Based on the multi-slit method, a new method is introduced to measure the nonlinear force caused emittance growth in a RF photoinjector. It is possible to reconstruct the phase space of a beam under some conditions by...Based on the multi-slit method, a new method is introduced to measure the nonlinear force caused emittance growth in a RF photoinjector. It is possible to reconstruct the phase space of a beam under some conditions by the multi-slit method. Based on the reconstructed phase space, besides the emittance, the emittance growth from the distortion of the phase space can also be measured. The emittance growth results from the effects of nonlinear force acting on electron, which is very important for the high quality beam in a RF photoinjector.展开更多
Sharp phase interfaces and accurate temperature distributions are important criteria in the simulation of solid-liquid phase changes.The multi-relaxation-time lattice Boltzmann method(MRT-LBM)shows great numerical per...Sharp phase interfaces and accurate temperature distributions are important criteria in the simulation of solid-liquid phase changes.The multi-relaxation-time lattice Boltzmann method(MRT-LBM)shows great numerical performance during simulation;however,the value method of the relaxation parameters needs to be specified.Therefore,in this study,a random forest(RF)model is used to discriminate the importance of different relaxation parameters to the convergence,and a support vector machine(SVM)is used to explore the decision boundary of the convergent samples in each dimensional model.The results show that the convergence of the samples is consistent with the sign of the decision number,and two types of the numerical deviations appear,i.e.,the phase mushy zone and the non-physical heat transfer.The relaxation parameters chosen on the decision boundary can further suppress the numerical bias and improve numerical accuracy.展开更多
Properties of ferroelectric xBiInO3-(1-x)PbTiO3(xBI-(1-x)PT) thin films deposited on(101) SrRuO3/(200)Pt/(200) MgO substrates by rf magnetron sputtering method and effects of deposition conditions are inve...Properties of ferroelectric xBiInO3-(1-x)PbTiO3(xBI-(1-x)PT) thin films deposited on(101) SrRuO3/(200)Pt/(200) MgO substrates by rf magnetron sputtering method and effects of deposition conditions are investigated.The structures of the xBI-(1-x)PT films are characterized by x-ray diffraction and scanning electron microscopy.The results indicate that the thin films are grown with mainly(001) orientation. The chemical compositions of the films are analyzed by scanning electron probe and the results indicate that the loss phenomena of Pb and Bi elements depend on the pressure and temperature during the sputtering process.The sputtering parameters including target composition, substrate temperature, and gas pressure are adjusted to obtain optimum sputtering conditions. To decrease leakage currents,2 mol% La2 O3 is doped in the targets. The P-E hysteresis loops show that the optimized xBI-(1-x)PT(x = 0.24) film has high ferroelectricities with remnant polarization2 Pr = 80μC/cm2 and coercive electric field 2 EC = 300 kV/cm. The Curie temperature is about 640℃. The results show that the films have optimum performance and will have wide applications.展开更多
基金Project supported by the National Natural Science Foundation of China (Grant No 10347009).
文摘Based on the multi-slit method, a new method is introduced to measure the nonlinear force caused emittance growth in a RF photoinjector. It is possible to reconstruct the phase space of a beam under some conditions by the multi-slit method. Based on the reconstructed phase space, besides the emittance, the emittance growth from the distortion of the phase space can also be measured. The emittance growth results from the effects of nonlinear force acting on electron, which is very important for the high quality beam in a RF photoinjector.
基金the National Natural Science Foundation of China(Nos.12172017 and 12202021)。
文摘Sharp phase interfaces and accurate temperature distributions are important criteria in the simulation of solid-liquid phase changes.The multi-relaxation-time lattice Boltzmann method(MRT-LBM)shows great numerical performance during simulation;however,the value method of the relaxation parameters needs to be specified.Therefore,in this study,a random forest(RF)model is used to discriminate the importance of different relaxation parameters to the convergence,and a support vector machine(SVM)is used to explore the decision boundary of the convergent samples in each dimensional model.The results show that the convergence of the samples is consistent with the sign of the decision number,and two types of the numerical deviations appear,i.e.,the phase mushy zone and the non-physical heat transfer.The relaxation parameters chosen on the decision boundary can further suppress the numerical bias and improve numerical accuracy.
基金Supported by the National Natural Science Foundation of China under Grant No 11304160the Special Fund for Public Interest of China under Grant No 201510068,and the NUPTFC under Grant No NY215111
文摘Properties of ferroelectric xBiInO3-(1-x)PbTiO3(xBI-(1-x)PT) thin films deposited on(101) SrRuO3/(200)Pt/(200) MgO substrates by rf magnetron sputtering method and effects of deposition conditions are investigated.The structures of the xBI-(1-x)PT films are characterized by x-ray diffraction and scanning electron microscopy.The results indicate that the thin films are grown with mainly(001) orientation. The chemical compositions of the films are analyzed by scanning electron probe and the results indicate that the loss phenomena of Pb and Bi elements depend on the pressure and temperature during the sputtering process.The sputtering parameters including target composition, substrate temperature, and gas pressure are adjusted to obtain optimum sputtering conditions. To decrease leakage currents,2 mol% La2 O3 is doped in the targets. The P-E hysteresis loops show that the optimized xBI-(1-x)PT(x = 0.24) film has high ferroelectricities with remnant polarization2 Pr = 80μC/cm2 and coercive electric field 2 EC = 300 kV/cm. The Curie temperature is about 640℃. The results show that the films have optimum performance and will have wide applications.