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Influence of Pressure on SiNx:H Film by LF-PECVD
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作者 闻震利 曹晓宁 +1 位作者 周春兰 王文静 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 2012年第1期110-114,I0004,共6页
Hydrogenated silicon nitride films as an effective antireflection and passivation coating of silicon solar cell were prepared on p-type polished silicon substrate (1.0 f^em) by direct LF-PECVD (low frequency plasma... Hydrogenated silicon nitride films as an effective antireflection and passivation coating of silicon solar cell were prepared on p-type polished silicon substrate (1.0 f^em) by direct LF-PECVD (low frequency plasma enhanced chemical vapor deposition) of Centrotherm. The preferable passivation effect was obtained and the refractive index was in the range of 2.017-2.082. The refractive index of the hydrogenated silicon nitride films became larger with the increase of the pressure. Fourier transform infrared spectroscopy was used to study the pressure influence on the film structural properties. The results highlighted high hydrogen bond and high Si-N bonds density in the film, which were greatly influenced by the pressure. The passivation effect of the films was infuenced by the Si dangling bonds density. Finally the effective minority liftetime degradation with time was shown and discussed by considering the relationship between the structural properties and passivation. 展开更多
关键词 sinx:h thin film PRESSURE PASSIVATION Structural properties
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Method of measuring one-dimensional photonic crystal period-structure-film thickness based on Bloch surface wave enhanced Goos–H?nchen shift
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作者 郎垚璞 刘庆纲 +2 位作者 王奇 周兴林 贾光一 《Chinese Physics B》 SCIE EI CAS CSCD 2023年第1期545-552,共8页
This paper puts forward a novel method of measuring the thin period-structure-film thickness based on the Bloch surface wave(BSW) enhanced Goos–Hanchen(GH) shift in one-dimensional photonic crystal(1DPC). The BSW phe... This paper puts forward a novel method of measuring the thin period-structure-film thickness based on the Bloch surface wave(BSW) enhanced Goos–Hanchen(GH) shift in one-dimensional photonic crystal(1DPC). The BSW phenomenon appearing in 1DPC enhances the GH shift generated in the attenuated total internal reflection structure. The GH shift is closely related to the thickness of the film which is composed of layer-structure of 1DPC. The GH shifts under multiple different incident light conditions will be obtained by varying the wavelength and angle of the measured light, and the thickness distribution of the entire structure of 1DPC is calculated by the particle swarm optimization(PSO) algorithm.The relationship between the structure of a 1DPC film composed of TiO_(2) and SiO_(2) layers and the GH shift, is investigated.Under the specific photonic crystal structure and incident conditions, a giant GH shift, 5.1 × 10^(3) times the wavelength of incidence, can be obtained theoretically. Simulation and calculation results show that the thickness of termination layer and periodic structure bilayer of 1DPC film with 0.1-nm resolution can be obtained by measuring the GH shifts. The exact structure of a 1DPC film is innovatively measured by the BSW-enhanced GH shift. 展开更多
关键词 thin film thickness Bloch surface wave(BSW) Goos–h?nchen shift photonic crystal
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The influence of SiNx substrate on crystallinity of μc-Si film used in thin film transistors
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作者 李娟 吴春亚 +4 位作者 刘建平 赵淑芸 孟志国 熊绍珍 张丽珠 《Chinese Physics B》 SCIE EI CAS CSCD 2006年第6期1330-1334,共5页
This paper found that the crystalline volume ratio (Xc) of μc-Si deposited on SiNx substrate is higher than that on 7059 glass. At the same silane concentration (SC) (for example, at SC=2%), the Xc of μc-Si de... This paper found that the crystalline volume ratio (Xc) of μc-Si deposited on SiNx substrate is higher than that on 7059 glass. At the same silane concentration (SC) (for example, at SC=2%), the Xc of μc-Si deposited on SiNx is more than 64%, but just 44% if deposited on Conning 7059. It considered that the ‘hills' on SiNx substrate would promote the crystalline growth of μc-Si thin film, which has been confirmed by atomic force microscope (AFM) observation. Comparing several thin film transistor (TFT) samples whose active-layer were deposited under various SC, this paper found that the appropriate SC for the μc-Si thin film used in TFT as active layer should be more than 2%, and Xc should be around 50%. Additionally, the stability comparison of μc-Si TFT and a-Si TFT is shown in this paper. 展开更多
关键词 μc-Si:h thin film sinx substrate CRYSTALLINITY bottom-gate TFT
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Mechanical Properties of Composite SiNx/DLC Films Prepared by Filtered Cathodic Arc of Graphite Incorporated with RF Sputtering of Silicon Nitride
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作者 Phuwanai Bunnak Yongping Gong +2 位作者 Supanee Limsuwan Artorn Pokaipisit Pichet Limsuwan 《Materials Sciences and Applications》 2013年第9期564-571,共8页
Composite SiNx/DLC films were deposited on Si substrate by RF magnetron sputtering of silicon nitride (Si3N4) target simultaneously with filtered cathode arc (FCA) of graphite. The RF power was fixed at 100 W whereas ... Composite SiNx/DLC films were deposited on Si substrate by RF magnetron sputtering of silicon nitride (Si3N4) target simultaneously with filtered cathode arc (FCA) of graphite. The RF power was fixed at 100 W whereas the arc currents of FCA were 20, 40, 60 and 80 A. The effects of arc current on the structure, surface roughness, density and mechanical properties of SiNx/DLC films were investigated. The results show that the arc current in the studied range has effect on the structure, surface roughness, density and mechanical properties of composite SiNx/DLC films. The composite SiNx/DLC films show the sp3 content between 53.5% and 66.7%, density between 2.54 and2.98 g/cm3, stress between 1.7 and 2.2 GPa, and hardness between 35 and 51 GPa. Furthermore, it was found that the density, stress and hardness correlate linearly with the sp3 content for composite SiNx/DLC films. 展开更多
关键词 Silicon NITRIDE DIAMOND-LIKE Carbon COMPOSITE sinx/DLC film Filtered Cathodic arc
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Growth Rate of a-Si∶H Film Influenced by Magnetic Field Gradient in MWECR CVD Plasma System 被引量:2
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作者 胡跃辉 吴越颖 +3 位作者 陈光华 王青 张文理 阴生毅 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2004年第6期613-619,共7页
The magnetic field profiles,which are produced by three ways in the deposition chamber and plasma chamber of single coil divergent field MWECR CVD system,are investigated.The magnetic field gradient of these magnetic ... The magnetic field profiles,which are produced by three ways in the deposition chamber and plasma chamber of single coil divergent field MWECR CVD system,are investigated.The magnetic field gradient of these magnetic field profiles is obtained quantitatively by using Lorentz fit.The results indicate that the gradient value of the magnetic field profile near by the substrate,which is produced by a coil current with 137.7A if a SmCo permanent magnet is equipped under the substrate holder,is the largest;when the SmCo permanent magnet is taken away,the larger one is produced by the coil current with 137.7A and the smallest one produced by a coil current with 115.2A.High deposition rate of a-Si∶H film is observed near by the substrate with high magnetic field gradient.But uneven deposition rate along the radius of the sample holder is also found by infrared analysis technology when sample is deposited in magnetic field profile,which is produced by the coil current with 137.7A if the SmCo permanent magnet is equipped under the substrate holder. 展开更多
关键词 magnetic field gradient Lorentz fit a-Si∶h film deposition rate MWECR CVD deposition system
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Fabrication of Hydrogenated Microcrystalline Silicon Thin Films at Low Temperature by VHF-PECVD
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作者 杨恢东 吴春亚 +7 位作者 麦耀华 李洪波 薛俊明 李岩 任慧智 张丽珠 耿新华 熊绍珍 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2002年第9期902-908,共7页
Using H 2 diluted silane,series of μc Si∶H films are fabricated at low temperature with VHF PECVD.The thickness measurements reveal that the deposition rates are obviously enhanced with higher plasma excitation ... Using H 2 diluted silane,series of μc Si∶H films are fabricated at low temperature with VHF PECVD.The thickness measurements reveal that the deposition rates are obviously enhanced with higher plasma excitation frequency or working pressure,but increase firstly and then decrease with the increase of plasma power density.Raman spectra show that the crystallinity and the average grain sizes of the films strongly depend on the temperature of substrate and the concentration of silane.However,the plasma excitation frequency only has effect on the crystallinity,and a maximum occurs during the further increase of plasma excitation frequency.From XRD and TEM experiments,three preferential crystalline orientations (111),(220) and (311) are observed,and the average grain sizes are different for every crystalline orientation. 展开更多
关键词 μc Si∶h thin films VhF PECVD deposition rate CRYSTALLINITY
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晶体硅太阳能电池PECVD SiNx:H薄膜工艺研究 被引量:3
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作者 刘丽琴 《新技术新工艺》 2009年第12期121-123,共3页
通过在工业化生产线上研究了PECVD法沉积Si Nx:H薄膜过程中工艺温度和气体流量对其厚度和折射率的影响、工艺气体流量和射频功率对晶体硅太阳能电池光电转换效率、开路电压以及短路电流的影响,最后研究了PECVD对不同类型晶体硅电池的钝... 通过在工业化生产线上研究了PECVD法沉积Si Nx:H薄膜过程中工艺温度和气体流量对其厚度和折射率的影响、工艺气体流量和射频功率对晶体硅太阳能电池光电转换效率、开路电压以及短路电流的影响,最后研究了PECVD对不同类型晶体硅电池的钝化效果。结果表明,随着气体Si H4流量增加,Si Nx:H膜的厚度和折射率上升;随着温度上升,Si Nx:H膜的厚度先上升后下降,折射率无明显变化规律;对于多晶硅太阳能电池,工艺气体NH3与Si H4流量比为11时,光电转换效率最高,随着射频功率从2800W增至4200W,光电转换效率先上升后下降,3700W时达到峰值;Direct Plasma PECVD对多晶硅太阳能电池的钝化效果好于对单晶硅太阳能电池。 展开更多
关键词 晶体硅太阳能电池 PECVD sinx:h
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Influence of reaction gas flows on the properties of SiGe:H thin film prepared by plasma assisted reactive thermal chemical vapour deposition 被引量:4
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作者 张丽平 张建军 +3 位作者 尚泽仁 胡增鑫 耿新华 赵颖 《Chinese Physics B》 SCIE EI CAS CSCD 2008年第9期3448-3452,共5页
A new preparing technology, very high frequency plasma assisted reactive thermal chemical vapour deposition (VHFPA-RTCVD), is introduced to prepare SiGe:H thin films on substrate kept at a lower temperature. In the... A new preparing technology, very high frequency plasma assisted reactive thermal chemical vapour deposition (VHFPA-RTCVD), is introduced to prepare SiGe:H thin films on substrate kept at a lower temperature. In the previous work, reactive thermal chemical vapour deposition (I^TCVD) technology was successfully used to prepare SiGe:H thin films, but the temperature of the substrate needed to exceed 400℃. In this work, very high frequency plasma method is used to assist RTCVD technology in reducing the temperature of substrate by largely enhancing the temperature of reacting gases on the surface of the substrate. The growth rate, structural properties, surface morphology, photo- conductivity and dark-conductivity of SiGe:H thin films prepared by this new technology are investigated for films with different germanium concentrations, and the experimental results are discussed. 展开更多
关键词 SiGe:h thin film plasma assisted RTCVD growth rates optoelectronics property
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Nanocomposite TiC/a-C:H film prepared on titanium aluminium alloy substrates by PSII assistant MW-ECRCVD 被引量:2
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作者 马国佳 刘喜亮 +2 位作者 张华芳 武洪臣 彭丽平 《Chinese Physics B》 SCIE EI CAS CSCD 2007年第4期1105-1110,共6页
Thin films of titanium carbide and amorphous hydrogenated carbon have been synthesized on titanium aluminium alloy substrates by PSII assisted MW-ECRCVD with a mirror field. The microstructure, chemical composition an... Thin films of titanium carbide and amorphous hydrogenated carbon have been synthesized on titanium aluminium alloy substrates by PSII assisted MW-ECRCVD with a mirror field. The microstructure, chemical composition and mechanical property were investigated. Using XPS and TEM, the films were identified to be a-C:H film containing TiC nanometre grains (namely, the so-called nanocomposite structure). The size of TiC grains of nanocomposite TiC/DLC film is about 5 nm. The nanocomposite structure has obvious improvement in the mechanical properties of DLC film. The hardness of a-C:H film with Ti is enhanced to 34 G Pa~ while that of a-C:H film without Ti is about 12 G Pa, and the coherent strength is also obviously enhanced at the critical load of about 35N. 展开更多
关键词 NANOCOMPOSITE TiC/a-C:h diamond like carbon film PSII
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Properties of oxide films grown on 25Cr20Ni alloy in air-H_2O and H_2-H_2O atmospheres 被引量:3
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作者 Wang Shenxiang Cui Lishan +3 位作者 Wang Guoqing Zheng Yanjun Wang Hongxia Jia Jingsheng 《Petroleum Science》 SCIE CAS CSCD 2014年第1期147-154,共8页
The oxidation kinetics,surface morphology and phase structure of oxide films grown on 25Cr20Ni alloy in air-H2O and H2-H2O atmospheres at 900 ℃ for 20 h were investigated.The anti-coking performance and resistance to... The oxidation kinetics,surface morphology and phase structure of oxide films grown on 25Cr20Ni alloy in air-H2O and H2-H2O atmospheres at 900 ℃ for 20 h were investigated.The anti-coking performance and resistance to carburization of the two oxide films were compared using 25Cr20Ni alloy tubes with an inner diameter of 10 mm and a length of 850 mm in a bench scale naphtha steam pyrolysis unit.The oxidation kinetics followed a parabolic law in an air-H2O atmosphere and a logarithm law in a H2-H2O atmosphere in the steady-state stage.The oxide film grown in the air-H2O atmosphere had cracks where the elements Fe and Ni were enriched and the un-cracked area was covered with octahedral-shaped MnCr2O4 spinels and Cr1.3Fe0.7O3 oxide clusters,while the oxide film grown in the H2-H2O atmosphere was intact and completely covered with dense standing blade MnCr2O4 spinels.In the pyrolysis tests,the anti-coking performance and resistance to carburization of the oxide film grown in the H2-H2O atmosphere were far better than that in the air-H2O atmosphere.The mass of coke formed in the oxide film grown in the H2-H2O atmosphere was less than 10% of that in the air-H2O atmosphere.The Cr1.3Fe0.7O3 oxide clusters converted into Cr23C6 carbides and the cracks were filled with carbon in the oxide film grown in the air-H2O atmosphere after repeated coking and decoking tests,while the dense standing blade MnCr2O4 spinels remained unchanged in the oxide film grown in the H2-H2O atmosphere.The ethylene,propylene and butadiene yields in the pyrolysis tests were almost the same for the two oxide films. 展开更多
关键词 25Cr20Ni alloy air-h2O h2-h2O oxide film ANTI-COKING resistance to carburization
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Research on the optimum hydrogenated silicon thin films for application in solar cells 被引量:1
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作者 雷青松 吴志猛 +3 位作者 耿新华 赵颖 孙健 奚建平 《Chinese Physics B》 SCIE EI CAS CSCD 2006年第12期3033-3038,共6页
Hydrogenated silicon (Si:H) thin films for application in solar ceils were deposited by using very high frequency plasma enhanced chemical vapour deposition (VHF PECVD) at a substrate temperature of about 170 ℃,... Hydrogenated silicon (Si:H) thin films for application in solar ceils were deposited by using very high frequency plasma enhanced chemical vapour deposition (VHF PECVD) at a substrate temperature of about 170 ℃, The electrical, structural, and optical properties of the films were investigated. The deposited films were then applied as i-layers for p-i-n single junction solar cells. The current-voltage (I - V) characteristics of the cells were measured before and after the light soaking. The results suggest that the films deposited near the transition region have an optimum properties for application in solar cells. The cell with an i-layer prepared near the transition region shows the best stable performance. 展开更多
关键词 hydrogenated silicon thin film transition region Si:h thin film solar cell STABILITY
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High-Pressure Plasma Deposition of a-C:H Films by Dielectric-Barrier Discharge 被引量:1
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作者 刘昌俊 李阳 +1 位作者 杜海燕 艾宝都 《Plasma Science and Technology》 SCIE EI CAS CSCD 2003年第1期1597-1602,共6页
The fabrication of a-C:H films from methane has been performed using dielectric-barrier discharges at atmospheric pressure. The effect of combined-feed gas, such as carbon dioxide, carbon monoxide or acetylene on the ... The fabrication of a-C:H films from methane has been performed using dielectric-barrier discharges at atmospheric pressure. The effect of combined-feed gas, such as carbon dioxide, carbon monoxide or acetylene on the formation of a-C:H films has been investigated. It has been demonstrated that the addition of carbon monoxide or acetylene into methane leads to a remarkable improvement in the fabrication of a-C:H films. The characterization of carbon film obtained has been conducted using FT-IR, Raman and SEM. 展开更多
关键词 METhANE DEPOSITION a-C:h films dielectric-barrier discharge
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Fabrication and characterization of iron and iron carbide thin films by plasma enhanced pulsed chemical vapor deposition 被引量:1
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作者 Yulian HU Xu TIAN +4 位作者 Qipeng FAN Zhengduo WANG Bowen LIU Lizhen YANG Zhongwei LIU 《Plasma Science and Technology》 SCIE EI CAS CSCD 2019年第10期54-60,共7页
A new pulsed chemical vapor deposition(PCVD) process has been developed to fabricate iron(Fe) and iron carbide(Fe1-xCx) thin films at low temperature range from 150 ℃ to 230 ℃.The process employs bis(1,4-di-ter... A new pulsed chemical vapor deposition(PCVD) process has been developed to fabricate iron(Fe) and iron carbide(Fe1-xCx) thin films at low temperature range from 150 ℃ to 230 ℃.The process employs bis(1,4-di-tert-butyl-1,3-diazabutadienyl)iron(Ⅱ) as iron source and hydrogen gas or hydrogen plasma as the coreactant.The films deposited with hydrogen gas are demonstrated polycrystalline with body-centered cubic Fe.However,for the films deposited with hydrogen plasma,the amorphous phase of iron carbide is obtained.The influence of the deposition temperature on iron and iron carbide characteristics have been investigated. 展开更多
关键词 Fe and Fe1-xCx filmS h2 plasma PULSED chemical vapor DEPOSITION
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反应磁控溅射制备h-BN薄膜及其日盲紫外探测器 被引量:1
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作者 武成 朱昭捷 +3 位作者 李坚富 涂朝阳 吕佩文 王燕 《人工晶体学报》 CAS 北大核心 2023年第5期798-804,共7页
随着电子信息技术的飞速发展,具有更高抗干扰能力以及更高灵敏度的日盲紫外探测器引起了广泛关注。六方相氮化硼(h-BN)凭借其超宽带隙、高光吸收系数、高热导率及高击穿场强等优势成为日盲紫外探测器研究的热点材料。此外,h-BN良好的机... 随着电子信息技术的飞速发展,具有更高抗干扰能力以及更高灵敏度的日盲紫外探测器引起了广泛关注。六方相氮化硼(h-BN)凭借其超宽带隙、高光吸收系数、高热导率及高击穿场强等优势成为日盲紫外探测器研究的热点材料。此外,h-BN良好的机械强度和光学透明性使其兼具柔性探测器的潜力。然而室温条件下制备的h-BN薄膜常具有较多缺陷,极大程度上限制了其柔性探测器的发展。本文在室温条件下采用反应磁控溅射,以B为生长源,在蓝宝石和Si衬底上实现了较高质量h-BN薄膜的制备,并在此薄膜的基础上制备了高性能日盲紫外探测器。3 V电压下,其探测器拥有极低的暗电流(0.07 pA)、较高的响应度(1.37μA/W)和探测率(2.73×10^(10)Jones)。本文的研究结果证实了室温制备h-BN薄膜及其日盲紫外探测器的可行性,为实现可在室温下工作的h-BN探测器的应用提供了参考。 展开更多
关键词 h-BN薄膜 反应溅射法 室温 日盲紫外探测器 光电性能 响应度
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Study on stability of hydrogenated amorphous silicon films 被引量:2
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作者 朱秀红 陈光华 +5 位作者 张文理 丁毅 马占洁 胡跃辉 何斌 荣延栋 《Chinese Physics B》 SCIE EI CAS CSCD 2005年第11期2348-2351,共4页
Hydrogenated amorphous silicon (a-Si:H) films with high and same order of magnitude photosensitivity (-10^5) but different stability were prepared by using microwave electron cyclotron resonance chemical vapour d... Hydrogenated amorphous silicon (a-Si:H) films with high and same order of magnitude photosensitivity (-10^5) but different stability were prepared by using microwave electron cyclotron resonance chemical vapour deposition system under the different deposition conditions. It was proposed that there was no direct correlation between the photosensitivity and the hydrogen content (CH) as well as H-Si bonding configurations, but for the stability, they were the critical factors. The experimental results indicated that higher substrate temperature, hydrogen dilution ratio and lower deposition rate played an important role in improving the microstructure of a-Si:H films. We used hydrogen elimination model to explain our experimental results. 展开更多
关键词 hydrogenated amorphous silicon (a-Si:h films PhOTOSENSITIVITY STABILITY microstructure hydrogen elimination hE) model
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Effect of substrate temperature on the growth and properties of boron-doped microcrystalline silicon films 被引量:1
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作者 雷青松 吴志猛 +3 位作者 耿新华 赵颖 孙健 奚建平 《Chinese Physics B》 SCIE EI CAS CSCD 2006年第1期213-218,共6页
Highly conductive boron-doped hydrogenated mieroerystalline silicon (μc-Si:H) films are prepared by very high frequency plasma enhanced chemical vapour deposition (VHF PECVD) at the substrate temperatures (Ts)... Highly conductive boron-doped hydrogenated mieroerystalline silicon (μc-Si:H) films are prepared by very high frequency plasma enhanced chemical vapour deposition (VHF PECVD) at the substrate temperatures (Ts) ranging from 90℃ to 270℃. The effects of Ts on the growth and properties of the films are investigated. Results indicate that the growth rate, the electrical (dark conductivity, carrier concentration and Hall mobility) and structural (crystallinity and grain size) properties are all strongly dependent on Ts. As Ts increases, it is observed that 1) the growth rate initially increases and then arrives at a maximum value of 13.3 nm/min at Ts=210℃, 2) the crystalline volume fraction (Xc) and the grain size increase initially, then reach their maximum values at TS=140℃, and finally decrease, 3) the dark conductivity (σd), carrier concentration and Hall mobility have a similar dependence on Ts and arrive at their maximum values at Ts-190℃. In addition, it is also observed that at a lower substrate temperature Ts, a higher dopant concentration is required in order to obtain a maximum σd. 展开更多
关键词 boron-doped μc-Si:h films VhF PECVD CRYSTALLINITY carrier concentration hall mobility
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Optical Characterization of Amorphous Hydrogenated Carbon(a-C:H)Thin Films Prepared by Single RF Plasma Method 被引量:1
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作者 Dogan MANSUROGLU Kadir GOKSEN Sinan BILIKMEN 《Plasma Science and Technology》 SCIE EI CAS CSCD 2015年第6期488-495,共8页
Methane (CH4) plasma was used to produce amorphous hydrogenated carbon (a- C:H) films by a single capacitively coupled radio frequency (RF) powered plasma system. The system consists of two parallel electrodes... Methane (CH4) plasma was used to produce amorphous hydrogenated carbon (a- C:H) films by a single capacitively coupled radio frequency (RF) powered plasma system. The system consists of two parallel electrodes: the upper electrode is connected to 13.56 MHz RF power and the lower one is connected to the ground. Thin films were deposited on glass slides with different sizes and on silicon wafers. The influence of the plasma species on film characteristics was studied by changing the plasma parameters. The changes of plasma species during the deposition were investigated by optical emission spectroscopy (OES). The structural and optical properties were analyzed via Fourier transform infrared (FTIR) spectroscopy, X-ray diffraction (XRD) and UV-visible spectroscopy, and the thicknesses of the samples were measured by a profilometer. The sp3/sp2 ratio and the existing H atoms play a significant role in the determination of the chemical properties of thin films in the plasma. The film quality and deposition rate were both increased by raising the power and the flow rate. 展开更多
关键词 a-C:h thin film plasma deposition methane plasma sp3/sp2 ratio
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Structure and tribological properties of Si/a-C:H(Ag)multilayer film in stimulated body fluid 被引量:1
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作者 Yan-Xia Wu Yun-Lin Liu +5 位作者 Ying Liu Bing Zhou Hong-Jun Hei Yong Ma Sheng-Wang Yu Yu-Cheng Wu 《Chinese Physics B》 SCIE EI CAS CSCD 2020年第11期412-419,共8页
Si/a-C:H(Ag)multilayer films with different modulation periods are prepared to test their potential applications in human body.The composition,microstructure,mechanical and tribological properties in the simulated bod... Si/a-C:H(Ag)multilayer films with different modulation periods are prepared to test their potential applications in human body.The composition,microstructure,mechanical and tribological properties in the simulated body fluid are investigated.The results show the concentration of Ag first decreases and then increases with the modulation period decreasing from 984 nm to 250 nm.Whereas the C content has an opposite variation trend.Notably,the concentration of Ag plays a more important role than the modulation period in the properties of the multilayer film.The a-C:H sublayer of the film with an appropriate Ag concentration(8.97 at.%)(modulation period of 512 nm)maintains the highest sp3/sp2 ratio,surface roughness and hardness,and excellent tribological property in the stimulated body fluid.An appropriate number of Ag atoms and size of Ag atom allow the Ag atoms to easily enter into the contact interface for load bearing and lubricating.This work proves that the Ag nanoparticles in the a-C:H sublayer plays a more important role in the tribological properties of the composite-multilayer film in stimulated body fluid condition. 展开更多
关键词 Si/a-C:h(Ag)multilayer film modulation periods Ag concentration tribological properties
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A Comparative Study of Boron and Phosphorus Doping Effects in SiC: H Films Prepared by ECR-CVD 被引量:1
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作者 S.F. Yoon (School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue,Singapore 639798, Rep. of Singapore) 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 1998年第1期65-71,共7页
Hydrogenated silicon carbide films (SiC:H) were deposited using the electron cyclotron resonance chemical vapour deposition (ECR-CVD) technique from a mixture of methane, silane and hydrogen, and using diborane and ph... Hydrogenated silicon carbide films (SiC:H) were deposited using the electron cyclotron resonance chemical vapour deposition (ECR-CVD) technique from a mixture of methane, silane and hydrogen, and using diborane and phosphine as doping gases. The effects of changes in the microwave power on the deposition rate and optical bandgap were investigated, and variations in the photoand dark-conductivities and activation energy were studied in conjunction with film analysis using the Raman scattering technique. In the case of boron-doped samples, the conductivity increased rapidly to a maximum, followed by rapid reduction at high microwave power. The ratio of the photo- to dark-conductivity (σph/σd) peaked at microwave power of ~600 W. Under conditions of high microwave power, Raman scattering analysis showed evidence of the formation and increase in the silicon microcrystalline and diamond-like phases in the films, the former of which could account for the rapid increase and the latter the subsequent decrease in the conductivity.In the case of phosphorusdoped SiC:H samples, it was found that increase in the microwave power has the effect of enhancing the formation of the silicon microcrystalline phase in the films which occurred in correspondence to a rapid increase in the conductivity and reduction in the activation energy The conductivity increase stabilised in samples deposited at microwave power exceeding 500 W probably as a result of dopant saturation. Results from Raman scattering measurements also showed that phosphorus doping had the effect of enhancing the formation of the silicon microcrystals in the film whereas the presence of boron had the effect of preserving the amorphous structure. 展开更多
关键词 ECR A Comparative Study of Boron and Phosphorus Doping Effects in SiC h films Prepared by ECR-CVD
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The Effect of Pressure on the Dissociation of H_2/CH_4Gas Mixture during Diamond Films Growth via Chemical Vapor Deposition 被引量:1
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作者 赵庆勋 辛红丽 +2 位作者 韩佳宁 文钦若 杨景发 《Plasma Science and Technology》 SCIE EI CAS CSCD 2002年第1期1113-1118,共6页
Monte Carlo simulations are adopted to study the electron motion in the mixture of H2 and CH4 during diamond synthesis via Glow Plasma-assisted Chemical Vapor Deposition (GPCVD). The non-uniform electric field is used... Monte Carlo simulations are adopted to study the electron motion in the mixture of H2 and CH4 during diamond synthesis via Glow Plasma-assisted Chemical Vapor Deposition (GPCVD). The non-uniform electric field is used and the avalanche of electrons is taken into account in this simulation. The average energy distribution of electrons and the space distribution of effective species such as CH3, CH+3, CH+ and H at various gas pressures are given in this paper, and optimum experimental conditions are inferred from these results. 展开更多
关键词 The Effect of Pressure on the Dissociation of h2/Ch4Gas Mixture during Diamond films Growth via Chemical Vapor Deposition Ch
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