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基于内建自测试电路的NAND Flash测试方法
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作者 解维坤 白月芃 +1 位作者 季伟伟 王厚军 《电子与封装》 2023年第11期18-24,共7页
随着NAND Flash在存储器市场中的占比与日俱增,对NAND Flash的测试需求也越来越大。针对NAND Flash存储器中存在的故障类型进行讨论,并对现有测试算法进行分析,为提高故障覆盖率以及降低测试时间,对现有的March-like测试算法做出改进,... 随着NAND Flash在存储器市场中的占比与日俱增,对NAND Flash的测试需求也越来越大。针对NAND Flash存储器中存在的故障类型进行讨论,并对现有测试算法进行分析,为提高故障覆盖率以及降低测试时间,对现有的March-like测试算法做出改进,改进算法比March-like算法的故障覆盖率提高了16.7%,测试时间减少了30%。完成存储器内建自测试(MBIST)电路设计,设计了FPGA最小系统板并进行板级验证,结果验证了MBIST电路以及改进的测试算法的可行性。 展开更多
关键词 NAND Flash 存储器内建自测试 March-like Flash故障类型
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一种高压无弧断路器的设计理念
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作者 张月存 江敖 林水生 《江苏电器》 2003年第4期9-11,共3页
介绍了利用微机控制和火工发射式操动机构可实现断路器分相操作,使其能准确地在电流过零时分闸和电压过零时合闸,以达到断路器在有荷状态下无弧关合与分断。
关键词 高压无弧断路器 微机控制 火工发射式操动机构 分相操作
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Next High Performance and Low Power Flash Memory Package Structure
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作者 Jung-Hoon Lee 《Journal of Computer Science & Technology》 SCIE EI CSCD 2007年第4期515-520,共6页
In general, NAND flash memory has advantages in low power consumption, storage capacity, and fast erase/write performance in contrast to NOR flash. But, main drawback of the NAND flash memory is the slow access time f... In general, NAND flash memory has advantages in low power consumption, storage capacity, and fast erase/write performance in contrast to NOR flash. But, main drawback of the NAND flash memory is the slow access time for random read operations. Therefore, we proposed the new NAND flash memory package for overcoming this major drawback. We present a high performance and low power NAND flash memory system with a dual cache memory. The proposed NAND flash package consists of two parts, i.e., an NAND flash memory module, and a dual cache module. The new NAND flash memory system can achieve dramatically higher performance and lower power consumption compared with any conventionM NAND-type flash memory module. Our results show that the proposed system can reduce about 78% of write operations into the flash memory cell and about 70% of read operations from the flash memory cell by using only additional 3KB cache space. This value represents high potential to achieve low power consumption and high performance gain. 展开更多
关键词 flash memory nand-type NOR-type memory localities buffer or cache memory
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Improvement for low power high performance hybrid type CAM
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作者 LU Wen-juan PENG Chun-yu +2 位作者 LIN Zhi-ting WU Xiu-long CHEN Jun-ning 《The Journal of China Universities of Posts and Telecommunications》 EI CSCD 2014年第4期77-82,共6页
Based on the analysis of typical hybrid-type content addressable memory (CAM) structures, a hybrid-type CAM architecture with lower power consumption and higher stability was proposed. This design changes the connec... Based on the analysis of typical hybrid-type content addressable memory (CAM) structures, a hybrid-type CAM architecture with lower power consumption and higher stability was proposed. This design changes the connection of a N-type metal-oxide-semiconductor (NMOS) transistor in the control circuit, which greatly reduces the power consumption during comparison by making the match line simply discharge to the NMOS threshold voltage. A comparative study was made between conventional and the proposed hybrid-type CAM architecture by semiconductor manufacturing international corporation (SMIC) 65 nm complementary metal-oxide-semiconductor (CMOS) technology. Simulation shows that the power consumption of the proposed structure is reduced by 23%. Furthermore, the proposed design also adjusts the match line (ML) discharge path. In case that, the not and type (NAND-type) block is matched and the not or type (NOR-type) block is mismatched, the jitter voltage on the match line can be decreased largely. 展开更多
关键词 CAM nand-type NOR-type hybrid-type CAM design low power
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