Interconnections in microelectronic packaging are not only the physical carrier to realize the function of electronic circuits,but also the weak spots in reliability tests.Most of failures in power devices are caused ...Interconnections in microelectronic packaging are not only the physical carrier to realize the function of electronic circuits,but also the weak spots in reliability tests.Most of failures in power devices are caused by the malfunction of interconnections,including failure of bonding wire as well as cracks of solder layer.In fact,the interconnection failure of power devices is the result of a combination of factors such as electricity,temperature,and force.It is significant to investigate the failure mechanisms of various factors for the failure analysis of interconnections in power devices.This paper reviews the main failure modes of bonding wire and solder layer in the interconnection structure of power devices,and its failure mechanism.Then the reliability test method and failure analysis techniques of interconnection in power device are introduced.These methods are of great significance to the reliability analysis and life prediction of power devices.展开更多
An issue to distinguish sensitive parameters of storage life prior to the failure of a bridgewire electro-(explosive) device (EED) is studied. The degradations of bridgewire resistance, 50% firing current, ignition de...An issue to distinguish sensitive parameters of storage life prior to the failure of a bridgewire electro-(explosive) device (EED) is studied. The degradations of bridgewire resistance, 50% firing current, ignition delay time, bridgewire molten time and powder color with the storage time were measured under a simulating accelerated life test of high-temperature and high-humidity. The most sensitive parameter suitable to evaluate the EED storage life is discussed. It is concluded that the standard deviation of resistance change is the most sensitive degradation variable, and the next is bridgewire molten time, 50% firing current and ignition delay time. The mean of resistance is an insensitive degradation parameter.展开更多
基金supported by the National Natural Science Foundation of China(Grant No.61904127 and 62004144)Guangdong Basic and Applied Basic Research Foundation(Grant No.2021A1515010651)+2 种基金Fundamental Research Funds for the Central Universities(Grant No.202401002,203134004,20212VA100 and 2021VB006)Hubei Provincial Natural Science Foundation of China(Grant No.2020CFA032)National Key R&D Program of China(Grant No.2019YFB1704600)。
文摘Interconnections in microelectronic packaging are not only the physical carrier to realize the function of electronic circuits,but also the weak spots in reliability tests.Most of failures in power devices are caused by the malfunction of interconnections,including failure of bonding wire as well as cracks of solder layer.In fact,the interconnection failure of power devices is the result of a combination of factors such as electricity,temperature,and force.It is significant to investigate the failure mechanisms of various factors for the failure analysis of interconnections in power devices.This paper reviews the main failure modes of bonding wire and solder layer in the interconnection structure of power devices,and its failure mechanism.Then the reliability test method and failure analysis techniques of interconnection in power device are introduced.These methods are of great significance to the reliability analysis and life prediction of power devices.
文摘An issue to distinguish sensitive parameters of storage life prior to the failure of a bridgewire electro-(explosive) device (EED) is studied. The degradations of bridgewire resistance, 50% firing current, ignition delay time, bridgewire molten time and powder color with the storage time were measured under a simulating accelerated life test of high-temperature and high-humidity. The most sensitive parameter suitable to evaluate the EED storage life is discussed. It is concluded that the standard deviation of resistance change is the most sensitive degradation variable, and the next is bridgewire molten time, 50% firing current and ignition delay time. The mean of resistance is an insensitive degradation parameter.
