In this work, we succeeded in the preparation of LiNb 1- x Ta x O 3 films on Si(111) substrates by means of sol gel process, and the usual sol gel process for the preparation of LiNbO 3 and LiTaO 3 films on Si substra...In this work, we succeeded in the preparation of LiNb 1- x Ta x O 3 films on Si(111) substrates by means of sol gel process, and the usual sol gel process for the preparation of LiNbO 3 and LiTaO 3 films on Si substrates was improved by adding a 33% aqueous solution of CH 3CH 2OH to the mixed sols of LiNb(OCH 2CH 3) 6 and LiTa(OCH 2CH 3) 6 . The crystallization behavior of LiNb 1- x Ta x O 3 films on Si(111) substrates has been studied. Highly c axis oriented LiNb 1- x Ta x O 3 films have been obtained within the tantalum composition range of \{0< x <0 33\}. Some factors such as the hydrogen termination of the silicon surface, the RTP annealing process that provides the unidirectional heat flow and the preheating temperature are discussed to analyze the crystallization of the c axis oriented films.展开更多
Li 2+ x RE x Si 1- x O 3(RE=Pr, Nd, Sm, Gd; x =0～0 15) samples were prepared by the sol gel method. DTA TG, XRD, TEM and A C impedance techniques were used to investigate the structure, sha...Li 2+ x RE x Si 1- x O 3(RE=Pr, Nd, Sm, Gd; x =0～0 15) samples were prepared by the sol gel method. DTA TG, XRD, TEM and A C impedance techniques were used to investigate the structure, shape, and ionic conductivity of these samples. The results show that the range of solid solution formation is in 0< x ≤0 09, in which the conductivity of these samples raises with the increasing amount of RE 2O 3 (RE=Pr, Nd, Sm, Gd) added, and the diameter of the powders is about 100 nm. Compared with the conventional solid state reaction, the sol gel method needs low temperature and presents high ionic conductivity.展开更多
Roman scattering measurement of （ 1 - x ） GeS2-x Ga2S3 system glasses was conducted in order to understand the microstructural change caused by the addition of Ga2S3 . According to the change of Raman spectra with t...Roman scattering measurement of （ 1 - x ） GeS2-x Ga2S3 system glasses was conducted in order to understand the microstructural change caused by the addition of Ga2S3 . According to the change of Raman spectra with the addition of Ga2S3, two main structural transformations were deduced ： the gradual enhancement of ethane- like structural units S3 Ge- GeS3 （ 250 cm ^- 1） and S3 Ga- GaS3 （270 cm ^- 1 ） and the appearance of charge imbalanced units [ Ga2 S2 （ S1/2 ）4 ]^2- and [Ga（ S1/2 ）4 ]^- . And this change of structural aspect seems to give as a clue to understanding the cause of the increased rare-earth solubility.展开更多
为研究深亚微米尺度下应变 Si Ge沟改进 PMOSFET器件性能的有效性 ,运用二维数值模拟程序MEDICI模拟和分析了 0 .1 8μm有效沟长 Si Ge PMOS及 Si PMOS器件特性。Si Ge PMOS垂直方向采用 Si/Si Ge/Si结构 ,横向结构同常规 PMOS,N+ -pol...为研究深亚微米尺度下应变 Si Ge沟改进 PMOSFET器件性能的有效性 ,运用二维数值模拟程序MEDICI模拟和分析了 0 .1 8μm有效沟长 Si Ge PMOS及 Si PMOS器件特性。Si Ge PMOS垂直方向采用 Si/Si Ge/Si结构 ,横向结构同常规 PMOS,N+ -poly栅结合 P型δ掺杂层获得了合理阈值电压及空穴局域化。研究表明 ,经适当设计的 Si Ge PMOS比对应 Si PMOS的 IDmax、gm、f T均提高 1 0 0 %以上 ,表明深亚微米尺度 Si展开更多
基金Supported by the National Natural Science Foundation of China(No.2 0 1710 15 )
文摘In this work, we succeeded in the preparation of LiNb 1- x Ta x O 3 films on Si(111) substrates by means of sol gel process, and the usual sol gel process for the preparation of LiNbO 3 and LiTaO 3 films on Si substrates was improved by adding a 33% aqueous solution of CH 3CH 2OH to the mixed sols of LiNb(OCH 2CH 3) 6 and LiTa(OCH 2CH 3) 6 . The crystallization behavior of LiNb 1- x Ta x O 3 films on Si(111) substrates has been studied. Highly c axis oriented LiNb 1- x Ta x O 3 films have been obtained within the tantalum composition range of \{0< x <0 33\}. Some factors such as the hydrogen termination of the silicon surface, the RTP annealing process that provides the unidirectional heat flow and the preheating temperature are discussed to analyze the crystallization of the c axis oriented films.
文摘Li 2+ x RE x Si 1- x O 3(RE=Pr, Nd, Sm, Gd; x =0～0 15) samples were prepared by the sol gel method. DTA TG, XRD, TEM and A C impedance techniques were used to investigate the structure, shape, and ionic conductivity of these samples. The results show that the range of solid solution formation is in 0< x ≤0 09, in which the conductivity of these samples raises with the increasing amount of RE 2O 3 (RE=Pr, Nd, Sm, Gd) added, and the diameter of the powders is about 100 nm. Compared with the conventional solid state reaction, the sol gel method needs low temperature and presents high ionic conductivity.
文摘Roman scattering measurement of （ 1 - x ） GeS2-x Ga2S3 system glasses was conducted in order to understand the microstructural change caused by the addition of Ga2S3 . According to the change of Raman spectra with the addition of Ga2S3, two main structural transformations were deduced ： the gradual enhancement of ethane- like structural units S3 Ge- GeS3 （ 250 cm ^- 1） and S3 Ga- GaS3 （270 cm ^- 1 ） and the appearance of charge imbalanced units [ Ga2 S2 （ S1/2 ）4 ]^2- and [Ga（ S1/2 ）4 ]^- . And this change of structural aspect seems to give as a clue to understanding the cause of the increased rare-earth solubility.
文摘为研究深亚微米尺度下应变 Si Ge沟改进 PMOSFET器件性能的有效性 ,运用二维数值模拟程序MEDICI模拟和分析了 0 .1 8μm有效沟长 Si Ge PMOS及 Si PMOS器件特性。Si Ge PMOS垂直方向采用 Si/Si Ge/Si结构 ,横向结构同常规 PMOS,N+ -poly栅结合 P型δ掺杂层获得了合理阈值电压及空穴局域化。研究表明 ,经适当设计的 Si Ge PMOS比对应 Si PMOS的 IDmax、gm、f T均提高 1 0 0 %以上 ,表明深亚微米尺度 Si
