Spectral Reflectance Characteristics of Different Snow and Snow-Covered Land Surface Objects and Mixed Spectrum Fitting

The field spectroradiometer was used to measure spectra of different snow and snow-covered land surface objects in Beijing area.The result showed that for a pure snow spectrum,the snow reflectance peaks appeared from visible to 800 nm band locations;there was an obvious absorption valley of snow spectrum near 1 030 nm wavelength.Compared with fresh snow,the reflection peaks of the old snow and melting snow showed different degrees of decline in the ranges of 300～1 300,1 700～1 800 and 2 200～2 300 nm,the lowest was from the compacted snow and frozen ice.For the vegetation and snow mixed spectral characteristics,it was indicated that the spectral reflectance increased for the snow-covered land types(including pine leaf with snow and pine leaf on snow background), due to the influence of snow background in the range of 350～1 300 nm.However, the spectrum reflectance of mixed pixel remained a vegetation spectral characteristic.In the end,based on the spectrum analysis of snow,vegetation,and mixed snow/vegetation pixels,the mixed spectral fitting equations were established,and the results showed that there was good correlation between spectral curves by simulation fitting and observed ones(correlation coefficient R2=0.950 9).

基于Spectral-Fit法的星载SAR方位多波束方位向非均匀采样的处理

介绍了方位多波束技术的基本原理,指出了其在星载情况下必然会产生方位向非均匀采样,而非均匀采会在雷达图像中产生虚假目标。SpectralFit法的目的是从原始信号的非均匀样本中得到该信号的真实频谱,为了消除位向非均匀采样的影响,文中将SpectralFit法与方位多波束SAR的成像算法结合,对方位向非均匀采样的目标回波信进行处理。最后通过计算机仿真验证了该处理的有效性。

Effect of thickness of antimony selenide film on its photoelectric properties and microstructure

Antimony selenide(Sb2Se3) films are widely used in phase change memory and solar cells due to their stable switching effect and excellent photovoltaic properties. These properties of the films are affected by the film thickness. A method combining the advantages of Levenberg–Marquardt method and spectral fitting method(LM–SFM) is presented to study the dependence of refractive index(RI), absorption coefficient, optical band gap, Wemple–Di Domenico parameters, dielectric constant and optical electronegativity of the Sb2Se3films on their thickness. The results show that the RI and absorption coefficient of the Sb2Se3films increase with the increase of film thickness, while the optical band gap decreases with the increase of film thickness. Finally, the reasons why the optical and electrical properties of the film change with its thickness are explained by x-ray diffractometer(XRD), energy dispersive x-ray spectrometer(EDS), Mott–Davis state density model and Raman microstructure analysis.

Absorption linewidth inversion with wavelength modulation spectroscopy

For absorption linewidth inversion with wavelength modulation spectroscopy（WMS）, an optimized WMS spectral line fitting method was demonstrated to infer absorption linewidth effectively, and the analytical expressions for relationships between Lorentzian linewidth and the separations of first harmonic peak-to-valley and second harmonic zero-crossing were deduced. The transition of CO_2 centered at 4991.25 cm^（-1） was used to verify the optimized spectral fitting method and the analytical expressions. Results showed that the optimized spectra fitting method was able to infer absorption accurately and compute more than 10 times faster than the commonly used numerical fitting procedure. The second harmonic zero-crossing separation method calculated an even 6 orders faster than the spectra fitting without losing any accuracy for Lorentzian dominated cases. Additionally, linewidth calculated through second harmonic zero-crossing was preferred for much smaller error than the first harmonic peak-to-valley separation method. The presented analytical expressions can also be used in on-line optical sensing applications, electron paramagnetic resonance, and further theoretical characterization of absorption lineshape.