A single-loop fourth-order sigma-delta（ΣΔ） interface circuit for a closed-loop micromachined accelerometer is presented.Two additional electronic integrators are cascaded with the micromachined sensing element to ...A single-loop fourth-order sigma-delta（ΣΔ） interface circuit for a closed-loop micromachined accelerometer is presented.Two additional electronic integrators are cascaded with the micromachined sensing element to form a fourth-order loop filter.The three main noise sources affecting the overall system resolution of aΣΔaccelerometer, mechanical noise,electronic noise and quantization noise,are analyzed in detail.Accurate mathematical formulas for electronic and quantization noise are established.The ASIC is fabricated in a 0.5μm two-metal two-poly n-well CMOS process.The test results indicate that the mechanical noise and electronic noise are 1μg/（Hz）^（1/2） and 8μV/（Hz）^（1/2） respectively,and the theoretical models of electronic and quantization noise agree well with the test and simulation results.展开更多
The property of silicon micro-capacitive accelerometer is analyzed and discussed by establishing the model of the sensor,to lay a basis for optimization design of sensor system structure. Discussed issues include the ...The property of silicon micro-capacitive accelerometer is analyzed and discussed by establishing the model of the sensor,to lay a basis for optimization design of sensor system structure. Discussed issues include the static modeling and dynamic behavior of the two commonly used structures,i.e., double-cantilever supported and four-beam supported structures, and also the measurement range of these devices.展开更多
基金supported by the National High Technology Research and Development Program of China(No.2008AA042201).
文摘A single-loop fourth-order sigma-delta（ΣΔ） interface circuit for a closed-loop micromachined accelerometer is presented.Two additional electronic integrators are cascaded with the micromachined sensing element to form a fourth-order loop filter.The three main noise sources affecting the overall system resolution of aΣΔaccelerometer, mechanical noise,electronic noise and quantization noise,are analyzed in detail.Accurate mathematical formulas for electronic and quantization noise are established.The ASIC is fabricated in a 0.5μm two-metal two-poly n-well CMOS process.The test results indicate that the mechanical noise and electronic noise are 1μg/（Hz）^（1/2） and 8μV/（Hz）^（1/2） respectively,and the theoretical models of electronic and quantization noise agree well with the test and simulation results.
文摘The property of silicon micro-capacitive accelerometer is analyzed and discussed by establishing the model of the sensor,to lay a basis for optimization design of sensor system structure. Discussed issues include the static modeling and dynamic behavior of the two commonly used structures,i.e., double-cantilever supported and four-beam supported structures, and also the measurement range of these devices.
