期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
Si基热氧化Si_(1-x-y)Ge_xC_y薄膜的室温光致发光特性 被引量:2
1
作者 程雪梅 郑有炓 +5 位作者 刘夏冰 臧岚 朱顺明 韩平 罗志云 江若琏 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2000年第7期677-681,共5页
采用等离子体增强化学气相淀积 ( PECVD)法在 Si( 1 0 0 )衬底上淀积一层厚度约为1 70 nm的富 Ge高 C含量的 Si1- x- y Gex Cy 薄膜 ,然后将其分别在 80 0℃和 1 1 0 0℃下湿氧氧化2 0 min.在室温下观测到强烈的光致发光 .室温下的光致... 采用等离子体增强化学气相淀积 ( PECVD)法在 Si( 1 0 0 )衬底上淀积一层厚度约为1 70 nm的富 Ge高 C含量的 Si1- x- y Gex Cy 薄膜 ,然后将其分别在 80 0℃和 1 1 0 0℃下湿氧氧化2 0 min.在室温下观测到强烈的光致发光 .室温下的光致发光谱 ( PL谱 )测量显示 ,80 0℃下氧化后的样品在 370 nm和 396nm附近有两个光致发光带 ,1 1 0 0℃下氧化后的样品只在 396nm附近有一个光致发光带 .396nm附近的发光带可归之于由氧化薄膜中的缺陷 O- Si- O ( Si02 )或 O- Ge-O( Ge02 )引起的 ,而 370 nm附近的发光带与薄膜中 Ge- 展开更多
关键词 薄膜 室温光致发光 si siGEC
下载PDF
No external load measurement strategy for micro thermoelectric generator based on high-performance Si_(1-x-y)Ge_(x)Sn_(y) film 被引量:1
2
作者 Ying Peng Sijing Zhu +6 位作者 Huajun Lai Jie Gao Masashi Kurosawa Osamu Nakatsuka Sakae Tanemura Biaolin Peng Lei Miao 《Journal of Materiomics》 SCIE EI 2021年第4期665-671,共7页
In this study,a micro in-plane p-type thermoelectric generator(TEG),which consists of thin-film Si_(1-x-y)Ge_(x)Sn_(y) ternary alloy semiconductor on insulator,is developed to make efficient use of waste heat such as ... In this study,a micro in-plane p-type thermoelectric generator(TEG),which consists of thin-film Si_(1-x-y)Ge_(x)Sn_(y) ternary alloy semiconductor on insulator,is developed to make efficient use of waste heat such as human body.A power factor value as high as 1095 mWm^(-1) K^(-2) had been achieved using Bion implanted and short-term rapid thermal annealing(RTA)process.In addition,a measuring scheme for micro TEG without external load resistance was designed.In one measuring session,multiple parameters can be measured.The micro single-arm TEG prepared by semiconductor process can output 0.29 nW power at a temperature difference of 15 K,and a cross-sectional power density has reached up to 0.58 mW/cm^(2),which is a superior value for wearable device.The findings of this study have important reference value for wearable device performance improvement and output power measuring of micro TEG. 展开更多
关键词 si_(1-x-y)Ge_(x)Sn_(y) film P-type TEG No external load measurement Ambient power density
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部