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A METHOD FOR CORRECTING INTENSITY IN CONTINU-OUS SCANNING X-RAY STRESS MEASUREMENT
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作者 LI Jiabao HANG Zengqiao National Laboratory for Fatigue and Fracture of Materials,Institute of Metal Research,Academia Simca.Shenyang,China HE Jiawen Xi’an Jiaotong University,Xi’an,China 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 1992年第12期457-461,共5页
A set of absorption curves was priorly prepared on transparent films to fit the background and peak intensities in continuous scanning X-ray stress measurement.It may be better to correct both background and absorptio... A set of absorption curves was priorly prepared on transparent films to fit the background and peak intensities in continuous scanning X-ray stress measurement.It may be better to correct both background and absorption of pure diffraction intensity.Experimental results revealed this to be a reliable correction method. 展开更多
关键词 X-ray diffraction stress measurement intensity correction peak location
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