Charge trap density and carrier mobility of perovskite materials are the critical properties of perovskite solar cells.The space charge limited current(SCLC)method,which measures a dark current–voltage(I-V)curve of a...Charge trap density and carrier mobility of perovskite materials are the critical properties of perovskite solar cells.The space charge limited current(SCLC)method,which measures a dark current–voltage(I-V)curve of a single-carrier device has found extensive use for studying the trap density and charge carrier mobility in perovskite materials.Herein,it was found that the electron-and hole-current in organo-lead perovskite-based single-carrier device undergoes significant hysteresis under forward and reverse scanning due to the mobile ions.In addition,it was also observed that measuring history has a detrimental effect on hysteresis resulting in possible overestimation or underestimation of the extracted electrical values from the SCLC measurement.In the forward/reverse scanning process,the mobile ionic defects enhance/shield the charge in the traps due to ionic charging/discharging,thereby increasing/reducing the interface barrier and net charge in the I-V scanning,which in turn affects the determination of transport properties of the carrier.These results raise quite a few doubts over the direct application of classical SCLC measurements for the accurate characterization of intrinsic transport properties of the mixed ionicelectronic perovskite.展开更多
本文介绍了硬脂酸与月桂酸按不同配比混合,制得了混合酸铅薄膜准晶体。X 射线衍射测量表明了它们的晶面间距(d)值随组分配比而呈线性变化的关系。为今后制取两种单一脂肪酸铅准晶 d 间隔中间值的薄膜准晶体提供了实验依据。使薄膜准晶...本文介绍了硬脂酸与月桂酸按不同配比混合,制得了混合酸铅薄膜准晶体。X 射线衍射测量表明了它们的晶面间距(d)值随组分配比而呈线性变化的关系。为今后制取两种单一脂肪酸铅准晶 d 间隔中间值的薄膜准晶体提供了实验依据。使薄膜准晶体的晶面间距达到可人为设计和组装的水平。展开更多
基金supported in part by the National Natural Science Foundation of China(6200406821607041+4 种基金12147219)the Zhejiang Provincial Natural Science Foundation of China(Y20F040001)the Natural Science Foundation of Huzhou City,China(2019YZ02)the Syracuse University Startup Fundthe U.S.-Egypt Science and Technology(S&T)Joint Fund。
文摘Charge trap density and carrier mobility of perovskite materials are the critical properties of perovskite solar cells.The space charge limited current(SCLC)method,which measures a dark current–voltage(I-V)curve of a single-carrier device has found extensive use for studying the trap density and charge carrier mobility in perovskite materials.Herein,it was found that the electron-and hole-current in organo-lead perovskite-based single-carrier device undergoes significant hysteresis under forward and reverse scanning due to the mobile ions.In addition,it was also observed that measuring history has a detrimental effect on hysteresis resulting in possible overestimation or underestimation of the extracted electrical values from the SCLC measurement.In the forward/reverse scanning process,the mobile ionic defects enhance/shield the charge in the traps due to ionic charging/discharging,thereby increasing/reducing the interface barrier and net charge in the I-V scanning,which in turn affects the determination of transport properties of the carrier.These results raise quite a few doubts over the direct application of classical SCLC measurements for the accurate characterization of intrinsic transport properties of the mixed ionicelectronic perovskite.
