目的:观察安神宁心胶囊对肝郁脾虚、心神失养型失眠症患者睡眠质量的影响。方法将60例失眠症患者随机分为治疗组和对照组,各30例。治疗组给予安神宁心胶囊治疗,每次4丸~6丸,每日3次,温水送服。对照组给予阿普唑仑片口服,每日1次...目的:观察安神宁心胶囊对肝郁脾虚、心神失养型失眠症患者睡眠质量的影响。方法将60例失眠症患者随机分为治疗组和对照组,各30例。治疗组给予安神宁心胶囊治疗,每次4丸~6丸,每日3次,温水送服。对照组给予阿普唑仑片口服,每日1次,每次1片,睡前服用。两组均以7 d为1个疗程,连续治疗4个疗程。治疗4周末分别采用匹兹堡睡眠质量指数量表评分法( PSQ I)和中医临床证候自评量表评分法对睡眠质量、中医临床证候及总体疗效进行评定,同时对两组不良反应发生情况进行统计分析。结果两组治疗后 PSQ I评分在睡眠质量、日间功能障碍、睡眠时间、睡眠效率、睡眠障碍及总分方面差异有统计学意义( P <0.05),在入睡时间、催眠药物方面差异无统计学意义( P >0.05)。治疗组中医临床证候疗效、睡眠质量疗效优于对照组( P <0.05)。治疗组未出现明显不良反应,对照组出现口干、头晕、便秘、唾液增多等不良反应。结论安神宁心胶囊能明显改善肝郁脾虚、心神失养型失眠患者的睡眠质量和临床症状及体征,改善其情志状态和生活质量,安全无副反应,疗效稳定。展开更多
In order to analyze the thermal characteristics of the cavity facet of a semiconductor laser, a home-built near-field scanning optical microscopy (NSOM) is employed to probe the topography of the facet. By comparing...In order to analyze the thermal characteristics of the cavity facet of a semiconductor laser, a home-built near-field scanning optical microscopy (NSOM) is employed to probe the topography of the facet. By comparing the topographic images of two samples under different DC current injections, we can find that the thermal characteristic is related to its lifetime. We show that it is possible to predict the lifetime of the semiconductor laser diode with nondestructive tests.展开更多
文摘目的:观察安神宁心胶囊对肝郁脾虚、心神失养型失眠症患者睡眠质量的影响。方法将60例失眠症患者随机分为治疗组和对照组,各30例。治疗组给予安神宁心胶囊治疗,每次4丸~6丸,每日3次,温水送服。对照组给予阿普唑仑片口服,每日1次,每次1片,睡前服用。两组均以7 d为1个疗程,连续治疗4个疗程。治疗4周末分别采用匹兹堡睡眠质量指数量表评分法( PSQ I)和中医临床证候自评量表评分法对睡眠质量、中医临床证候及总体疗效进行评定,同时对两组不良反应发生情况进行统计分析。结果两组治疗后 PSQ I评分在睡眠质量、日间功能障碍、睡眠时间、睡眠效率、睡眠障碍及总分方面差异有统计学意义( P <0.05),在入睡时间、催眠药物方面差异无统计学意义( P >0.05)。治疗组中医临床证候疗效、睡眠质量疗效优于对照组( P <0.05)。治疗组未出现明显不良反应,对照组出现口干、头晕、便秘、唾液增多等不良反应。结论安神宁心胶囊能明显改善肝郁脾虚、心神失养型失眠患者的睡眠质量和临床症状及体征,改善其情志状态和生活质量,安全无副反应,疗效稳定。
文摘In order to analyze the thermal characteristics of the cavity facet of a semiconductor laser, a home-built near-field scanning optical microscopy (NSOM) is employed to probe the topography of the facet. By comparing the topographic images of two samples under different DC current injections, we can find that the thermal characteristic is related to its lifetime. We show that it is possible to predict the lifetime of the semiconductor laser diode with nondestructive tests.