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On-line full scan inspection of particle size and shape using digital image processing 被引量:10
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作者 Chih-Wei Liao Jiun-Hung Yu Yeong-Shin Tarng 《Particuology》 SCIE EI CAS CSCD 2010年第3期286-292,共7页
An on-line full scan inspection system is developed for particle size analysis. A particle image is first obtained through optical line scan technology and is then analyzed using digital image processing. The system i... An on-line full scan inspection system is developed for particle size analysis. A particle image is first obtained through optical line scan technology and is then analyzed using digital image processing. The system is composed of a particle separation module, an image acquisition module, an image processing module, and an electric control module. Experiments are carried out using non-uniform 0.1 mm particles. The main advantage of this system consists of a full analysis of particles without any overlap or miss, thus improving the Area Scan Charge Coupled Device (CCD) acquisition problems. Particle size distribution, roundness, and sphericity can be obtained using the system with a deviation of repeated precision of around ±1%. The developed system is shown to be also convenient and versatile for any particle size and shape for academic and industrial users. 展开更多
关键词 Particle size distribution Particle characterization Image analysis Line scan CCD Automatic inspection
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Assessment of wear micromechanisms on a laser textured cemented carbide tool during abrasive-like machining by FIB/FESEM
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作者 Shiqi FANG Dirk BÄHRE Luis LLANES 《Friction》 SCIE EI CAS CSCD 2021年第3期656-664,共9页
The combined use of focused ion beam(FIB)milling and field-emission scanning electron microscopy inspection(FESEM)is a unique and successful approach for assessment of near-surface phenomena at specific and selected l... The combined use of focused ion beam(FIB)milling and field-emission scanning electron microscopy inspection(FESEM)is a unique and successful approach for assessment of near-surface phenomena at specific and selected locations.In this study,a FIB/FESEM dual-beam platform was implemented to docment and analyze the wear micromechanisms on a laser-surface textured(LST)hardmetal(HM)tool.In particular,changes in surface and microstructural integrity of the laser-sculptured pyramids(effective cutting microfeatures)were characterized after testing the LST-HM tool against a steel workpiece in a workbench designed to simulate an external honing process.It was demonstrated that:(1)laser-surface texturing does not degrade the intrinsic surface integrity and tool effectiveness of HM pyramids;and(2)there exists a correlation between the wear and loading of shaped pyramids at the local level.Hence,the enhanced performance of the laser-textured tool should consider the pyramid geometry aspects rather than the microstructure assemblage of the HM grade used,at least for attempted abrasive applications. 展开更多
关键词 focused ion beam(FIB) field-emission scanning electron microscopy inspection(FESEM) cemented carbides laser surface texturing abrasive machining processes WEAR
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