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Vibration analysis of atomic force microscope cantilevers in contact resonance force microscopy using Timoshenko beam model
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作者 Xilong Zhou Pengfei Wen Faxin Li 《Acta Mechanica Solida Sinica》 SCIE EI CSCD 2017年第5期520-530,共11页
Timoshenko beam model is employed to investigate the vibration of atomic force mi- croscope (AFM) cantilevers in contact resonance force microscopy (CRFM). Characteristic equation with both vertical and lateral ti... Timoshenko beam model is employed to investigate the vibration of atomic force mi- croscope (AFM) cantilevers in contact resonance force microscopy (CRFM). Characteristic equation with both vertical and lateral tip-sample contact is derived. The contact resonance frequencies (CRFs) obtained by the Timoshenko model are compared with those by the Euler-Bernoulli model. A method is proposed to correct the wave number obtained by the Euler-Bernoulli model. The forced vibration is compared between the two models. Results reveal that the Timoshenko model is superior to the Euler-Bernoulli model in predicting the vibration characteristics for cantilevers' higher eigenmodes. 展开更多
关键词 nanomechanicstimoshenko modelForced vibration
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