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Effects of Different Titanium Sub-oxide on the Properties of Titanium Dioxide Thin Films Prepared by E-beam Evaporation Deposition with Ion Auxiliary
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作者 郭爱云 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2006年第2期101-104,共4页
TiO2 thin films were prepared with Ti2O3, Ti3O5 and TiO2 as raw materials, by electron-beam evaporation deposition, using O^2- ion beam ( O2 purity up to 99.99% ) as auxiliary means. The crystal structures of the sa... TiO2 thin films were prepared with Ti2O3, Ti3O5 and TiO2 as raw materials, by electron-beam evaporation deposition, using O^2- ion beam ( O2 purity up to 99.99% ) as auxiliary means. The crystal structures of the samples were inspected by the X-ray diffraction (XRD) method, and the evaporation character of warious raw materials was analyzed. Transmittance spectra were measured through a U-3310 spectrophotometer ( wavelength ranging from 200 nm to 900 nm). The refractive index n and the thickness of films were determined from transmission spectra. The experimental results show that the thin films taking Ti2O3 as their raw material have a strong absorption, when taking Ti3O5 and TiO2 as raw materials, the thin films would have good optical properties. The experiments also show that, the crystal structure of all thin films is amorphous before post-annealing and the Ti3O5 is a congruent evaporation phase in the Ti-O system. 展开更多
关键词 titanium sub-oxide thin film E-beam evaporation IAD
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Oxide Layers on(0001) Plane of Zircaloy-4 After Corrosion at 360 °C in Lithiated Aqueous Solution 被引量:1
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作者 Shao-Qiu Gou Bang-Xin Zhou +4 位作者 Mei-Yi Yao Jian-Chao Peng Chuan-Ming Chen Qiang Li Jin-Long Zhang 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2015年第6期748-757,共10页
The microstructures of the oxide layers formed on near (0001) plane of Zircaloy-4 were investigated by autoclave tests at 360 ℃ in lithiated aqueous solution. Oxygen-rich regions with hcp structure were observed at... The microstructures of the oxide layers formed on near (0001) plane of Zircaloy-4 were investigated by autoclave tests at 360 ℃ in lithiated aqueous solution. Oxygen-rich regions with hcp structure were observed at the undulating O/M interface, and the inner surface morphology of the oxide layers formed on (0001) was only concave- convex. Monoclinic, tetragonal and cubic phases and a kind of zirconium sub-oxide with bcc structure were detected in the oxide layer near the metal matrix. This zirconium sub-oxide layer had a coherent relationship with a-Zr matrix, and the growth direction of the zirconium sub-oxide layer was nearly parallel to the [0001] direction of a-Zr regardless of the orientation of metal matrix. The orientations scattering of columnar grains formed on near (0001) plane differ from that formed on near (1010) plane. 展开更多
关键词 Zircaloy-4 (0001) plane Oxide/metal interfaces Microstructure Oxygen-rich regions Zirconium sub-oxide
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