Nano-optics is an emergent research field in physics that appeared in the 1980s,which deals with light–matter optical interactions at the nanometer scale.In early studies of nano-optics,the main concern focus is to o...Nano-optics is an emergent research field in physics that appeared in the 1980s,which deals with light–matter optical interactions at the nanometer scale.In early studies of nano-optics,the main concern focus is to obtain higher optical resolution over the diffraction limit.The researches of near-field imaging and spectroscopy based on scanning near-field optical microscopy(SNOM)are developed.The exploration of improving SNOM probe for near-field detection leads to the emergence of surface plasmons.In the sense of resolution and wider application,there has been a significant transition from seeking higher resolution microscopy to plasmonic near-field modulations in the nano-optics community during the nano-optic development.Nowadays,studies of nano-optics prefer the investigation of plasmonics in different material systems.In this article,the history of the development of near-field optics is briefly reviewed.The difficulties of conventional SNOM to achieve higher resolution are discussed.As an alternative solution,surface plasmons have shown the advantages of higher resolution,wider application,and flexible nano-optical modulation for new devices.The typical studies in different periods are introduced and characteristics of nano-optics in each stage are analyzed.In this way,the evolution progress from near-field optics to plasmonics of nano-optics research is presented.The future development of nano-optics is discussed then.展开更多
为解决原子力显微镜(Atomic Force Microscope,AFM)系统更换探针后光路调整复杂耗时、精度不足的问题,本文首次提出通过精密控制探针与探针夹装配位置来实现更换的探针相对AFM系统原光路位置的一致,进而实现免去AFM系统换针后调整光路...为解决原子力显微镜(Atomic Force Microscope,AFM)系统更换探针后光路调整复杂耗时、精度不足的问题,本文首次提出通过精密控制探针与探针夹装配位置来实现更换的探针相对AFM系统原光路位置的一致,进而实现免去AFM系统换针后调整光路步骤。该系统的光路一致性组件采用光束偏转法对探针位置与偏转进行放大与监测,并使用高精度位移与角度调节平台进行探针相对于探针夹的方位调整。通过实物搭建对探针一致性效果进行了验证,并对紫外光(Ultraviolet,UV)胶水固化过程导致探针位置偏移影响;探针不同偏移量时产生的探测器噪音对AFM系统成像质量影响进行了系统分析。实验结果表明:经由该系统装配的探针平均位置精度接近1.1μm;并且在AFM系统中更换一致性探针仅需8 s。该系统实现了高精度且质量稳定的探针一致性装配,极大地简化了AFM系统重新校准光路的操作步骤,其与自动换针装置配合可有效提升工业计量型AFM的操作与测量性能。展开更多
文摘Nano-optics is an emergent research field in physics that appeared in the 1980s,which deals with light–matter optical interactions at the nanometer scale.In early studies of nano-optics,the main concern focus is to obtain higher optical resolution over the diffraction limit.The researches of near-field imaging and spectroscopy based on scanning near-field optical microscopy(SNOM)are developed.The exploration of improving SNOM probe for near-field detection leads to the emergence of surface plasmons.In the sense of resolution and wider application,there has been a significant transition from seeking higher resolution microscopy to plasmonic near-field modulations in the nano-optics community during the nano-optic development.Nowadays,studies of nano-optics prefer the investigation of plasmonics in different material systems.In this article,the history of the development of near-field optics is briefly reviewed.The difficulties of conventional SNOM to achieve higher resolution are discussed.As an alternative solution,surface plasmons have shown the advantages of higher resolution,wider application,and flexible nano-optical modulation for new devices.The typical studies in different periods are introduced and characteristics of nano-optics in each stage are analyzed.In this way,the evolution progress from near-field optics to plasmonics of nano-optics research is presented.The future development of nano-optics is discussed then.
文摘为解决原子力显微镜(Atomic Force Microscope,AFM)系统更换探针后光路调整复杂耗时、精度不足的问题,本文首次提出通过精密控制探针与探针夹装配位置来实现更换的探针相对AFM系统原光路位置的一致,进而实现免去AFM系统换针后调整光路步骤。该系统的光路一致性组件采用光束偏转法对探针位置与偏转进行放大与监测,并使用高精度位移与角度调节平台进行探针相对于探针夹的方位调整。通过实物搭建对探针一致性效果进行了验证,并对紫外光(Ultraviolet,UV)胶水固化过程导致探针位置偏移影响;探针不同偏移量时产生的探测器噪音对AFM系统成像质量影响进行了系统分析。实验结果表明:经由该系统装配的探针平均位置精度接近1.1μm;并且在AFM系统中更换一致性探针仅需8 s。该系统实现了高精度且质量稳定的探针一致性装配,极大地简化了AFM系统重新校准光路的操作步骤,其与自动换针装置配合可有效提升工业计量型AFM的操作与测量性能。
