Zn1-xCuxO thin films were synthesized by the radio frequency （RF） magnetron sputtering technique using a ZnO target containing different pieces of small Cu-chips. X-ray diffraction （XRD） and scanning electron micr...Zn1-xCuxO thin films were synthesized by the radio frequency （RF） magnetron sputtering technique using a ZnO target containing different pieces of small Cu-chips. X-ray diffraction （XRD） and scanning electron microscopy （SEM） were employed to analyze the crystalline and microstructure of the film, and X-ray photoelectron spectroscopy （XPS） was used to establish the bonding characteristics and oxidation states of copper inside the ZnO host. Room temperature （RT） ferromagnetism was observed in the Znl-xCuxO films by a Quantum Design superconducting quantum interference device （SQUID） and the saturation magnetic moment of the films was found to decrease with the increase in Cu content.展开更多
The doping content of Mg plays an important role in the crystalline structure and morphology properties of Zn_(1-x )Mg_xO thin films. Here,using radio-frequency magnetron sputtering method,we prepared Zn_(1-x )Mg_xO t...The doping content of Mg plays an important role in the crystalline structure and morphology properties of Zn_(1-x )Mg_xO thin films. Here,using radio-frequency magnetron sputtering method,we prepared Zn_(1-x )Mg_xO thin films on single crystalline Si(100) substrates with a series of x values. By means of X-ray diffraction(XRD) and scanning electron microscope(SEM),the crystalline structure and morphology of Zn_(1-x )Mg_xO thin films with different x values are investigated. The crystalline structure of Zn_(1-x )Mg_xO thin film is single phase with x<0.3,while there is phase separation phenomenon with x>0.3,and hexagonal and cubic structures will coexist in Zn_(1-x )Mg_xO thin films with higher x values. Especially with lower x values,a shoulder peak of 35.1° appearing in the XRD pattern indicates a double-crystalline structure of Zn_(1-x )Mg_xO thin film. The crystalline quality has been improved and the inner stress has been released,after the Zn_(1-x )Mg_xO thin films were annealed at 600 °C in vacuum condition.展开更多
Series of TiO 2-ZnO heterojunction composite films with different n（Zn）/n（Ti） ratios were prepared by UDP450 magnetron sputter ion plating equipment, and the mole ratio of Zn to Ti was controlled by adjusting the ...Series of TiO 2-ZnO heterojunction composite films with different n（Zn）/n（Ti） ratios were prepared by UDP450 magnetron sputter ion plating equipment, and the mole ratio of Zn to Ti was controlled by adjusting the current values of sputtering target. The effects of n（Zn）/n（Ti） on the microstructures of TiO2-ZnO films were investigated by SEM, AFM, Raman and XPS, and their photocatalytic decomposition of methyl orange solutions was evaluated. The results show that an increase in n（Zn）/n（Ti） typically results in a decrease in the grain size of composite films firstly and then an increase of grain size, while an increase in n（Zn）/n（Ti） leads to an increase in film roughness firstly and then a decrease in film roughness. Both grain size and roughness of TiO2-ZnO films reach the maximum and minimum at n（Zn）/n（Ti） of 1/9.3, respectively. The n（Zn）/n（Ti） shows little effect on the valences of Zn and Ti elements, which mainly exist in the form of TiO2 and ZnO phases. The n（Zn）/n（Ti） has influence on the amount of anatase/rutile TiO2 heterojunction in the film. With increase of the n（Zn）/n（Ti）, the absorption intensity of the composite film increases and the absorption region extends to 450 nm, which is redshifted as much as 150 nm in comparison with the pure TiO2 films. However, the photocatalytic abilities of heterogeneous composite films do not depend on the n（Zn）/n（Ti） but rather on the microstructures of the TiO2-ZnO composite films. Degradation rate of the film reaches the maximum and the photocatalytic decomposition of pollutants works best when n（Zn）/n（Ti）=1：9.3.展开更多
基金National Natural Science Foundation of China (Nos.10275047,10575073)the Natural Science Foundation of Jiangsu Province of China (03KJB140116)
文摘Zn1-xCuxO thin films were synthesized by the radio frequency （RF） magnetron sputtering technique using a ZnO target containing different pieces of small Cu-chips. X-ray diffraction （XRD） and scanning electron microscopy （SEM） were employed to analyze the crystalline and microstructure of the film, and X-ray photoelectron spectroscopy （XPS） was used to establish the bonding characteristics and oxidation states of copper inside the ZnO host. Room temperature （RT） ferromagnetism was observed in the Znl-xCuxO films by a Quantum Design superconducting quantum interference device （SQUID） and the saturation magnetic moment of the films was found to decrease with the increase in Cu content.
基金supported by the National Natural Science Foundation of China(Nos.20473077 and 61540071)the Project of Natural Science Research of High Education in Jiangsu Province(No.15KJD140002)+2 种基金the Fundamental Research Funds of Changzhou Science and Technology Bureau(No.CJ20160026)the Changzhou Modern Optoelectronic Technology Research Institute Funds(No.CZGY13)the Natural Science Funds of Changzhou Institute of Technology(No.YN1408)
文摘The doping content of Mg plays an important role in the crystalline structure and morphology properties of Zn_(1-x )Mg_xO thin films. Here,using radio-frequency magnetron sputtering method,we prepared Zn_(1-x )Mg_xO thin films on single crystalline Si(100) substrates with a series of x values. By means of X-ray diffraction(XRD) and scanning electron microscope(SEM),the crystalline structure and morphology of Zn_(1-x )Mg_xO thin films with different x values are investigated. The crystalline structure of Zn_(1-x )Mg_xO thin film is single phase with x<0.3,while there is phase separation phenomenon with x>0.3,and hexagonal and cubic structures will coexist in Zn_(1-x )Mg_xO thin films with higher x values. Especially with lower x values,a shoulder peak of 35.1° appearing in the XRD pattern indicates a double-crystalline structure of Zn_(1-x )Mg_xO thin film. The crystalline quality has been improved and the inner stress has been released,after the Zn_(1-x )Mg_xO thin films were annealed at 600 °C in vacuum condition.
基金Project (2010JQ6008) supported by the Natural Science Foundation of Shaanxi Province,China
文摘Series of TiO 2-ZnO heterojunction composite films with different n（Zn）/n（Ti） ratios were prepared by UDP450 magnetron sputter ion plating equipment, and the mole ratio of Zn to Ti was controlled by adjusting the current values of sputtering target. The effects of n（Zn）/n（Ti） on the microstructures of TiO2-ZnO films were investigated by SEM, AFM, Raman and XPS, and their photocatalytic decomposition of methyl orange solutions was evaluated. The results show that an increase in n（Zn）/n（Ti） typically results in a decrease in the grain size of composite films firstly and then an increase of grain size, while an increase in n（Zn）/n（Ti） leads to an increase in film roughness firstly and then a decrease in film roughness. Both grain size and roughness of TiO2-ZnO films reach the maximum and minimum at n（Zn）/n（Ti） of 1/9.3, respectively. The n（Zn）/n（Ti） shows little effect on the valences of Zn and Ti elements, which mainly exist in the form of TiO2 and ZnO phases. The n（Zn）/n（Ti） has influence on the amount of anatase/rutile TiO2 heterojunction in the film. With increase of the n（Zn）/n（Ti）, the absorption intensity of the composite film increases and the absorption region extends to 450 nm, which is redshifted as much as 150 nm in comparison with the pure TiO2 films. However, the photocatalytic abilities of heterogeneous composite films do not depend on the n（Zn）/n（Ti） but rather on the microstructures of the TiO2-ZnO composite films. Degradation rate of the film reaches the maximum and the photocatalytic decomposition of pollutants works best when n（Zn）/n（Ti）=1：9.3.
