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A Generalized Reynolds' Equation For Squeeze-Film Air Damping in MEMS 被引量:5
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作者 鲍敏杭 孙远程 +1 位作者 杨恒 王跃林 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2002年第12期1245-1248,共4页
A differential equation that is generally effective for squeeze film air damping of perforated plate and non perforated plate as well as in MEMS devices is developed.For perforated plate,the thickness and the dimens... A differential equation that is generally effective for squeeze film air damping of perforated plate and non perforated plate as well as in MEMS devices is developed.For perforated plate,the thickness and the dimensions of the plate are not limited.With boundary conditions,pressure distribution and the damping force on the plate can be found by solving the differential equation.Analytical expressions for damping pressure and damping force of a long strip holeplate are presented with a finite thickness and a finite width.To the extreme conditions of very thin plate and very thin hole,the results are reduced to the corresponding results of the conventional Reynolds' equation.Thus, the effectiveness of the generalized differential equation is justified.Therefore,the generalized Reynolds' equation will be a useful tool of design for damping structures in MEMS. 展开更多
关键词 squeeze film air damping MEMS Reynolds' equation
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Effects of air damping on quality factors of different probes in tapping mode atomic force microscopy
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作者 Yu Zeng Guo-Lin Liu +1 位作者 Jin-Hao Liu Zheng Wei 《Chinese Physics B》 SCIE EI CAS 2024年第9期506-519,共14页
The AFM probe in tapping mode is a continuous process of energy dissipation,from moving away from to intermittent contact with the sample surfaces.At present,studies regarding the energy dissipation mechanism of this ... The AFM probe in tapping mode is a continuous process of energy dissipation,from moving away from to intermittent contact with the sample surfaces.At present,studies regarding the energy dissipation mechanism of this continuous process have only been reported sporadically,and there are no systematic explanations or experimental verifications of the energy dissipation mechanism in each stage of the continuous process.The quality factors can be used to characterize the energy dissipation in TM-AFM systems.In this study,the vibration model of the microcantilever beam was established,coupling the vibration and damping effects of the microcantilever beam.The quality factor of the vibrating microcantilever beam under damping was derived,and the air viscous damping when the probe is away from the sample and the air squeeze film damping when the probe is close to the sample were calculated.In addition,the mechanism of the damping effects of different shapes of probes at different tip–sample distances was analyzed.The accuracy of the theoretical simplified model was verified using both experimental and simulation methods.A clearer understanding of the kinetic characteristics and damping mechanism of the TM-AFM was achieved by examining the air damping dissipation mechanism of AFM probes in the tapping mode,which was very important for improving both the quality factor and the imaging quality of the TM-AFM system.This study’s research findings also provided theoretical references and experimental methods for the future study of the energy dissipation mechanism of micro-nano-electromechanical systems. 展开更多
关键词 TM-AFM quality factors air viscous damping air squeeze film damping
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