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Characterization of Interface Charge in NbAlO/AlGaN/GaN MOSHEMT with Different NbAlO Thicknesses
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作者 冯倩 杜锴 +2 位作者 代波 董良 冯庆 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第1期137-139,共3页
We investigate the influence of interface charge on electrical performance of NbAIO/A1GaN/GaN metal-oxide- semiconductor high electron mobility transistors (MOSHEMTs). Through C-V measurements and simulations, we fi... We investigate the influence of interface charge on electrical performance of NbAIO/A1GaN/GaN metal-oxide- semiconductor high electron mobility transistors (MOSHEMTs). Through C-V measurements and simulations, we find that the donor-type interface fixed charge density Qit of 2.2 × 10^13 cm^-2 exists at the NbA10/A1GaN interface, which induces the shift of the threshold voltage much more negative. Furthermore, a trap density of approximately 0.43 × 10^13-1.14 ×10^13 cm^-2 eV^-1 is obtained at the NaA10/AlGaN interface, which is consistent with the frequency-dependent capacitance and conductance measurement results. 展开更多
关键词 ALGAN Characterization of Interface Charge in nbalo/AlGaN/GaN MOSHEMT with Different nbalo Thicknesses
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SiGe上NbAlO栅介质薄膜微结构和电学性能分析
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作者 宋朝瑞 程新红 +1 位作者 何大伟 徐大伟 《功能材料与器件学报》 CAS CSCD 北大核心 2011年第1期120-124,共5页
本文针对SiGe上Al2O3/NbAlO/Al2O3三明治结构介质栈的热稳定性和电学性能进行了研究。高分辨透射电镜(HRTEM)测试表明退火后薄膜是结晶的,同步辐射X射线反射率(XRR)和X射线衍射(XRD)分析表明在薄膜中存在超晶格结构,有0.5nm的界面层存... 本文针对SiGe上Al2O3/NbAlO/Al2O3三明治结构介质栈的热稳定性和电学性能进行了研究。高分辨透射电镜(HRTEM)测试表明退火后薄膜是结晶的,同步辐射X射线反射率(XRR)和X射线衍射(XRD)分析表明在薄膜中存在超晶格结构,有0.5nm的界面层存在,X射线光电子谱(XPS)表明界面层主要成分是SiOx,介质层与SiGe衬底之间的价带偏移是2.9eV。电学测试分析给出的等效栅氧厚度和介电常数分别是1.8nm和19。 展开更多
关键词 nbalo栅介质 价带偏移 超晶格
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Synthesis and photoluminescence properties of Er^(3+) and Dy^(3+) doped Na_2NbAlO_5 phosphors
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作者 Xiaoxue Hu Shuangping Yi +2 位作者 Boxin Liang Gengqiao Hu Yinhai Wang 《Journal of Rare Earths》 SCIE EI CAS CSCD 2018年第8期789-794,共6页
A series of Ln^3+(Ln^3+= Er^3+/Dy^3+) ions doped Na2 NbAlO5(NNAO) phosphors were synthesized by solidstate method. The Er^3+ and Dy^3+ ions doped phosphors were characterized by XRD, photoluminescence(PL) ... A series of Ln^3+(Ln^3+= Er^3+/Dy^3+) ions doped Na2 NbAlO5(NNAO) phosphors were synthesized by solidstate method. The Er^3+ and Dy^3+ ions doped phosphors were characterized by XRD, photoluminescence(PL) and decay profiles. The Ln^3+-doped samples are consistent with the pure NNAO phase which is analyzed by the X-ray diffraction result. The PL graphs show that the intensity of luminescence increases with the increasing doping concentrations up to their critical certain values and then decreases at higher concentrations due to the concentration quenching effect of Er^3+/Dy^3+ ions. The energy level diagrams containing the positions of 4 f and 5 d energy levels of Er^3+ and Dy^3+ ions have been established and studied. In addition, under the ultraviolet light, the prepared NNAO:xLn^3+(Ln^3+=Er^3+/Dy^3+) phosphors show the characteristic green(Er^3+), cyan(Dy^3+) emission, respectively. Under the excitation of 365 nm,the quantum efficiencies of NNAO:0.01 Er^3+ and NNAO:0.03 Dy^3+ phosphors are measured to be 61.7% and72.2%, respectively. The obtained results indicate that the new NNAO:xLn^3+(Ln^3+=Er^3+/Dy^3+) phosphors are promising applications in white-light emitting diodes field. 展开更多
关键词 PHOTOLUMINESCENCE Na2nbalo5 Energy transfer White LEDs Rare earths
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