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Analysis of tail bits generation of multilevel storage in resistive switching memory
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作者 Jing Liu Xiaoxin Xu +9 位作者 Chuanbing Chen Tiancheng Gong Zhaoan Yu Qing Luo Peng Yuan Danian Dong Qi Liu Shibing Long Hangbing Lv Ming Liu 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第11期626-629,共4页
The tail bits of intermediate resistance states(IRSs) achieved in the SET process(IRSS) and the RESET process(IRSR) of conductive-bridge random-access memory were investigated. Two types of tail bits were observ... The tail bits of intermediate resistance states(IRSs) achieved in the SET process(IRSS) and the RESET process(IRSR) of conductive-bridge random-access memory were investigated. Two types of tail bits were observed, depending on the filament morphology after the SET/RESET operation.(i) Tail bits resulting from lateral diffusion of Cu ions introduced an abrupt increase of device resistance from IRS to ultrahigh-resistance state, which mainly happened in IRSS.(ii) Tail bits induced by the vertical diffusion of Cu ions showed a gradual shift of resistance toward lower value. Statistical results show that more than 95% of tail bits are generated in IRSS. To achieve a reliable IRS for multilevel cell(MLC) operation, it is desirable to program the IRS in RESET operation. The mechanism of tail bit generation that is disclosed here provides a clear guideline for the data retention optimization of MLC resistive random-access memory cells. 展开更多
关键词 resistive random-access memory rram multilevel cell tail bits
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Carbon-based memristors for resistive random access memory and neuromorphic applications
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作者 Fan Yang Zhaorui Liu +3 位作者 Xumin Ding Yang Li Cong Wang Guozhen Shen 《Chip》 EI 2024年第2期11-44,共34页
As a typical representative of nanomaterials,carbon nanomaterials have attracted widespread attention in the construction of electronic devices owing to their unique physical and chemical properties,multi-dimensionali... As a typical representative of nanomaterials,carbon nanomaterials have attracted widespread attention in the construction of electronic devices owing to their unique physical and chemical properties,multi-dimensionality,multi-hybridization methods,and excellent electronic properties.Especially in the recent years,memristors based on carbon nanomaterials have flourished in the field of building non-volatile memory devices and neuromorphic applications.In the current work,the preparation methods and structural characteristics of carbon nanomaterials of different dimensions were systematically reviewed.Afterwards,in depth discussion on the structural characteristics and working mechanism of memristors based on carbon nanomaterials of different dimensions was conducted.Finally,the potential applications of carbon-based memristors in logic operations,neural network construction,artificial vision systems,artificial tactile systems,and multimodal perception systems were also introduced.It is believed that this paper will provide guidance for the future development of high-quality information storage,high-performance neuromorphic applications,and highsensitivity bionic sensing based on carbon-based memristors. 展开更多
关键词 Carbon nanomaterials MEMRISTOR resistive random access memory(rram) Neuromorphic device
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Bipolar resistive switching in Cr-doped TiO_x thin films 被引量:1
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作者 邢钟文 A.Ignatievb 《Chinese Physics B》 SCIE EI CAS CSCD 2011年第9期435-438,共4页
The electric-pulse-induced resistive switching effect is studied for Tio.s5Cro.15Ox (TCO) films grown on Ir-Si substrates by pulsed laser deposition. Such a TCO device exhibits bipolar switching behaviour with an el... The electric-pulse-induced resistive switching effect is studied for Tio.s5Cro.15Ox (TCO) films grown on Ir-Si substrates by pulsed laser deposition. Such a TCO device exhibits bipolar switching behaviour with an electric-pulse- induced resistance ratio as large as about 1000% and threshold voltages smaller than 2 V. The resistive switching characteristics may be understood by resistance changes of a Schottky junction composed of a metal and an n-type semiconductor, and its nonvolatility is attributed to the movement of oxygen vacancies near the interface. 展开更多
关键词 resistive random-access memory rram electrical-pulse-induced resistive (EPIR)
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一种基于斯坦福RRAM模型的参数提取方法
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作者 孙海燕 张硕 +1 位作者 张晓波 戴澜 《半导体技术》 CAS 北大核心 2022年第8期670-675,共6页
阻变随机存取存储器(RRAM)是一种新型非易失性存储器件,比主流的闪存(Flash)器件具有更快的读/写速度、更低的编程电压和功耗。然而由于工艺不成熟等因素,RRAM准确的器件模型需要在已有的斯坦福物理模型基础上,对多达6个曲线拟合参数反... 阻变随机存取存储器(RRAM)是一种新型非易失性存储器件,比主流的闪存(Flash)器件具有更快的读/写速度、更低的编程电压和功耗。然而由于工艺不成熟等因素,RRAM准确的器件模型需要在已有的斯坦福物理模型基础上,对多达6个曲线拟合参数反复进行调整,具有一定的建模难度。提出了一种简并参数的建模方法,通过器件实测数据计算出其中4个曲线拟合参数I_(0)、g_(0)、γ_(0)、β。该方法大大降低了将物理模型适配为实际模型的建模难度,且由于基于实测数据,该建模方法理论上对不同工艺具有适配性。最后在不同工艺条件下制作了基于HfO_(x)材料的RRAM器件,并验证了该方法的有效性、先进性和准确性。 展开更多
关键词 阻变随机存取存储器(rram) 非易失性存储器 器件模型 HfOx材料 导电细丝理论
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Cu12Sb4S13量子点的光照增强阻变性能
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作者 王志青 陈彬彬 +4 位作者 沈杰 陈文 刘曰利 龚少康 周静 《高等学校化学学报》 SCIE EI CAS CSCD 北大核心 2020年第8期1908-1916,共9页
采用热注入法制备了粒径为7.9 nm的Cu12Sb4S13量子点(CAS QDs),并利用旋涂法在室温下制备了结构为FTO/CAS QDs/Au(其中FTO为导电玻璃)的阻变存储器(RRAM).在光照条件下,该三明治结构的RRAM呈现典型的双极性阻变开关特征,具有-0.38 V/0.4... 采用热注入法制备了粒径为7.9 nm的Cu12Sb4S13量子点(CAS QDs),并利用旋涂法在室温下制备了结构为FTO/CAS QDs/Au(其中FTO为导电玻璃)的阻变存储器(RRAM).在光照条件下,该三明治结构的RRAM呈现典型的双极性阻变开关特征,具有-0.38 V/0.42 V的低工作电压和105的高阻变开关比,并表现出优异的数据保持性和耐久性.在持续工作1.4×106s和经过104次快速读取后,器件阻变性能变化率小于0.1%.在光照和电场共同作用下,S2-导电通道的形成与破坏和FTO/CAS QDs界面肖特基势垒高度的调制是FTO/CAS QDs/Au在高阻态与低阻态之间转变的原因. 展开更多
关键词 光照 全无机Cu12Sb4S13量子点 阻变性能 阻变存储器
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