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Recognizing the orbital angular momentum(OAM)of vortex beams from speckle patterns 被引量:2
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作者 Zhiyuan Wang Xuetian Lai +5 位作者 Huiling Huang Xiaoyan Wang Haoran Li Ziyang Chen Jun Han Jixiong Pu 《Science China(Physics,Mechanics & Astronomy)》 SCIE EI CAS CSCD 2022年第4期55-61,共7页
The orbital angular momentum(OAM)of vortex beams offers a new degree for information encoding,which has been applied to optical communications.OAM measurement is essential for these applications,and has been realized ... The orbital angular momentum(OAM)of vortex beams offers a new degree for information encoding,which has been applied to optical communications.OAM measurement is essential for these applications,and has been realized in free space by several methods.However,these methods are inapplicable to estimate the OAM of vortex beams directly from the speckle patterns in the exit end of a multimode fiber(MMF).To tackle this issue,we design a convolutional neural network(CNN)to realize 100%accuracy recognition of two orthogonally polarized OAM modes from speckle patterns.Moreover,we demonstrate that even when the speckle patterns are cropped to only 1/64 of the original patterns,the recognition accuracy of the designed neural network is still higher than 98%.We also study the recognition accuracy of cropped speckles in different areas of speckle patterns to verify the feasibility of OAM recognition after cropping.The results demonstrate that recognizing the OAMs of two orthogonally polarized vortex beams from only a portion of speckle patterns in the exit end of an MMF is feasible,offering the potential to construct a 1×N data transmission scheme. 展开更多
关键词 optical angular momentum speckle pattern orthogonal polarization fiber optical communication deep learning
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Recurrence Quantification Analysis of Rough Surfaces Applied to Optical and Speckle Profiles
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作者 Oscar Sarmiento Martinez Darwin Mayorga Cruz +1 位作者 Jorge Uruchurtu Chavarín Estela Sarmiento Bustos 《Journal of Applied Mathematics and Physics》 2016年第4期720-732,共13页
In this paper, Recurrence Quantification Analysis (RQA) is set as a practical nonlinear data tool to establish and compare surface roughness (Ra) through percentage parameters of a dynamical system: Recurrence (%REC),... In this paper, Recurrence Quantification Analysis (RQA) is set as a practical nonlinear data tool to establish and compare surface roughness (Ra) through percentage parameters of a dynamical system: Recurrence (%REC), Determinism (%DET) and Laminarity (%LAM). Variations in surface roughness of different machining procedures from a typical metallic casting comparator are obtained from scattering intensity of a laser beam and expressed as changes in the statistics of speckle patterns and profiles optical properties. The application of the analysis (RQA) by Recurrence Plots (RPs), allowed to distinguish between machining procedures, highlighting features that other methods are unable to detect. 展开更多
关键词 RQA Recurrence Plots ROUGHNESS Optical Data Processing speckle patterns
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Review of Electronic Speckle Pattern Interferometry(ESPI) for Three Dimensional Displacement Measurement 被引量:22
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作者 YANG Lianxiang XIE Xin +2 位作者 ZHU Lianqing WU Sijin WANG Yonghong 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2014年第1期1-13,共13页
Three dimensional(3D) displacements, which can be translated further into 3D strain, are key parameters tor design, manufacturing and quality control. Using different optical setups, phase-shift methods, and algorit... Three dimensional(3D) displacements, which can be translated further into 3D strain, are key parameters tor design, manufacturing and quality control. Using different optical setups, phase-shift methods, and algorithms, several different 3D electronic speckle pattern interferometry(ESPl) systems for displacement and strain measurements have been achieved and commercialized. This paper provides a review of the recent developments in ESPI systems for 3D displacement and strain measurement. After an overview of the fundamentals of ESP! theory, temporal phase-shift, and spatial phase-shift techniques, 3D deformation measurements by the temporal phase-shift ESPI system, which is suited well for static measurement, and by the spatial phase-shift ESPI system, which is particularly useful for dynamic measurement, are discussed. For each method, the basic theory, a brief derivation and different optical layouts are presented. The state of art application, potential and limitation of the ESPI systems are shown and demonstrated. 展开更多
关键词 electronic speckle pattern interferometry(ESPI) three dimensional displacement and strain measurement static loading dynamic loading phase-shift technology
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New speckle pattern interferometry for precise in situ deformation measurements
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作者 章如月 Yu Fu 缪泓 《Chinese Optics Letters》 SCIE EI CAS CSCD 2024年第1期34-40,共7页
A new electronic speckle pattern interferometry method is proposed to realize in situ deformation measurements.The feature of the method is the combination of a high-speed camera and multiple laser Doppler vibrometers... A new electronic speckle pattern interferometry method is proposed to realize in situ deformation measurements.The feature of the method is the combination of a high-speed camera and multiple laser Doppler vibrometers(LDVs)for synchronous measurements.The high-speed camera is used to record and select effective interferograms,while the LDVs are used to measure the rigid body displacement caused by vibrations.A series of effective interferograms with known shifted phase values are obtained to calculate the deformation phase.The experimental results show that the method performs well in measuring static and dynamic deformations with high accuracy in vibrating environments. 展开更多
关键词 speckle pattern interferometry laser Doppler vibrometers in situ deformation measurements
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Variability on Raman Shift to Stress Coefficient of Porous Silicon 被引量:3
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作者 雷振坤 亢一澜 +1 位作者 岑皓 胡明 《Chinese Physics Letters》 SCIE CAS CSCD 2006年第6期1623-1626,共4页
Porous silicon film is a capillary-like medium, which is able to reveal different meso-elastic modulus with porosity. During the preparation of porous silicon samples, the capillary force is a non-classic force relate... Porous silicon film is a capillary-like medium, which is able to reveal different meso-elastic modulus with porosity. During the preparation of porous silicon samples, the capillary force is a non-classic force related to the liquid evaporation which directly influences the evolution of residual stress. In this study, a non-linear relation of Raman shift to stress coefficient and the porosity is obtained from the elastic modulus measured with nano-indentation by Bellet et al. [J. Appl. Phys. 60 (1996) 3772] Dynamic capillarity during the drying process of porous silicon is investigated using micro-Raman spectroscopy, and the results reveal that the residual stress resulted from the capillarity increased rapidly. Indeed, the dynamic capillarity has a close relationship with a great deal of micro-pore structures of the porous silicon. 展开更多
关键词 speckle PATTERN INTERFEROMETRY X-RAY-DIFFRACTION RESIDUAL-STRESS DEFORMATION MEASUREMENT SPECTROSCOPY MODULUS
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Experimental Investigation of Polycrystalline Material Deformation Based on a Grain Scale 被引量:3
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作者 李喜德 杨燕 魏成 《Chinese Physics Letters》 SCIE CAS CSCD 2005年第10期2553-2556,共4页
We propose an experimental approach for investigation of the polycrystalline deformation behaviour at a grain scale. The technique is characterized by the joint application of micro material testing systems and the in... We propose an experimental approach for investigation of the polycrystalline deformation behaviour at a grain scale. The technique is characterized by the joint application of micro material testing systems and the intragranular deformation analysis methods, It is attempting to map the deformation evolution at grain scale during the elastic and plastic deformations of polycrystalline specimens. 展开更多
关键词 speckle PATTERN INTERFEROMETRY MICRO-RAMAN SPECTROSCOPY MULTICRYSTAL
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New multiplexed system for synchronous measurement of out-of-plane deformation and two orthogonal slopes
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作者 王永红 张肖 +3 位作者 赵琪涵 姚彦峰 闫佩正 王标 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第3期259-264,共6页
We propose a novel system for synchronous measurement of out-of-plane deformation and two orthogonal slopes using a single camera. The linearly polarized reference beam introduced by an optical fiber interferes with t... We propose a novel system for synchronous measurement of out-of-plane deformation and two orthogonal slopes using a single camera. The linearly polarized reference beam introduced by an optical fiber interferes with the unpolarized object beam to measure the out-of-plane deformation. A modified Mach–Zehnder interferometer is used to measure the two orthogonal slopes of the out-of-plane deformation. One of the object beams of the Mach–Zehnder interferometer is an unpolarized beam, and the other object beam is split into two orthogonal linearly polarized object beams by a polarizing prism. The two beams are orthogonally polarized. Hence, they will not interfere with each other. The two polarized beams respectively interfere with the unpolarized beam to simultaneously measure the two orthogonal slopes of the out-of-plane deformation. In addition, the imaging lens and apertures are respectively placed in three optical paths to independently control the carrier frequencies and shearing amounts. The effectiveness of this method can be proved by measuring two pressure-loaded circular plates. 展开更多
关键词 digital speckle pattern interferometry digital shearography simultaneous measurement of displacement and two orthogonal slopes
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Image processing of ESPI based on measurement the welding dynamic displacement fields
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作者 陶军 李冬青 +1 位作者 范成磊 刘忠国 《China Welding》 EI CAS 2004年第2期111-114,共4页
A dual-beam electronic speckle pattern interferometry (ESPI) system was adopted to get speckle patterns for the measurement of welding dynamic displacement fields. The mathematical model of this system was described, ... A dual-beam electronic speckle pattern interferometry (ESPI) system was adopted to get speckle patterns for the measurement of welding dynamic displacement fields. The mathematical model of this system was described, based on which methods of the ESPI pattern image processing were discussed. Gray transformation and histogram equalization were used to enhance the contrast of speckle patterns. A discrete cosine image processing method was carried out and an exponent low-pass filter was chosen to reduce multiplicative noise in speckle patterns. Speckle grain noise can be eliminated effectively after these processes. 展开更多
关键词 WELDING electronic speckle pattern interferometry image processing discrete cosine low-pass exponent filter
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A review of surface roughness measurements based on laser speckle method
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作者 Mei-qi Shao Dong Xu +6 位作者 Si-yi Li Xiao-gang Zuo Chang-ke Chen Gong-zhuang Peng Jia-min Zhang Xiao-chen Wang Quan Yang 《Journal of Iron and Steel Research(International)》 SCIE EI CAS CSCD 2023年第10期1897-1915,共19页
Surface roughness is commonly used to characterize material microstructure during processing,and accurate measurement of surface roughness is the premise and foundation of machining.Therefore,online non-destructive me... Surface roughness is commonly used to characterize material microstructure during processing,and accurate measurement of surface roughness is the premise and foundation of machining.Therefore,online non-destructive measurement of surface roughness based on the laser speckle method has become a hot issue in recent research.The improvements in surface roughness measurements based on the laser speckle method are systematically reviewed.Theory of speckle formation is introduced.The statistical properties of the speckle patterns including first-order statistical properties and second-order statistical properties are directly related to surface roughness.Surface roughness measurements based on the laser speckle method are roughly divided into the speckle contrast method,speckle correlation method,and fractal method.The three methods are described in detail,and an extensive comparison among all the methods is presented.The recent progresses and application of surface roughness measurements are reviewed.Finally,surface roughness measurements based on the laser speckle method are prospected and summarized. 展开更多
关键词 Surface roughness Non-destructive measurement Laser speckle method speckle pattern Statistical property
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Measurement of out-of-plane deformation of curved objects with digital speckle pattern interferometry 被引量:1
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作者 李鹏飞 蔡萍 +2 位作者 隆军 刘持越 闫浩 《Chinese Optics Letters》 SCIE EI CAS CSCD 2018年第11期40-46,共7页
Digital speckle pattern interferometry (DSPI) is a high-precision deformation t technique for planar objects. However, for curved objects, the three-dimensional (3D) shape information is needed in order to obtain ... Digital speckle pattern interferometry (DSPI) is a high-precision deformation t technique for planar objects. However, for curved objects, the three-dimensional (3D) shape information is needed in order to obtain correct deformation measurement in DSPI. Thus, combined shape and deformation measurement techniques of DSPI have been proposed. However, the current techniques are either complex in setup or complicated in operation. Furthermore, the operations of some techniques are too slow for real-time measurement. In this work, we propose a DSPI technique for both 3D shape and out-of-plane deformation measurement. Compared with current techniques, the proposed technique is simple in both setup and operation and is capable of fast deformation measurement. Theoretical analysis and experiments are performed. For a cylinder surface with an arch height of 9 mm, the error of out-of-plane deformation measurement is less than 0.15 μm. The effectiveness of the proposed scheme is verified. 展开更多
关键词 Measurement of out-of-plane deformation of curved objects with digital speckle pattern interferometry
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Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations 被引量:1
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作者 朱云龙 Julien Vaillant +3 位作者 Guillaume Montay Manuel Fran?ois Yassine Hadjar Aurélien Bruyant 《Chinese Optics Letters》 SCIE EI CAS CSCD 2018年第7期40-44,共5页
Electronic speckle pattern interferometry(ESPI) and digital speckle pattern interferometry are wellestablished non-contact measurement methods. They have been widely used to carry out precise deformation mapping. Ho... Electronic speckle pattern interferometry(ESPI) and digital speckle pattern interferometry are wellestablished non-contact measurement methods. They have been widely used to carry out precise deformation mapping. However, the simultaneous two-dimensional(2D) or three-dimensional(3D) deformation measurements using ESPI with phase shifting usually involve complicated and slow equipment. In this Letter, we solve these issues by proposing a modified ESPI system based on double phase modulations with only one laser and one camera. In-plane normal and shear strains are obtained with good quality. This system can also be developed to measure 3D deformation, and it has the potential to carry out faster measurements with a highspeed camera. 展开更多
关键词 Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations
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Point spread function estimation from projected speckle illumination
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作者 Nizan Meitav Erez N Ribak Shy Shoham 《Light(Science & Applications)》 SCIE EI CAS CSCD 2015年第1期92-98,共7页
The resolution of an imaging apparatus is ideally limited by the diffraction properties of the light passing through the system aperture,but in many practical cases,inhomogeneities in the light propagating medium or i... The resolution of an imaging apparatus is ideally limited by the diffraction properties of the light passing through the system aperture,but in many practical cases,inhomogeneities in the light propagating medium or imperfections in the optics degrade the image resolution.Here we introduce a powerful and practical new approach for estimating the point spread function(PSF)of an imaging system on the basis of PSF Estimation from Projected Speckle Illumination(PEPSI).PEPSI uses the fact that the speckles’phase randomness cancels the effects of the aberrations in the illumination path,thereby providing an objective pattern for measuring the deformation of the imaging path.Using this approach,both wide-field-of-view and local-PSF estimation can be obtained by calibration-free,single-speckle-pattern projection.Finally,we demonstrate the feasibility of using PEPSI estimates for resolution improvement in iterative maximum likelihood deconvolution. 展开更多
关键词 DECONVOLUTION MICROSCOPY optical aberrations speckle pattern
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Digital Speckle Technique Applied to Flow Visualization
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作者 宋耀祖 张卫 +1 位作者 吴鹰 姚雪丰 《Tsinghua Science and Technology》 EI CAS 2000年第1期89-95,共7页
Digital speckle technique uses a laser, a CCD camera, and digital processing to generate interference fringes at the television framing rate. Its most obvious advantage is that neither darkroom facilities nor photogra... Digital speckle technique uses a laser, a CCD camera, and digital processing to generate interference fringes at the television framing rate. Its most obvious advantage is that neither darkroom facilities nor photographic wet chemical processing is required. In addition, it can be used in harsh engineering environments. This paper discusses the strengths and weaknesses of three digital speckle methodologies. (1) Digital speckle pattern interferometry (DSPI) uses an optical polarization phase shifter for visualization and measurement of the density field in a flow field. (2) Digital shearing speckle interferometry (DSSI) utilizes speckle\|shearing interferometry in addition to optical polarization phase shifting. (3) Digital speckle photography (DSP) with computer reconstruction. The discussion describes the concepts, the principles and the experimental arrangements with some experimental results. The investigation shows that these three digital speckle techniques provide an excellent method for visualizing flow fields and for measuring density distributions in fluid mechanics and thermal flows. 展开更多
关键词 digital speckle flow visualization digital speckle pattern interferometry (DSPI) shearing speckle interferometry speckle photography
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Pitting Kinetics of 304 Stainless Steel Using ESPI Detection Technique 被引量:4
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作者 Wen-Ming Tian Ying-Jun Ai +2 位作者 Song-Mei Li Nan Du Chao Ye 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2015年第4期430-437,共8页
The electronic speckle pattern interferometer was used to in situ monitor the pitting corrosion of 304 stainless steel at anodic polarization. The pitting current and pitting current density of a single pit were obtai... The electronic speckle pattern interferometer was used to in situ monitor the pitting corrosion of 304 stainless steel at anodic polarization. The pitting current and pitting current density of a single pit were obtained. The pit growth was controlled by the corrosion products diffusion. The pit morphology was observed by a scanning electron microscope. The results showed that the pit was dish shaped, and the geometric parameters and pit growth time conformed to the function of Y = A + B1t + B2t2 + B3t3. 展开更多
关键词 Stainless steel CORROSION Electronic speckle pattern interferometry (ESPI) PITTING
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Shearography and its applications-a chronological review 被引量:2
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作者 Rajpal Sirohi 《Light(Advanced Manufacturing)》 2022年第1期1-30,共30页
This paper presents the activities in the field of shearography in chronological order and highlights the great potential of this holographic measurement technology.After a brief introduction,the basic theory of shear... This paper presents the activities in the field of shearography in chronological order and highlights the great potential of this holographic measurement technology.After a brief introduction,the basic theory of shearography is presented.Shear devices,phase-shift arrangements,and multiplexed shearography systems are described.Finally,the application areas where shearography has been accepted and successfully used as a tool are presented. 展开更多
关键词 Electronic speckle pattern interferometry SHEAROGRAPHY Non-destructive testing
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A DEVELOPED FULL-FIELD FEM ANALYSIS COMBINED WITH ESPI FOR THE INVESTIGATION OF DEFECT EVOLUTION IN POLYMER FILMS
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作者 Xiao-fang Liu Shuai-xia Tan +2 位作者 Xiao-li Zhang 赵宁 徐坚 《Chinese Journal of Polymer Science》 SCIE CAS CSCD 2013年第7期1022-1028,共7页
A full-field finite element method (FEM) analysis combined with electronic speckle pattern interferometry (ESPI) measurement was developed to investigate defect evolution in polymer films. Different from the previ... A full-field finite element method (FEM) analysis combined with electronic speckle pattern interferometry (ESPI) measurement was developed to investigate defect evolution in polymer films. Different from the previous reports, which only compare the ESPI experimental and FEM simulated results at several points or lines, herein the full-field FEM results were exported, subtracted with a continuous distribution. By choosing proper parameters and number of substeps, the simulated and experimental results showed excellent correspondence. Furthermore, the displacement fields vertical to the tensional direction were also presented, and the strain field was preliminarily evaluated. The current method of combination of ESPI and FEM allows for capturing the experimental fringe maps to validate and optimize FEM results simulated, and would give a higher security to structural and mechanical analysis of polymeric materials. 展开更多
关键词 Electronic speckle pattern interferometry Finite element method DEFECT In-plane displacement Polymer film.
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