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Measurement of the Residual Modal Reflectivity of AR Coating on a SLD
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作者 MA Dongge SHI Jiawei +2 位作者 LIU Mingda JIN Ensun GAO Dingsan(Jinn University, Changchun 130023, CHN) 《Semiconductor Photonics and Technology》 CAS 1996年第1期6-9,13,共5页
The superluminescent diode has been fabricated by applying an AR coating to the output facet of the semiconductor laser for the purpose of eliminating or suitably reducing the optical feedback. An exact method for mea... The superluminescent diode has been fabricated by applying an AR coating to the output facet of the semiconductor laser for the purpose of eliminating or suitably reducing the optical feedback. An exact method for measuring the modal reflectivity of the antireflection coating to a laser diode is described. It is based on measurements of the spectrum modulation depth of the resulting superluminescent diode output spectrum at arbitrary injection current, and modal reflectivity of less than 3 × 10-4 is obtained. 展开更多
关键词 Antireflection Coatings Optical Films Spectral Analysis optoelectronicdevices
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