This paper addresses the challenge of reconstructing randomly distributed second-phase particlestrengthened microstructure of AA7075-O aluminum sheet material for computational analysis.The particle characteristics in...This paper addresses the challenge of reconstructing randomly distributed second-phase particlestrengthened microstructure of AA7075-O aluminum sheet material for computational analysis.The particle characteristics in 3D space were obtained from focused ion beam and scanning electron microscopy(FIB-SEM)and SEM-based Electron Backscatter Diffraction/Energy Dispersive X-ray Spectrometry(EBSD/EDS)techniques.A theoretical framework for analysis of elastic-plastic deformation of such3D microstructures is developed.Slip-induced shear band formation,void initiation,growth and linkage at large plastic strains during uniaxial tensile loading were investigated based on reconstructed 3D representative volume element(RVE)models with real-distribution of particles and the results compared with experimental observations.In-situ SEM interrupted tension tests along transverse direction(TD)and rolling direction(RD),employing microscopic-digital image correlation(μ-DIC)technique,were carried out to investigate slip bands,micro-voids formation and obtain microstructural strain maps.The resulting local strain maps were analyzed in relation to the experimentally observed plastic flow localization,failure modes and local stress maps from simulations of RVE models.The influences of particle size,shape,orientation,volume fraction as well as matrix-particle interface properties on local plastic deformation,global stress-strain/strain-hardening curves and interfacial failure mechanisms were studied based on 3D RVE models.When possible,the model results were compared with in-situ tensile test data.In general,good agreement was observed,indicating that the real 3D microstructure-based RVE models can accurately predict the plastic deformation and interfacial failure evolution in AA7075-O aluminum sheet.展开更多
基金the financial and technical support of Novelis Global Research and Technology Center of Novelis Inc.,in Kennesaw,GA,USAfunding from National Science and Engineering Research Council(NSERC)of Canada under its Collaborative Research and Development(CRD)program。
文摘This paper addresses the challenge of reconstructing randomly distributed second-phase particlestrengthened microstructure of AA7075-O aluminum sheet material for computational analysis.The particle characteristics in 3D space were obtained from focused ion beam and scanning electron microscopy(FIB-SEM)and SEM-based Electron Backscatter Diffraction/Energy Dispersive X-ray Spectrometry(EBSD/EDS)techniques.A theoretical framework for analysis of elastic-plastic deformation of such3D microstructures is developed.Slip-induced shear band formation,void initiation,growth and linkage at large plastic strains during uniaxial tensile loading were investigated based on reconstructed 3D representative volume element(RVE)models with real-distribution of particles and the results compared with experimental observations.In-situ SEM interrupted tension tests along transverse direction(TD)and rolling direction(RD),employing microscopic-digital image correlation(μ-DIC)technique,were carried out to investigate slip bands,micro-voids formation and obtain microstructural strain maps.The resulting local strain maps were analyzed in relation to the experimentally observed plastic flow localization,failure modes and local stress maps from simulations of RVE models.The influences of particle size,shape,orientation,volume fraction as well as matrix-particle interface properties on local plastic deformation,global stress-strain/strain-hardening curves and interfacial failure mechanisms were studied based on 3D RVE models.When possible,the model results were compared with in-situ tensile test data.In general,good agreement was observed,indicating that the real 3D microstructure-based RVE models can accurately predict the plastic deformation and interfacial failure evolution in AA7075-O aluminum sheet.