The most supreme characteristic of SoC （system on chip） era is the high complexity of the chips; architecture and software design have become the indivisible part of chip design. As semiconductor fabrication technol...The most supreme characteristic of SoC （system on chip） era is the high complexity of the chips; architecture and software design have become the indivisible part of chip design. As semiconductor fabrication technology evolves into very deep sub-micron （DSM） level, power consumption has become the inevitable challenge in SoC design. In order to maximize the lifetime of portable system battery, SoC is required not only to be energy-efficient but also to work in an optimal and battery-aware manner. This paper intends to discuss some key technologies of SoC design from the above perspectives of view.展开更多
Because of high development costs of IC (Integrated Circuit) test programs,recycling ekisting test programs from one kind of ATE (Automatic Test Equip-ment) to another or generating directly from CAD simulation module...Because of high development costs of IC (Integrated Circuit) test programs,recycling ekisting test programs from one kind of ATE (Automatic Test Equip-ment) to another or generating directly from CAD simulation modules to ATEis more and more vauable. In this papert a new approach to migrating test pro-grams is presented. A virtual ATE model based on object-oriellted paradigm isdeveloped; it runs Test C++ (an intermediate test control language) programsand TeIF (Test Intermediate Format - an intermediate pattern), migrates testprograms among three kinds of ATE (Ando DIC8032, Schlumberger S15 andGenRad 1732) and gellerates test patterns from two kinds of CAD (Daisy andPanda) automatically.展开更多
基金the National Natural Science Foundation of China (Grant No. 60676012)
文摘The most supreme characteristic of SoC （system on chip） era is the high complexity of the chips; architecture and software design have become the indivisible part of chip design. As semiconductor fabrication technology evolves into very deep sub-micron （DSM） level, power consumption has become the inevitable challenge in SoC design. In order to maximize the lifetime of portable system battery, SoC is required not only to be energy-efficient but also to work in an optimal and battery-aware manner. This paper intends to discuss some key technologies of SoC design from the above perspectives of view.
文摘Because of high development costs of IC (Integrated Circuit) test programs,recycling ekisting test programs from one kind of ATE (Automatic Test Equip-ment) to another or generating directly from CAD simulation modules to ATEis more and more vauable. In this papert a new approach to migrating test pro-grams is presented. A virtual ATE model based on object-oriellted paradigm isdeveloped; it runs Test C++ (an intermediate test control language) programsand TeIF (Test Intermediate Format - an intermediate pattern), migrates testprograms among three kinds of ATE (Ando DIC8032, Schlumberger S15 andGenRad 1732) and gellerates test patterns from two kinds of CAD (Daisy andPanda) automatically.
