The over-load protective relay is widely used directly affects the safe running of a motor. The reliability for motor protection. The reliability of the over-load protective relay testing and reliability analysis of t...The over-load protective relay is widely used directly affects the safe running of a motor. The reliability for motor protection. The reliability of the over-load protective relay testing and reliability analysis of the over-load protective relay is an important way to improve the reliability of products. In this paper, the reliability test method of the over-load protective relay is studied, and the reliability tests of the typical products are carried out on a reliability tester developed by authors. In terms of the testing results, the reliability analysis is finished. The failure reasons are found and the measures are put forward to improve the reliability of the products.展开更多
The meanings of parameters of software reliabi- lity models are investigated in terms of the process of the software testing and in terms of other measurements of software. Based on the investigation, the empirical e...The meanings of parameters of software reliabi- lity models are investigated in terms of the process of the software testing and in terms of other measurements of software. Based on the investigation, the empirical estimation of the parameters is addressed. On one hand, these empirical estimates are also measurements of the software, which can be used to control and to optimize the process of the software development. On the other hand, by treating these empirical estimates as Bayes priors, software reliability models are extended such that the engineers’ experience can be integrated into and hence to improve the models.展开更多
In order to achieve quick and accurate lifetime prediction of LED lighting products under the testing time of 2 000 h, a method of online testing of luminous flux is proposed under the condition of temperature stress....In order to achieve quick and accurate lifetime prediction of LED lighting products under the testing time of 2 000 h, a method of online testing of luminous flux is proposed under the condition of temperature stress.Exponential fitting of lumen maintenance, the Bayesian estimation of failure probability, the Weibull distribution of lifetime and the Arrhenius model of the decay rate are used in combination to acquire the distribution of failure probability over time at the ambient temperatures of 25 ℃. The lifetime test of the same lamps based on the Energy Star standard under the testing time of 6 000 h is also implemented to verify the effectiveness of the method. The errors of lifetimes acquired with the proposed method are 7%, 4%, 3% and 1% at the failure probabilities of 62. 3%, 10%, 5% and 1%,respectively.展开更多
Testing, as a part of English teaching, is a very important procedure, not just because it can be a valuable source of information about the effectiveness of learning and teaching but also because it can improve teach...Testing, as a part of English teaching, is a very important procedure, not just because it can be a valuable source of information about the effectiveness of learning and teaching but also because it can improve teaching. But most people are only interested in the scores of the test and neglect the reliability of the scores. This article tries to describe the test paper quantificationally and thus has the conclusion that the scores are imperfect.展开更多
Test paper evaluation is an important work for the management of tests,which results are significant bases for scientific summation of teaching and learning.Taking an English test paper of high students'monthly ex...Test paper evaluation is an important work for the management of tests,which results are significant bases for scientific summation of teaching and learning.Taking an English test paper of high students'monthly examination as the object,it focuses on the interpretation of SPSS output concerning item and whole quantitative analysis of papers.By analyzing and evaluating the papers,it can be a feedback for teachers to check the students'progress and adjust their teaching process.展开更多
This research focuses on the application of three soft computing techniques including Minimax Probability Machine Regression(MPMR),Particle Swarm Optimization based Artificial Neural Network(ANN-PSO)and Particle Swarm...This research focuses on the application of three soft computing techniques including Minimax Probability Machine Regression(MPMR),Particle Swarm Optimization based Artificial Neural Network(ANN-PSO)and Particle Swarm Optimization based Adaptive Network Fuzzy Inference System(ANFIS-PSO)to study the shallow foundation reliability based on settlement criteria.Soil is a heterogeneous medium and the involvement of its attributes for geotechnical behaviour in soil-foundation system makes the prediction of settlement of shallow a complex engineering problem.This study explores the feasibility of soft computing techniques against the deterministic approach.The settlement of shallow foundation depends on the parametersγ(unit weight),e0(void ratio)and CC(compression index).These soil parameters are taken as input variables while the settlement of shallow foundation as output.To assess the performance of models,different performance indices i.e.RMSE,VAF,R^2,Bias Factor,MAPE,LMI,U(95),RSR,NS,RPD,etc.were used.From the analysis of results,it was found that MPMR model outperformed PSO-ANFIS and PSO-ANN.Therefore,MPMR can be used as a reliable soft computing technique for non-linear problems for settlement of shallow foundations on soils.展开更多
A complex mechatronics system Bayesian plan of demonstration test is studied based on the mixed beta distribution. During product design and improvement various information is appropriately considered by introducing i...A complex mechatronics system Bayesian plan of demonstration test is studied based on the mixed beta distribution. During product design and improvement various information is appropriately considered by introducing inheritance factor, moreover, the inheritance factor is thought as a random variable, and the Bayesian decision of the qualification test plan is obtained, and the correctness of a Bayesian model presented is verified. The results show that the quantity of the test is too conservative according to classical methods under small binomial samples. Although traditional Bayesian analysis can consider test information of related or similar products, it ignores differences between such products. The method has solved the above problem, furthermore, considering the requirement in many practical projects, the differences among this method, the classical method and Bayesian with beta distribution are compared according to the plan of reliability acceptance test.展开更多
In the multistage reliability growth tests with instant and delayed fix modes, the failure data can be assumed to follow Weibull processes with different parameters at different stages. For the Weibull process within ...In the multistage reliability growth tests with instant and delayed fix modes, the failure data can be assumed to follow Weibull processes with different parameters at different stages. For the Weibull process within a stage, by the proper selection of prior distribution form and the parameters, a concise posterior distribution form is obtained, thus simplifying the Bayesian analysis. In the multistage tests, the improvement factor is used to convert the posterior of one stage to the prior of the subsequent stage. The conversion criterion is carefully analyzed to determine the distribution parameters of the subsequent stage＇s variable reasonably. Based on the mentioned results, a new synthetic Bayesian evaluation program and algorithm framework is put forward to evaluate the multistage reliability growth tests with instant and delayed fix modes. The example shows the effectiveness and flexibility of this method.展开更多
A new type application specific light emitting diode （LED） package （ASLP） with freeform polycarbonate lens for street lighting is developed, whose manufacturing processes are compatible with a typical LED packagin...A new type application specific light emitting diode （LED） package （ASLP） with freeform polycarbonate lens for street lighting is developed, whose manufacturing processes are compatible with a typical LED packaging process. The reliability test methods and failure criterions from different vendors are reviewed and compared. It is found that test methods and failure criterions are quite different. The rapid reliability assessment standards are urgently needed for the LED industry. 85℃/85 RH with 700 mA is used to test our LED modules with three other vendors for 1000 h, showing no visible degradation in optical performance for our modules, with two other vendors showing significant degradation. Some failure analysis methods such as C-SAM, Nano X-ray CT and optical microscope are used for LED packages. Some failure mechanisms such as delaminations and cracks are detected in the LED packages after the accelerated reliability testing. The finite element simulation method is helpful for the failure analysis and design of the reliability of the LED packaging. One example is used to show one currently used module in industry is vulnerable and may not easily pass the harsh thermal cycle testing.展开更多
In order to analyze the failure data from repairable systems, the homogeneous Poisson process (HPP) is usually used. In general, HPP cannot be applied to analyze the entire life cycle of a complex, re-pairable system ...In order to analyze the failure data from repairable systems, the homogeneous Poisson process (HPP) is usually used. In general, HPP cannot be applied to analyze the entire life cycle of a complex, re-pairable system because the rate of occurrence of failures (ROCOF) of the system changes over time rather than remains stable. However, from a practical point of view, it is always preferred to apply the simplest method to address problems and to obtain useful practical results. Therefore, we attempted to use the HPP model to analyze the failure data from real repairable systems. A graphic method and the Laplace test were also used in the analysis. Results of numerical applications show that the HPP model may be a useful tool for the entire life cycle of repairable systems.展开更多
Interconnections in microelectronic packaging are not only the physical carrier to realize the function of electronic circuits,but also the weak spots in reliability tests.Most of failures in power devices are caused ...Interconnections in microelectronic packaging are not only the physical carrier to realize the function of electronic circuits,but also the weak spots in reliability tests.Most of failures in power devices are caused by the malfunction of interconnections,including failure of bonding wire as well as cracks of solder layer.In fact,the interconnection failure of power devices is the result of a combination of factors such as electricity,temperature,and force.It is significant to investigate the failure mechanisms of various factors for the failure analysis of interconnections in power devices.This paper reviews the main failure modes of bonding wire and solder layer in the interconnection structure of power devices,and its failure mechanism.Then the reliability test method and failure analysis techniques of interconnection in power device are introduced.These methods are of great significance to the reliability analysis and life prediction of power devices.展开更多
基金Project (No. E2005000039) supported by the Natural Science Foun-dation of Hebei Province, China
文摘The over-load protective relay is widely used directly affects the safe running of a motor. The reliability for motor protection. The reliability of the over-load protective relay testing and reliability analysis of the over-load protective relay is an important way to improve the reliability of products. In this paper, the reliability test method of the over-load protective relay is studied, and the reliability tests of the typical products are carried out on a reliability tester developed by authors. In terms of the testing results, the reliability analysis is finished. The failure reasons are found and the measures are put forward to improve the reliability of the products.
文摘The meanings of parameters of software reliabi- lity models are investigated in terms of the process of the software testing and in terms of other measurements of software. Based on the investigation, the empirical estimation of the parameters is addressed. On one hand, these empirical estimates are also measurements of the software, which can be used to control and to optimize the process of the software development. On the other hand, by treating these empirical estimates as Bayes priors, software reliability models are extended such that the engineers’ experience can be integrated into and hence to improve the models.
基金The Cui Can Project of Chinese Academy of Sciences(No.KZCC-EW-102)the National High Technology Research and Development Program of China(863 Program)(No.2015AA03A101,2013AA03A116)
文摘In order to achieve quick and accurate lifetime prediction of LED lighting products under the testing time of 2 000 h, a method of online testing of luminous flux is proposed under the condition of temperature stress.Exponential fitting of lumen maintenance, the Bayesian estimation of failure probability, the Weibull distribution of lifetime and the Arrhenius model of the decay rate are used in combination to acquire the distribution of failure probability over time at the ambient temperatures of 25 ℃. The lifetime test of the same lamps based on the Energy Star standard under the testing time of 6 000 h is also implemented to verify the effectiveness of the method. The errors of lifetimes acquired with the proposed method are 7%, 4%, 3% and 1% at the failure probabilities of 62. 3%, 10%, 5% and 1%,respectively.
文摘Testing, as a part of English teaching, is a very important procedure, not just because it can be a valuable source of information about the effectiveness of learning and teaching but also because it can improve teaching. But most people are only interested in the scores of the test and neglect the reliability of the scores. This article tries to describe the test paper quantificationally and thus has the conclusion that the scores are imperfect.
文摘Test paper evaluation is an important work for the management of tests,which results are significant bases for scientific summation of teaching and learning.Taking an English test paper of high students'monthly examination as the object,it focuses on the interpretation of SPSS output concerning item and whole quantitative analysis of papers.By analyzing and evaluating the papers,it can be a feedback for teachers to check the students'progress and adjust their teaching process.
基金financially supported by High-end Foreign Expert program(G20190022002)Science and Technology Research Program of Chongqing Municipal Education Commission(Grant No.KJZDK201900102)Chongqing Construction Science and Technology Plan Project(2019-0045),that are gratefully acknowledged。
文摘This research focuses on the application of three soft computing techniques including Minimax Probability Machine Regression(MPMR),Particle Swarm Optimization based Artificial Neural Network(ANN-PSO)and Particle Swarm Optimization based Adaptive Network Fuzzy Inference System(ANFIS-PSO)to study the shallow foundation reliability based on settlement criteria.Soil is a heterogeneous medium and the involvement of its attributes for geotechnical behaviour in soil-foundation system makes the prediction of settlement of shallow a complex engineering problem.This study explores the feasibility of soft computing techniques against the deterministic approach.The settlement of shallow foundation depends on the parametersγ(unit weight),e0(void ratio)and CC(compression index).These soil parameters are taken as input variables while the settlement of shallow foundation as output.To assess the performance of models,different performance indices i.e.RMSE,VAF,R^2,Bias Factor,MAPE,LMI,U(95),RSR,NS,RPD,etc.were used.From the analysis of results,it was found that MPMR model outperformed PSO-ANFIS and PSO-ANN.Therefore,MPMR can be used as a reliable soft computing technique for non-linear problems for settlement of shallow foundations on soils.
基金National Advanced Research Project of China(No.51319030302)National Advanced Research Foundation of China(No.9140A 19030506KG0166)
文摘A complex mechatronics system Bayesian plan of demonstration test is studied based on the mixed beta distribution. During product design and improvement various information is appropriately considered by introducing inheritance factor, moreover, the inheritance factor is thought as a random variable, and the Bayesian decision of the qualification test plan is obtained, and the correctness of a Bayesian model presented is verified. The results show that the quantity of the test is too conservative according to classical methods under small binomial samples. Although traditional Bayesian analysis can consider test information of related or similar products, it ignores differences between such products. The method has solved the above problem, furthermore, considering the requirement in many practical projects, the differences among this method, the classical method and Bayesian with beta distribution are compared according to the plan of reliability acceptance test.
基金supported by Pre-research Foundation of General Armament Department of China(xxxxxxxxxxxx06KG0164)and the National Doctoral Foundation of China (2005999807).
文摘In the multistage reliability growth tests with instant and delayed fix modes, the failure data can be assumed to follow Weibull processes with different parameters at different stages. For the Weibull process within a stage, by the proper selection of prior distribution form and the parameters, a concise posterior distribution form is obtained, thus simplifying the Bayesian analysis. In the multistage tests, the improvement factor is used to convert the posterior of one stage to the prior of the subsequent stage. The conversion criterion is carefully analyzed to determine the distribution parameters of the subsequent stage＇s variable reasonably. Based on the mentioned results, a new synthetic Bayesian evaluation program and algorithm framework is put forward to evaluate the multistage reliability growth tests with instant and delayed fix modes. The example shows the effectiveness and flexibility of this method.
基金Project supported by the National Natural Science Foundation of China(Nos.50876038,50835005)the National High Technology Research and Development Program of China(No.2009AA03A1A3)
文摘A new type application specific light emitting diode （LED） package （ASLP） with freeform polycarbonate lens for street lighting is developed, whose manufacturing processes are compatible with a typical LED packaging process. The reliability test methods and failure criterions from different vendors are reviewed and compared. It is found that test methods and failure criterions are quite different. The rapid reliability assessment standards are urgently needed for the LED industry. 85℃/85 RH with 700 mA is used to test our LED modules with three other vendors for 1000 h, showing no visible degradation in optical performance for our modules, with two other vendors showing significant degradation. Some failure analysis methods such as C-SAM, Nano X-ray CT and optical microscope are used for LED packages. Some failure mechanisms such as delaminations and cracks are detected in the LED packages after the accelerated reliability testing. The finite element simulation method is helpful for the failure analysis and design of the reliability of the LED packaging. One example is used to show one currently used module in industry is vulnerable and may not easily pass the harsh thermal cycle testing.
文摘In order to analyze the failure data from repairable systems, the homogeneous Poisson process (HPP) is usually used. In general, HPP cannot be applied to analyze the entire life cycle of a complex, re-pairable system because the rate of occurrence of failures (ROCOF) of the system changes over time rather than remains stable. However, from a practical point of view, it is always preferred to apply the simplest method to address problems and to obtain useful practical results. Therefore, we attempted to use the HPP model to analyze the failure data from real repairable systems. A graphic method and the Laplace test were also used in the analysis. Results of numerical applications show that the HPP model may be a useful tool for the entire life cycle of repairable systems.
基金supported by the National Natural Science Foundation of China(Grant No.61904127 and 62004144)Guangdong Basic and Applied Basic Research Foundation(Grant No.2021A1515010651)+2 种基金Fundamental Research Funds for the Central Universities(Grant No.202401002,203134004,20212VA100 and 2021VB006)Hubei Provincial Natural Science Foundation of China(Grant No.2020CFA032)National Key R&D Program of China(Grant No.2019YFB1704600)。
文摘Interconnections in microelectronic packaging are not only the physical carrier to realize the function of electronic circuits,but also the weak spots in reliability tests.Most of failures in power devices are caused by the malfunction of interconnections,including failure of bonding wire as well as cracks of solder layer.In fact,the interconnection failure of power devices is the result of a combination of factors such as electricity,temperature,and force.It is significant to investigate the failure mechanisms of various factors for the failure analysis of interconnections in power devices.This paper reviews the main failure modes of bonding wire and solder layer in the interconnection structure of power devices,and its failure mechanism.Then the reliability test method and failure analysis techniques of interconnection in power device are introduced.These methods are of great significance to the reliability analysis and life prediction of power devices.
