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RADIATION DAMAGES OF PHOTODEVICE AND ITS SUBSTRATE MATERIAL 被引量:1
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作者 李世清 张能立 《Nuclear Science and Techniques》 SCIE CAS CSCD 1993年第1期42-44,共3页
γ-radiation damage study of photodevice and its substrate shows that γ-radiation makes the light current, current amplification factor and respond time of devices decreased, dark current increased, but junction capa... γ-radiation damage study of photodevice and its substrate shows that γ-radiation makes the light current, current amplification factor and respond time of devices decreased, dark current increased, but junction capacitance unchanged basicly. The resistivity of substrate was slowly increased. The analysis of positron annihilation lifetime spectra demonstrated that the second lifetime component τ2 was reduced, but the corresponding intensity I2 raised. Those indicate the macroscopic and microscopic changes in substrate after γ-irradiation. 展开更多
关键词 IRRADIATION photodevice POSITRON ANNIHILATION
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