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Microstructure and secondary phases in epitaxial LaBaCo_2O_(5.5 + δ) thin films
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作者 Jiangbo Lu Lu Lu +2 位作者 Sheng Cheng Ming Liu Chunlin Jia 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2018年第2期398-402,共5页
Aberration-corrected scanning transmission electron microscopy was employed to investigate the microstructures and secondary phases in LaBaCo2O5.5+δ(LBCO) thin films grown on SrTiO3 (STO) substrates. The as-grow... Aberration-corrected scanning transmission electron microscopy was employed to investigate the microstructures and secondary phases in LaBaCo2O5.5+δ(LBCO) thin films grown on SrTiO3 (STO) substrates. The as-grown films showed an epitaxial growth on the substrates with atomically sharp interfaces and orientation relationships of [100]LBCO//[100]STO and (001)LBCO//(001)STO. Secondary phases were observed in the films, which strongly depended on the sample fabrication conditions. In the film prepared at a temperature of 900 ℃, nano-scale CoO pillars nucleated on the substrate, and grew along the [001] direction of the film. In the film grown at a temperature of 1000 ℃, isolated nano-scale C0304 particles appeared, which promoted the growth of {111 } twinning structures in the film. The orientation relationships and the interfaces between the secondary phases and the films were illustrated, and the growth mechanism of the film was discussed. 展开更多
关键词 Nano-structure Faceted interfaces secondary phase growth Epitaxial thin film Microstructure Aberration-corrected scanning transmission electron microscopy
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