多
Electric field control of magnetism through nanoionics has attracted tremendous attention owing to its high efficiency and low power consumption.In solid-state dielectrics,an electric field drives the redistribution o...Electric field control of magnetism through nanoionics has attracted tremendous attention owing to its high efficiency and low power consumption.In solid-state dielectrics,an electric field drives the redistribution of ions to create onedimensional magnetic conductive nanostructures,enabling the realization of intriguing magnetoresistance(MR)effects.Here,we explored the electric-controlled nickel and oxygen ion migration in Pt/HfO_(2-x)/NiO_(y)/Ni heterojunctions for MR modulation.By adjusting the voltage polarity and amplitude,the magnetic conductive filaments with mixed nickel and oxygen vacancy are constructed.This results in the reduction of device resistance by~10^(3)folds,and leads to an intriguing partial asymmetric MR effect.We show that the difference of the device resistance under positive and negative saturation magnetic fields exhibits good linear dependence on the magnetic field angle,which can be used for magnetic field direction detection.Our study suggests the potential of electrically controlled ion migration in creating novel magnetic nanostructures for sensor applications.展开更多
基于Landau-Lifshitz-Gilbert-Slonczewski(LLGS)方程,研究平面型Co Fe B/Mg O磁隧道结的磁矩翻转特性.数值计算结果表明,Co Fe B与Mg O间的界面各向异性,可降低磁矩翻转的阈值电流密度,达到106A/cm2量级.固定层磁矩方向和类场自旋转移...基于Landau-Lifshitz-Gilbert-Slonczewski(LLGS)方程,研究平面型Co Fe B/Mg O磁隧道结的磁矩翻转特性.数值计算结果表明,Co Fe B与Mg O间的界面各向异性,可降低磁矩翻转的阈值电流密度,达到106A/cm2量级.固定层磁矩方向和类场自旋转移力矩对自由层磁矩的翻转时间有重要影响.当固定层磁矩与自由层磁矩之间有一个小角度时,可显著加快自由层磁矩翻转.当类场自旋转移力矩与自旋转移力矩之比为负值时,类场自旋转移力矩与自旋转移力矩将促进自由层磁矩翻转;当相应的类场自旋转移力矩与自旋转移力矩之比为正值时,类场自旋转移力矩将阻碍自由层磁矩翻转.该研究可供自旋转移力矩驱动的磁性随机存储器件设计借鉴.展开更多
基于自旋转移矩的磁性随机存储器(Spin Transfer Torque-Based Magnetoresistive RAM,STT-MRAM)具有非易失性、可无限擦写和快速写入等优点而有望成为下一代低功耗通用存储器.尤其是近年来STT-MRAM商用芯片的成功问世进一步推动了该器...基于自旋转移矩的磁性随机存储器(Spin Transfer Torque-Based Magnetoresistive RAM,STT-MRAM)具有非易失性、可无限擦写和快速写入等优点而有望成为下一代低功耗通用存储器.尤其是近年来STT-MRAM商用芯片的成功问世进一步推动了该器件的研究与应用.本文首先阐述了MRAM的基本原理与发展历程,着重介绍了写入技术的演变以及磁各向异性的改善.然后总结了近期在3个领域的研究成果:(1)学术界开展了大量研究以探讨制备工艺和器件结构等因素对界面垂直磁各向异性的影响;(2)CoFeB-MgO双界面结构被提出,该结构在不增大写入电流的前提下增强了磁隧道结的热稳定性势垒;(3)新兴的自旋轨道矩写入方式引起了广泛的关注,该技术有望解决传统自旋转移矩所面临的速度瓶颈和势垒击穿风险.最后,本文扼要地介绍了STT-MRAM在芯片设计领域的最新进展.展开更多
基金supported by the National Natural Science Foundation of China(Grant No.61404161)
文摘The 1-Mb and 4-Mb commercial toggle magnetoresistive random-access memories（MRAMs） with 0.13 μm and 0.18-μm complementary metal–oxide–semiconductor（CMOS） process respectively and different magnetic tunneling junctions（MTJs） are irradiated with a Cobalt-60 gamma source. The electrical functions of devices during the irradiation and the room temperature annealing behavior are measured. Electrical failures are observed until the dose accumulates to 120-krad（Si） in 4-Mb MRAM while the 1-Mb MRAM keeps normal. Thus, the 0.13-μm process circuit exhibits better radiation tolerance than the 0.18-μm process circuit. However, a small quantity of read bit-errors randomly occurs only in 1-Mb MRAM during the irradiation while their electrical function is normal. It indicates that the store states of MTJ may be influenced by gamma radiation, although the electrical transport and magnetic properties are inherently immune to the radiation. We propose that the magnetic Compton scattering in the interaction of gamma ray with magnetic free layer may be the origin of the read bit-errors. Our results are useful for MRAM toward space application.
文摘采用直接功率注入法(direct power injection,DPI)对一款新型磁随机存储器(magneto resistive random access memory,MRAM)芯片进行了抗干扰测试。在存储数字“0”和“1”的情况下,对MRAM的电源引脚、数据引脚、控制引脚进行了干扰注入,对比了各引脚的失效功率。测试结果表明:MRAM在存储数字“0”时的敏感度比数字“1”时的敏感度低;与干扰从地引脚注入相比,干扰从电源引脚注入时芯片的敏感度更高;读取电路电磁敏感度和输出引脚与电源引脚具有较大相关性。这一研究结果可为提升新型存储器MRAM的芯片抗扰度及电路优化提供理论参考。
文摘由于传统的磁盘甚至已广泛应用的Flash固态盘已无法很好地满足当前对存储器在集成度、读写速度、可靠性方面的需求,故须积极寻找新一代存储介质尝试与当前存储器混合使用甚至替代之.而磁阻随机存储器(magnetic random access memory,MRAM)作为一种非易失性存储器,拥有静态随机存储器(satic random access memory,SRAM)的高速读取写入能力,以及动态随机存储器(dynamic random access memory,DRAM)的高集成度,同时比DRAM更低的能耗,并具有无限的读写次数,这些优秀的特性使得MRAM拥有很好的潜力成为下一代主流存储介质.为了对MRAM的读写性能、功耗等有深入的理解,设计并实现了一个MRAM测试平台,完成对MRAM读写性能测试和特性数据采集.该测试平台主要由MRAM控制器设计、MRAM特性数据采集、读写性能测试3个方面组成,由MRAM控制器对MRAM芯片进行读写完成读写性能测试,采集MRAM在读、写、空闲等状态下的特性数据.实验表明,MRAM具有良好的读写性能和低功耗,有条件成为下一代主流存储介质.
基金Project supported by the National Key Research and Development Program of China(Grant No.2021YFA1202600)the National Natural Science Foundation of China(Grant Nos.92064011,62174164,61974179,and 61674153)+3 种基金Youth Innovation Promotion Association of the CAS(Grant No.2020297)Natural Science Foundation of Zhejiang Province(Grant No.LR17E020001)Ningbo Natural Science Foundation(Grant No.202003N4029)C.Wong Education Foundation(Grant No.GJTD-2020-11)。
文摘Electric field control of magnetism through nanoionics has attracted tremendous attention owing to its high efficiency and low power consumption.In solid-state dielectrics,an electric field drives the redistribution of ions to create onedimensional magnetic conductive nanostructures,enabling the realization of intriguing magnetoresistance(MR)effects.Here,we explored the electric-controlled nickel and oxygen ion migration in Pt/HfO_(2-x)/NiO_(y)/Ni heterojunctions for MR modulation.By adjusting the voltage polarity and amplitude,the magnetic conductive filaments with mixed nickel and oxygen vacancy are constructed.This results in the reduction of device resistance by~10^(3)folds,and leads to an intriguing partial asymmetric MR effect.We show that the difference of the device resistance under positive and negative saturation magnetic fields exhibits good linear dependence on the magnetic field angle,which can be used for magnetic field direction detection.Our study suggests the potential of electrically controlled ion migration in creating novel magnetic nanostructures for sensor applications.
文摘基于Landau-Lifshitz-Gilbert-Slonczewski(LLGS)方程,研究平面型Co Fe B/Mg O磁隧道结的磁矩翻转特性.数值计算结果表明,Co Fe B与Mg O间的界面各向异性,可降低磁矩翻转的阈值电流密度,达到106A/cm2量级.固定层磁矩方向和类场自旋转移力矩对自由层磁矩的翻转时间有重要影响.当固定层磁矩与自由层磁矩之间有一个小角度时,可显著加快自由层磁矩翻转.当类场自旋转移力矩与自旋转移力矩之比为负值时,类场自旋转移力矩与自旋转移力矩将促进自由层磁矩翻转;当相应的类场自旋转移力矩与自旋转移力矩之比为正值时,类场自旋转移力矩将阻碍自由层磁矩翻转.该研究可供自旋转移力矩驱动的磁性随机存储器件设计借鉴.
文摘基于自旋转移矩的磁性随机存储器(Spin Transfer Torque-Based Magnetoresistive RAM,STT-MRAM)具有非易失性、可无限擦写和快速写入等优点而有望成为下一代低功耗通用存储器.尤其是近年来STT-MRAM商用芯片的成功问世进一步推动了该器件的研究与应用.本文首先阐述了MRAM的基本原理与发展历程,着重介绍了写入技术的演变以及磁各向异性的改善.然后总结了近期在3个领域的研究成果:(1)学术界开展了大量研究以探讨制备工艺和器件结构等因素对界面垂直磁各向异性的影响;(2)CoFeB-MgO双界面结构被提出,该结构在不增大写入电流的前提下增强了磁隧道结的热稳定性势垒;(3)新兴的自旋轨道矩写入方式引起了广泛的关注,该技术有望解决传统自旋转移矩所面临的速度瓶颈和势垒击穿风险.最后,本文扼要地介绍了STT-MRAM在芯片设计领域的最新进展.
