By means of low-temperature （10 K） Fourier transform infrared absorption spectroscopy, the kinetics of nitrogen indiffusion in Czochralski （CZ） silicon annealed at 1150-1250℃ in nitrogen ambient is investigated. ...By means of low-temperature （10 K） Fourier transform infrared absorption spectroscopy, the kinetics of nitrogen indiffusion in Czochralski （CZ） silicon annealed at 1150-1250℃ in nitrogen ambient is investigated. Moreover, the nitrogen diffusivities in CZ silicon at elevated temperatures deduced herein are in good agreement with those previously obtained in float-zone silicon, thus leading to the conclusion that the nitrogen indiffusion in CZ silicon at elevated temperatures is via nitrogen pairs.展开更多
基金the National Natural Science Foundation of China under Grant No 50672085, the Programme for Changjiang and Innovative Research Team of China under Grant No 0651, and the Programme for New Century Excellent Talents in University under Grant No 040537. The author is grateful Dr J. Vonhellmont at the University of Gent, Belgium for helpful discussion.
文摘By means of low-temperature （10 K） Fourier transform infrared absorption spectroscopy, the kinetics of nitrogen indiffusion in Czochralski （CZ） silicon annealed at 1150-1250℃ in nitrogen ambient is investigated. Moreover, the nitrogen diffusivities in CZ silicon at elevated temperatures deduced herein are in good agreement with those previously obtained in float-zone silicon, thus leading to the conclusion that the nitrogen indiffusion in CZ silicon at elevated temperatures is via nitrogen pairs.
