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Electrical Characterization of the through Via in Package-on-Package with Interposer using Parameter Extraction Method
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作者 Young-Min Yoon No-Su Kim +2 位作者 Eun-Hyuk Kuak Jae-Kyung Wee Boo-Gyoun Kim 《Journal of Measurement Science and Instrumentation》 CAS 2010年第S1期160-163,共4页
This paper describes a method to extract electrical parameters of the through via in Package-on-Package(PoP)with interposer.Using the de-embedding technique electrical parameters of the through via are extracted.With ... This paper describes a method to extract electrical parameters of the through via in Package-on-Package(PoP)with interposer.Using the de-embedding technique electrical parameters of the through via are extracted.With the extracted electrical parameters of the through via,the effects of via height,the distance between signal and GND vias,and anti-pad clearance on the electrical characteristics are discussed. parameter extraction;de-embedding; Package-on-Package(PoP) 展开更多
关键词 PARAMETER EXTRACTION DE-EMBEDDING package-on-packa
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